Substrate processing method, storage medium storing program for executing substrate processing method and substrate processing apparatus
There is provided a substrate processing method capable of preventing pattern collapse when a rinse solution is removed from a substrate on which a microscopic resist pattern is formed and also capable of reducing cost for processing the substrate by decreasing an amount of usage of a hydrophobicizing agent. The substrate processing method includes a rinse solution supply process (step S 12 ) for supplying the rinse solution onto the substrate on which the resist pattern is formed; and a rinse solution removing process (steps S 14 to S 16 ) for removing the rinse solution from the substrate in an atmosphere including vapor of a first processing solution that hydrophobicizes the resist pattern.
1. A substrate processing method, comprising:
supplying a rinse solution onto a substrate on which a resist pattern is formed; and
removing the rinse solution from the substrate in an atmosphere including vapor of a first processing solution that hydrophobicizes the resist pattern,
wherein in the step of removing, an interface between the rinse solution and the vapor of the first processing solution is formed on a surface of the substrate by supplying the vapor of the first processing solution on a center portion of the substrate, and
when the interface is moved from the center portion of the substrate to a peripheral portion of the substrate by rotating the substrate, a vapor supply nozzle supplying the vapor of the first processing solution is also moved from the center portion of the substrate toward the peripheral portion of the substrate along with movement of the interface.
2. The substrate processing method of claim 1 , wherein in the step of removing, the rinse solution is removed while moving the vapor supply nozzle at a speed corresponding to a speed at which the rinse solution is scattered and moved.
3. The substrate processing method of claim 1 , wherein
the step of removing includes:
irradiating a light to a surface of the substrate; and
detecting the light reflected from the surface of the substrate;
wherein, in the step of removing, the rinse solution is removed while moving the vapor supply nozzle based on an amount of the reflected light.
4. The substrate processing method of claim 1 , further comprising:
between the step of supplying and the step of removing, supplying a second processing solution having a smaller surface tension than that of the rinse solution onto the substrate,
wherein the second processing solution is removed with removal of the rinse solution.
5. A substrate processing method, comprising:
supplying a rinse solution onto a substrate on which a resist pattern is formed; and
removing the rinse solution from the substrate in an atmosphere including vapor of a first processing solution that hydrophobicizes the resist pattern,
wherein, in the step of removing, the rinse solution is removed by rotating the substrate in a state that the rinse solution is being supplied onto a center portion of the substrate while moving a vapor supply nozzle supplying the vapor of the first processing solution from a peripheral portion of the substrate toward the center portion of the substrate, and
wherein an interface between the rinse solution and the vapor of the first processing solution is formed on a surface of the substrate by supplying the vapor of the first processing solution, and then the interface is moved from the peripheral portion of the substrate toward the center portion of the substrate along with movement of the vapor supply nozzle.
6. A non-transitory computer readable storage medium that stores therein a computer readable program that when executed by a computer causes the computer to cause an apparatus to perform the substrate processing method as claimed in claim 1 .