IP Library › Granted Patent US 8,558,360
Granted Patent B2
US 8,558,360 · App. 12/926,137 · Granted Oct 15, 2013

Flip chip package and method of manufacturing the same

Inventors: Ey Yong Kim (Daejeon, KR); Young Hwan Shin (Daejeon, KR); Soon Jin Cho (Chungcheongbuk-do, KR); Jong Yong Kim (Daejeon, KR); Jin Seok Lee (Chungcheongbuk-do, KR)
Assignee: Samsung Electro-Mechanics Co., Ltd.
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Quick Facts
Patent No.
US 8,558,360
App. No.
12/926,137
Granted
Oct 15, 2013
Kind
B2
Abstract

There is provided a flip chip package including an electronic device, a board including a conductive pad disposed inside a mounting region of the board on which the electronic device is mounted, and a connection pad disposed outside the mounting region, a resin layer formed on the board and including a trench formed by removing a part of the resin layer, and a dam member provided on the trench and preventing the leakage of an underfill between the mounting region and the connection pad. Since the dam member, formed on the processed resin layer, can prevent the leakage of the underfill, a package defect rate can be lowered, and connection reliability can be improved.

Claims (23)

1. A flip chip package comprising:

an electronic device;

a board including a conductive pad disposed inside a mounting region of the board on which the electronic device is mounted, and a connection pad disposed outside the mounting region;

a resin layer disposed on the board and including a trench formed by removing a part of the resin layer; and

a dam member provided on the trench and preventing leakage of an underfill between the mounting region and the connection pad.

2. The flip chip package of claim 1 , wherein the trench is formed by processing the resin layer using a laser.

3. The flip chip package of claim 1 , wherein the trench is formed by exposing and developing the resin layer.

4. The flip chip package of claim 3 , wherein the resin layer is formed of a photoresist resin.

5. The flip chip package of claim 1 , wherein the resin layer further includes an uneven portion on a surface thereof around the trench.

6. The flip chip package of claim 1 , wherein the dam member is formed along a circumference of the mounting region.

7. The flip chip package of claim 1 , further comprising a bump formed on the connection pad and electrically connected with the electronic device.

8. The flip chip package of claim 1 , further comprising the underfill interposed between the electronic device and the board.

9. A flip chip package comprising:

an electronic device;

a board including a conductive pad disposed inside a mounting region of the board on which the electronic device is mounted, and a connection pad disposed outside the mounting region;

a resin layer formed on the board and including an uneven portion at a part of a surface of the resin layer; and

a dam member provided on the uneven portion and preventing leakage of an underfill between the mounting region and the connection pad.

10. The flip chip package of claim 9 , wherein the uneven portion is formed by coining the resin layer.

11. The flip chip package of claim 9 , wherein the uneven portion is formed by exposing and developing the resin layer.

12. The flip chip package of claim 11 , wherein the resin layer is formed of a photoresist resin.

13. The flip chip package of claim 9 , wherein the dam member is formed along a circumference of the mounting region.

14. The flip chip package of claim 9 , further comprising a bump formed on the connection pad and electrically connected with the electronic device.

15. The flip chip package of claim 9 , further comprising the underfill interposed between the electronic device and the board.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2010
From: KIM, EY YONG; SHIN, YOUNG HWAN; CHO, SOON JIN; KIM, JONG YONG; LEE, JIN SEOK
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 025615/0551 →
Priority Claims (1)
KR 10-2009-0103000 · Oct 28, 2009 · national
Continuity (1)
Related Publication 20110095421A1 · Apr 28, 2011