IP Library Patent Application 13003948
Patent Application
App. No. 13/003,948

FAULT DETECTION APPARATUS FOR ALPHANUMERIC DISPLAY SYSTEM AND METHOD OF DETECTING A FAULT

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
13/003,948
Abstract

A fault detection apparatus comprises a signal translation stage having an input arranged to receive an input waveform derived from a signal for a capacitive load. The signal translation stage is arranged to generate a translated output signal representative of at least an aspect of the input waveform. The apparatus also comprises a detection stage arranged to receive the translated output signal from the signal translation stage and analyse a first part and a second part of the translated output signal respectively corresponding to a first step function and a second step function, the first and second step functions being opposite in direction of transition. The analysis performed by the detection stage is a comparison of the first and second parts of the translated output signal respectively with an expected first part and an expected second part of the translated output signal.

Claims (39)

1 . A fault detection apparatus comprising:

a signal translation stage having an input arranged to receive an input waveform derived, when in use, from a signal for driving a capacitive load, the signal translation stage being arranged to generate a translated output signal representative of at least an aspect of the input waveform; and

a detection stage arranged to receive the translated output signal from the signal translation stage and analyse a first part of the translated output signal corresponding to a first step function and identify first detected bits constituting the first part of the translated output signal;

wherein the analysis performed by the detection stage is a comparison of the first part of the translated output signal with an expected first part of the translated output signal.

2 . An apparatus as claimed in claim 1 , wherein the input waveform is an analogue signal and the signal translation stage is arranged to digitise the input waveform, the digitised input waveform constituting the translated output signal.

3 . An apparatus as claimed in claim 2 , wherein the translated output signal comprises a bit, the bit having a state corresponding to one of: logic 1 or logic 0.

4 . An apparatus as claimed in claim 3 , wherein the signal translation stage comprises a slicer.

5 . An apparatus as claimed in claim 1 , wherein the detection stage is arranged to sum the first detected bits to yield a first measured value.

6 . An apparatus as claimed in claim 5 , wherein:

a first expected value corresponds to a sum of bits of a first expected bit pattern, the first expected bit pattern constitutes the expected first part of the translated output signal; and

the comparison between the first part of the translated output signal and the expected first part of the translated output signal is a comparison of the first measured value with the first expected value.

7 . An apparatus as claimed in claim 2 , wherein the translated output signal comprises a bit, the bit having a state corresponding to one of: logic 1, logic 0, or an indeterminate state.

8 . An apparatus as claimed in claim 7 , wherein:

a first expected bit pattern constitutes the expected first part of the translated output signal;

the detection stage is arranged to identify first detected bits constituting the first part of the translated output signal; and

the detection stage is also arranged to make a bit position-by-bit position comparison of the first detected bits with the first expected bit pattern.

9 . An apparatus as claimed in claim 8 , wherein the first detected bits comprise a first detected bit at a first bit position and the first expected bit pattern comprises a first expected bit at a bit position corresponding to the first bit position, the detection stage being arranged to determine a mismatch between the first detected bit and the first expected bit, the mismatch being indicative of a fault condition.

10 . An apparatus as claimed in claim 9 , wherein the first expected bit is of a first indeterminate state, the comparison discounting any mismatch between the state of the first expected bit and a state of the first detected bit.

11 . An apparatus as claimed in claim 1 , wherein the signal translation stage comprises a multi-state transformer.

12 . An apparatus as claimed in claim 1 , wherein the signal translation stage is arranged to generate at least part of a spectrum associated with the input waveform.

13 . An apparatus as claimed in claim 12 , wherein the first part of the translated output signal is a first part of the spectrum associated with the first step function.

14 . An apparatus as claimed in claim 1 , wherein a mismatch between the first part of the translated output signal and the respective expected first part of the translated output signal is indicative of a fault condition.

15 . An apparatus as claimed in claim 1 , wherein the capacitive load is a segment of a display device.

16 . An apparatus as claimed in claim 1 , wherein the detection stage is arranged to receive the translated output signal from the signal translation stage and analyse a second part of the translated output signal corresponding to a second step function, a direction of transition of the second step function being opposite to a direction of transition of the first step function; and

the analysis performed by the detection stage includes a comparison of the second part of the translated output signal with an expected second part of the translated output signal.

17 . (canceled)

18 . An electronic apparatus comprising the fault detection apparatus as claimed in claim 1 .

19 . (canceled)

20 . A method of detecting a fault for a capacitive load, the method comprising:

receiving an input waveform tapped from a signal for driving the capacitive load;

generating a translated output signal representative of at least an aspect of the input waveform;

analysing a first part of the translated output signal corresponding to a first step function and identifying first detected bits constituting the first part of the translated output signal; wherein

the analysis performed is a comparison of the first part of the translated output signal with an expected first part of the translated output signal.

21 . A non-transitory computer readable storage medium comprising computer program code means to make a computer execute the method as claimed in claim 20 .

22 . (canceled)

23 . An electronic apparatus as claimed in claim 18 , further comprising:

a display device comprising a display segment; and

a display driver coupled to the display segment;

wherein the input of the signal translation stage is coupled to a tap for receiving the input waveform, the tap being coupled to the display segment and the display driver.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0334 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0285 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0477 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0075 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027621/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2011
From: NEUGEBAUER, KURT
To: FREESCALE SEMICONDUCTOR INC.
Reel/Frame 025632/0754 →