IP Library Granted Patent US 8,507,176
Granted Patent B2
US 8,507,176 · App. 12/981,916 · Granted Aug 13, 2013

Photosensitive compositions

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Quick Facts
Patent No.
US 8,507,176
App. No.
12/981,916
Granted
Aug 13, 2013
Kind
B2
Abstract

Provided are radiation-sensitive polymers and compositions which may be used in photolithographic processes. The polymers and compositions provide enhanced sensitivity to activating radiation.

Claims (17)

1. A polymer comprising a polymer backbone and a monomeric photoacid generator covalently attached to the polymer backbone, wherein the monomeric photoacid generator is derived from one or more sulfonium salt or iodonium salt having a polymerizable sulfonate anion represented by formula (1a) or formula (1b), respectively:

wherein: Y is hydrogen, alkyl, fluorinated alkyl or fluorine; R 1 , R 2 , R 3 , R 4 and R 5 are independently chosen from substituted and unsubstituted aryl; and Z is a substituted aromatic group covalently bonded to the sulfonate anion via a straight or branched perfluorinated-alkyl chain comprising a terminal CF 2 , C(F)(CF 3 ) or C(CF 3 ) 2 .

2. The polymer of claim 1 , further comprising a repeat unit comprising a photoacid-labile group.

3. The polymer of claim 1 , further comprising polymerized units chosen from one or more of 2-methyladamantanyl methacrylate, 2-methyladamantanyl acrylate, hydroxyadamantylacrylate, hydroxyadamantylmethacrylate, maleic anhydride, norbornene, 3,4-dihydropyran, optionally substituted phenyl and optionally substituted naphthyl.

4. The polymer of claim 1 , further comprising one or more polar monomer attached to the polymer backbone, wherein the polar monomer is represented by one or both of the following formulae:

5. A positive-tone photoresist composition comprising a polymer of claim 1 .

6. The positive-tone photoresist composition of claim 5 , further comprising a second polymer comprising: a polymer backbone which is free of monomeric photoacid generators covalently attached thereto; and a photoacid-labile group.

7. A coated substrate, comprising:

(a) a substrate having one or more layers to be patterned on a surface thereof; and

(b) a layer of a positive-tone photoresist composition of claim 5 over the one or more layers to be patterned.

8. A method of forming an electronic device, comprising:

(a) applying a layer of a positive-tone photoresist composition of claim 5 on a substrate;

(b) patternwise exposing the photoresist composition layer to activating radiation; and

(c) developing the exposed photoresist composition layer to provide a resist relief image.

9. The method of claim 8 , wherein the activating radiation is extreme-ultraviolet or e-beam radiation.

10. The polymer of claim 1 , wherein the monomeric photoacid generator is derived from a sulfonium salt having a polymerizable sulfonate anion represented by formula (1a).

11. The polymer of claim 1 , wherein the monomeric photoacid generator is derived from an iodonium salt having a polymerizable sulfonate anion represented by formula (1b).

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS LLC
To: DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC
Reel/Frame 069272/0383 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 14, 2011
From: THACKERAY, JAMES W.; AQAD, EMAD
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 025951/0914 →