IP Library Granted Patent US 8,618,818
Granted Patent B2
US 8,618,818 · App. 13/029,701 · Granted Dec 31, 2013

Electrostatic capacity type touch sensor

Inventors: Takayasu Otagaki (Hashima, JP); Atsuhiro Ichikawa (Mizuho, JP); Hiroya Ito (Ichinomiya, JP); Kazuhiro Hasegawa (Ichinomiya, JP)
Assignee: On Semiconductor Trading, Ltd.
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Quick Facts
Patent No.
US 8,618,818
App. No.
13/029,701
Granted
Dec 31, 2013
Kind
B2
Abstract

This invention offers an electrostatic capacity type touch sensor that can be calibrated in a short period of time at a moment when a finger of operator or the like does not touch a touch pad. An absolute value of a difference (AD 0 −AD 2 ) between a first output voltage AD 0 and a third output voltage AD 2 is compared with a first threshold value Vtr 1 in step S 10 . When the difference (AD 0 −AD 2 ) between the output voltages is smaller than the first threshold value Vtr 1 , it is judged that the finger of operator or the like does not touch the touch pad, and it is judged which of an offset in a second output voltage AD 1 and an offset in the third output voltage AD 2 is smaller than the other. When the offset in the second output voltage AD 1 is smaller than the offset in the third output voltage AD 2 , the modification to the second calibration data X 1 is permitted.

Claims (13)

1. An electrostatic capacity type touch sensor comprising:

a sensor circuit detecting a change in a capacitance of a touch pad;

a calibration register to adjust an offset in an output value of the sensor circuit; and

a control circuit configured to:

control the sensor circuit to obtain a first output value of the electrostatic capacity type touch sensor based on first calibration data stored in the calibration register,

modify the first calibration data depending on the first output value to obtain second calibration data,

control the sensor circuit to obtain a second output value of the electrostatic capacity type touch sensor based on the second calibration data,

after obtaining the second output value, control the sensor circuit to obtain a third output value of the electrostatic capacity type touch sensor based on the first calibration data, and

judge whether an offset in the second output value is larger than an offset in the third output value when a difference between the first output value and the third output value is smaller than a first threshold value, the offset in the second output value being a difference between a reference value and the second output value, and the offset in the third output value being a difference between the reference value and the third output value.

2. The electrostatic capacity type touch sensor of claim 1 , wherein the control circuit permits the modification of the first calibration data when the offset in the second output value is smaller than the offset in the third output value, but does not permit the modification of the first calibration data when the offset in the third output value is smaller than the offset in the second output value.

3. The electrostatic capacity type touch sensor of claim 1 , wherein the control circuit judges whether the offset in the second output value is smaller than the offset in the third output value when the difference between the first output value and the third output value is smaller than the first threshold value and a rate of change in an output value of the sensor circuit is smaller than a second threshold value.

4. The electrostatic capacity type touch sensor of claim 1 , wherein the first threshold value is one tenth of a maximum output value of the sensor circuit.

5. The electrostatic capacity type touch sensor of claim 1 , wherein the control circuit does not permit the modification of the first calibration data when the difference between the first output value and the third output value is larger than the first threshold value.

Assignments (8)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT #12/577882 PREVIOUSLY RECORDED ON REEL 026594 FRAME 0385. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2014
From: SANYO ELECTRIC CO., LTD
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032836/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2014
From: ON SEMICONDUCTOR TRADING SARL
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032335/0712 →
CHANGE OF NAME Recorded Feb 10, 2014
From: ON SEMICONDUCTOR TRADING, LTD.
To: ON SEMICONDUCTOR TRADING SARL
Reel/Frame 032238/0859 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2011
From: SANYO ELECTRIC CO., LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 026594/0385 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 17, 2011
From: OTAGAKI, TAKAYASU; ICHIKAWA, ATSUHIRO; ITO, HIROYA; HASEGAWA, KAZUHIRO
To: ON SEMICONDUCTOR TRADING, LTD.
Reel/Frame 025826/0763 →
Priority Claims (1)
JP 2010-033725 · Feb 18, 2010 · national
Continuity (1)
Related Publication 20110199105A1 · Aug 18, 2011