Microcontroller device, microcontroller debugging device, method of debugging a microcontroller device, microcontroller kit
View Patent ↗A microcontroller device comprising a receiver component configured to receive a one or more reset signals for the microcontroller device; an identification component configured to identify a source of the or each reset signals received by the receiver component; a time interval determining component configured to determine a length of a time interval in accordance with the identified source of the or each reset signals received by the receiver component; a voltage setting component configured to set a voltage of an output of the microcontroller device to a first value on receipt of a reset signal by the receiver component; and a control component configured to maintain the voltage of the output at the first value for the duration of the determined length of the time interval; and set the voltage of the output to a second value on substantial completion of the determined length of the time interval.
1. A microcontroller device, comprising:
a receiver component configured to receive one or more reset signals for the microcontroller device from internal reset sources;
an identification component configured to identify a source of each of the one or more reset signals received by the receiver component;
a time interval determining component configured to determine a length of a time interval in accordance with the identified source of each of the one or more reset signals received by the receiver component, the length of the time interval being unique for the identified source;
a voltage setting component configured to set a voltage of a reset output signal on a reset output pin of the microcontroller device to a first value on receipt of a reset signal by the receiver component; and
a control component configured to maintain the voltage of the reset output signal at the first value for the duration of the determined length of the time interval; and to set the voltage of the reset output signal to a second value on substantial completion of the determined length of the time interval.
2. A microcontroller kit comprising the microcontroller device as claimed in claim 1 and a microcontroller debugging device.
3. A wireless communications device comprising the microcontroller device as claimed in claim 1 .
4. An automobile comprising the microcontroller device as claimed in claim 1 .
5. The microcontroller device as claimed in claim 1 wherein the receiver component is configured to receive one or more reset signals for the microcontroller device from external reset sources via a reset input pin of the microcontroller device.
6. A microcontroller debugging device configured to receive the reset output signal of the microcontroller device as claimed in claim 5 , wherein the microcontroller debugging device comprises:
a voltage level detector configured to detect changes in the voltage of the reset output signal;
a clocking component configured to determine a duration of a time interval during which the voltage of the reset output signal substantially matches the first value; and
a logic unit configured to relate the duration of the time interval to a particular source of a reset signal in the microcontroller device.
7. A microcontroller kit comprising the microcontroller device as claimed in claim 5 and a microcontroller debugging device.
8. A wireless communications device comprising the microcontroller device as claimed in claim 5 .
9. An automobile comprising the microcontroller device as claimed in claim 5 .
10. A microcontroller debugging device configured to receive the reset output signal of the microcontroller device as claimed in claim 1 , wherein the microcontroller debugging device comprises:
a voltage level detector configured to detect changes in the voltage of the reset output signal;
a clocking component configured to determine a duration of a time interval during which the voltage of the reset output signal substantially matches the first value; and
a logic unit configured to relate the duration of the time interval to a particular source of a reset signal in the microcontroller device.
11. A method of debugging a microcontroller device, wherein the method comprises:
receiving a reset signal in the microcontroller device from internal reset sources of the microcontroller device;
setting a voltage of a reset output signal on a reset output pin of the microcontroller device to a first value; determining in the microcontroller device, the source of the reset signal;
determining a length of a time interval over which the voltage of the reset output signal is to remain set at the first value, the length of the time interval being unique for the source of the reset signal;
setting the voltage of the output of the microcontroller device to a second value on substantial completion of the determined time interval;
detecting in a debugger, the setting of the voltage of the reset output signal of the microcontroller device to the first value;
determining the length of time for which the voltage of the reset output signal of the microcontroller device remains at the first value; and
associating the determined length of time with a source of a reset signal to determine the particular source of the reset signal in the microcontroller device.
12. The method as claimed in claim 11 wherein the method comprises receiving a reset signal from external reset sources via a reset input pin of the microcontroller device.
13. The method as claimed in claim 12 wherein determining a length of a time interval over which the voltage of the output is to remain set at the first value comprises reviewing a look up table to find an entry substantially matching the source of the reset signal; and retrieving from the look up table a value of a length of a time interval associated with the matching entry.
14. The method as claimed in claim 12 wherein determining a length of a time interval over which the voltage of the output is to remain set at the first value comprises calculating the length in accordance with the expression .τ*(i)=.τ+αiΔ, wherein .τ is a nominal reset pulse duration, Δ is a constantly valued supplementary reset pulse duration and αi is a scaling factor, whose value varies according to the source of the reset signal.
15. The method as claimed in claim 11 wherein determining a length of a time interval over which the voltage of the output is to remain set at the first value comprises reviewing a look up table to find an entry substantially matching the source of the reset signal; and retrieving from the look up table a value of a length of a time interval associated with the matching entry.
16. The method as claimed in claim 11 wherein determining a length of a time interval over which the voltage of the output is to remain set at the first value comprises calculating the length in accordance with the expression τ(i)=τ+αiΔ, wherein r is a nominal reset pulse duration, Δ is a constantly valued supplementary reset pulse duration and αi is a scaling factor, whose value varies according to the source of the reset signal.
17. A non-transitory machine-readable storage medium comprising a computer program comprising instructions that when executed on a programmable apparatus carry out a method of debugging a microcontroller device, the method comprises:
receiving a reset signal in the microcontroller device from internal reset sources of the microcontroller device;
setting a voltage of a reset output signal on a reset output of the microcontroller device to a first value; determining in the microcontroller device, the source of the reset signal;
determining a length of a time interval over which the voltage of the reset output signal is to remain set at the first value, the length of the time interval being unique for the source of the reset signal;
setting the voltage of the output of the microcontroller device to a second value on substantial completion of the determined time interval;
detecting in a debugger, the setting of the voltage of the reset output signal of the microcontroller device to the first value;
determining the length of time for which the voltage of the reset output signal of the microcontroller device remains at the first value; and associating the determined length of time with a source of a reset signal to determine the particular source of the reset signal in the microcontroller device.
18. A non-transitory machine-readable storage medium of claim 17 wherein the method comprises receiving a reset signal from external reset sources via a reset input pin of the microcontroller device.
19. A non-transitory machine-readable storage medium of claim 17 wherein determining a length of a time interval over which the voltage of the output is to remain set at the first value comprises reviewing a look up table to find an entry substantially matching the source of the reset signal; and retrieving from the look up table a value of a length of a time interval associated with the matching entry.
20. A non-transitory machine-readable storage medium of claim 17 wherein determining a length of a time interval over which the voltage of the output is to remain set at the first value comprises calculating the length in accordance with the expression .τ*(i)=.τ+αiΔ, wherein τ is a nominal reset pulse duration, Δ is a constantly valued supplementary reset pulse duration and αi is a scaling factor, whose value varies according to the source of the reset signal.