IP Library Granted Patent US 8,257,152
Granted Patent B2
US 8,257,152 · App. 12/945,557 · Granted Sep 4, 2012

Silicate composite polishing pad

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Quick Facts
Patent No.
US 8,257,152
App. No.
12/945,557
Granted
Sep 4, 2012
Kind
B2
Abstract

The invention provides a polishing pad useful for polishing at least one of semiconductor, magnetic and optical substrates. It includes a polymeric matrix having a polishing surface. Polymeric microelements are distributed within the polymeric matrix and at the polishing surface of the polymeric matrix. Silicate-containing regions distributed within each of the polymeric microelements coat less than 50 percent of the outer surface of the polymeric microelements. Less than 0.1 weight percent total of the polymeric microelements are associated with i) silicate particles having a particle size of greater than 5 μm; ii) silicate-containing regions covering greater than 50 percent of the outer surface of the polymeric microelements; and iii) polymeric microelements agglomerated with silicate particles to an average cluster size of greater than 120 μm.

Claims (14)

1. A polishing pad useful for polishing at least one of semiconductor, magnetic and optical substrates comprising:

a polymeric matrix, the polymeric matrix having a polishing surface;

polymeric microelements distributed within the polymeric matrix and at the polishing surface of the polymeric matrix; the polymeric microelements having an outer surface and being fluid-filled for creating texture at the polishing surface; and

silicate-containing regions distributed within each of the polymeric microelements, the silicate-containing regions being spaced to coat less than 50 percent of the outer surface of the polymeric microelements; and less than 0.1 weight percent total of the polymeric microelements being associated with i) silicate particles having a particle size of greater than 5 μm; ii) silicate-containing regions covering greater than 50 percent of the outer surface of the polymeric microelements; and iii) polymeric microelements agglomerated with silicate particles to an average cluster size of greater than 120 μm.

2. The polishing pad of claim 1 wherein the silicate-containing regions associated with the polymeric microelements have an average size of 0.01 to 3 μm.

3. The polishing pad of claim 1 wherein the polymeric microelements have an average size of 5 to 200 microns.

4. The polishing pad of claim 1 wherein the silicate-containing regions cover 1 to 40 percent of the outer surface of the polymeric microelements.

5. A polishing pad useful for polishing at least one of semiconductor, magnetic and optical substrates comprising:

a polymeric matrix, the polymeric matrix having a polishing surface;

polymeric microelements distributed within the polymeric matrix and at the polishing surface of the polymeric matrix; the polymeric microelements having an outer surface and being fluid-filled for creating texture at the polishing surface; and

silicate-containing regions distributed within each of the polymeric microelements, the silicate-containing regions being spaced to coat 1 to 40 percent of the outer surface of the polymeric microelements; and less than 0.05 weight percent total of the polymeric microelements being associated with i) silicate particles having a particle size of greater than 5 μm; ii) silicate-containing regions covering greater than 50 percent of the outer surface of the polymeric microelements; and iii) polymeric microelements agglomerated with silicate particles to an average cluster size of greater than 120 μm.

6. The polishing pad of claim 5 wherein the silicate-containing regions distributed on the polymeric microelements have an average particle size of 0.01 to 2 microns.

7. The polishing pad of claim 5 wherein the polymeric microelements have an average size of 10 to 100 microns.

8. The polishing pad of claim 5 wherein the silicate-containing regions cover 2 to 30 percent of the outer surface of the polymeric microelements.

Assignments (3)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC.
To: DUPONT ELECTRONIC MATERIALS HOLDING, INC.
Reel/Frame 069274/0160 →