IP Library Granted Patent US 8,278,988
Granted Patent B2
US 8,278,988 · App. 12/997,104 · Granted Oct 2, 2012

Method and apparatus for generating a modulated waveform signal

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Quick Facts
Patent No.
US 8,278,988
App. No.
12/997,104
Granted
Oct 2, 2012
Kind
B2
Abstract

A semiconductor device comprising timer logic for generating a first modulated waveform signal, and delay logic, operably coupled to the timer logic and arranged to provide a first delay in a rising edge of the first modulated waveform signal generated by the timer logic; and provide a second delay in a falling edge of the first modulated waveform generated by the timer logic. The first delay and second delay of the first modulated waveform forms a second, refined modulated waveform signal that comprises a higher frequency resolution than a frequency resolution of the first modulated waveform signal.

Claims (28)

1. A semiconductor device comprising:

timer logic for generating a first modulated waveform signal;

delay logic operably coupled to the timer logic and arranged to provide a first delay in a rising edge of the first modulated waveform signal generated by the timer logic and provide a second delay in a falling edge of the first modulated waveform signal generated by the timer logic, such that the first delay and second delay of the first modulated waveform signal form a second, refined modulated waveform signal that comprises a higher frequency resolution than a frequency resolution of the first modulated waveform signal;

wherein the delay in the rising edge of the first modulated waveform signal ‘td1[k]’ comprises a rising edge delay increment ‘dtL’, falling edge delay increment ‘dtH’ and a rising edge delay value calculated in the preceding waveform cycle ‘td1[k−1]’.

2. The semiconductor device of claim 1 wherein the delay logic is arranged to cause the first delay in the rising edge of the first modulated waveform and the second delay in the falling edge of the first modulated waveform signal, such that the second, refined modulated waveform signal further comprises a higher pulse width resolution than a pulse width resolution of the first modulated waveform signal generated by the timer logic.

3. The semiconductor device of claim 2 wherein the delay logic comprises a rising edge delay component arranged to cause the first delay in the rising edge of the first modulated waveform signal generated by the timer logic.

4. The semiconductor device of claim 2 wherein the delay logic comprises a falling edge delay component arranged to cause the second delay in the falling edge of the first modulated waveform signal generated by the timer logic.

5. The semiconductor device of claim 2 wherein the second delay in the falling edge of the first modulated waveform signal, ‘td 2 [k]’ comprises a falling edge delay increment ‘dt H ’, a falling edge delay increment ‘dt L ’, and a falling edge delay value calculated in the previous waveform cycle ‘td 2 [k−1]’.

6. The semiconductor device of claim 1 wherein the delay logic comprises a rising edge delay component arranged to cause the first delay in the rising edge of the first modulated waveform signal generated by the timer logic.

7. The semiconductor device of claim 6 wherein the second delay in the falling edge of the first modulated waveform signal, ‘td 2 [k]’ comprises a falling edge delay increment ‘dt H ’, a falling edge delay increment ‘dt L ’ and a falling edge delay value calculated in the previous waveform cycle ‘td 2 [k−1 ]’.

8. The semiconductor device of claim 1 wherein the delay logic comprises a falling edge delay component arranged to cause the second delay in the falling edge of the first modulated waveform signal generated by the timer logic.

9. The semiconductor device of claim 1 wherein the second delay in the falling edge of the first modulated waveform signal, ‘td 2 [k]’ comprises a falling edge delay increment ‘dt H ’, a falling edge delay increment ‘dt L ’ and a falling edge delay value calculated in the previous waveform cycle ‘td 2 [k−1]’.

10. The semiconductor device of claim 9 wherein if an edge delay ‘td 1(2) ’, is out of a delay module operational range <0,x*dt>, where dt =Period CLK /(x+1) and x ={1,2, . . . }, the delay comprises td,( 1(2) =n*Period CLK+ m*dt, where n=IntegerDivision(td 1(2) ,((x+1)*dt)) and m=ModuloDivision(td 1(2) ,((x+1)*dt)).

11. The semiconductor device of claim 10 wherein a high pulse width of the refined modulated waveform signal comprises ‘i* Period CLK +dt H ’ and a low pulse width of the refined modulated waveform signal comprises ‘j*Period CLK +dt I ’,

where: coefficients ‘i’ and ‘j’ are dependent upon a timer implementation and a duty cycle of the timer generated rough waveform signal, and

parameters ‘dt L ’ and ‘dt H ’ comprise rising and falling edge delay increments, respectively.

12. The semiconductor device of claim 11 wherein a period of the refined modulated waveform signal equals to ‘(i+j)*Period CLK +dt L +dt H ’.

13. The semiconductor device of claim 11 wherein the semiconductor device comprises a hardware adder module arranged to calculate refined edge delays for a modulated pulse, and to generate the timer hold clock pulse.

14. The semiconductor device of claim 1 wherein the delay logic comprises a timer hold clock line, operably coupled to the timer logic and arranged to enable the delay logic to cause the timer logic to suspend the first modulated waveform signal.

15. The semiconductor device of claim 14 wherein suspension of the first modulated waveform signal causes a re-synchronization of the first modulated waveform signal with the refined modulated waveform signal.

16. The semiconductor device of claim 1 wherein the delay logic comprises at least one adder module.

17. A method for generating a modulated waveform signal comprising:

receiving a first modulated waveform signal; and

generating a second, refined modulated waveform signal by causing a first delay in a rising edge of the first modulated waveform signal and causing a second delay in a falling edge of the first modulated waveform signal, such that the resulting second, refined modulated waveform signal comprises at least a higher frequency resolution than a frequency resolution of the first modulated waveform signal, wherein the delay in the rising edge of the first modulated waveform signal ‘td 1 [k]’ comprises a rising edge delay increment ‘dt L ’, falling edge delay increment ‘dt H ’ and a rising edge delay value calculated in the preceding waveform cycle ‘td 1 [k−1]’.

18. A computer-readable storage element having computer readable code stored thereon for programming a computer to perform a method for generating a modulated waveform signal, the code operable for:

receiving a first modulated waveform signal; and

generating a second, refined modulated waveform signal by causing a first delay in a rising edge of the first modulated waveform signal and causing a second delay in a falling edge of the first modulated waveform signal, such that the resulting second, refined modulated waveform signal comprises at least a higher frequency resolution than a frequency resolution of the first modulated waveform signal, wherein the delay in the rising edge of the first modulated waveform signal ‘td 1 [k]’ comprises a rising edge delay increment ‘td L ’, falling edge delay increment ‘td H ’ and a rising edge delay value calculated in the preceding waveform cycle ‘td 1 [k−1]’.

19. The computer-readable storage medium of claim 18 , wherein the computer readable storage medium comprises at least one of a hard disk, a CD-ROM, an optical storage device, a magnetic storage device, a ROM (Read Only Memory), a PROM (Programmable Read Only Memory), a EPROM (Erasable Programmable Read Only Memory), a EEPROM (Electrically Erasable Programmable Read Only Memory) and a Flash memory.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
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From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
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To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
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From: FREESCALE SEMICONDUCTOR INC.
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To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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