IP Library Granted Patent US 8,611,388
Granted Patent B2
US 8,611,388 · App. 13/040,184 · Granted Dec 17, 2013

Method and system for heterogeneous substrate bonding of waveguide receivers

Inventors: Stephen B. Krasulick (Albuquerque, NM); John Dallesasse (Geneva, IL)
Assignee: Skorpios Technologies, Inc.
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Quick Facts
Patent No.
US 8,611,388
App. No.
13/040,184
Granted
Dec 17, 2013
Kind
B2
Abstract

A composite integrated optical device includes a substrate including a silicon layer and a waveguide disposed in the silicon layer. The composite integrated optical device also includes an optical detector bonded to the silicon layer and a bonding region disposed between the silicon layer and the optical detector. The bonding region includes a metal-assisted bond at a first portion of the bonding region. The metal-assisted bond includes an interface layer positioned between the silicon layer and the optical detector. The bonding region also includes a direct semiconductor-semiconductor bond at a second portion of the bonding region.

Claims (18)

1. A composite integrated optical device comprising:

a complementary metal oxide semiconductor (CMOS) substrate comprising a silicon layer;

a waveguide disposed in the silicon layer;

an optical detector bonded to the silicon layer comprising; and

a bonding region disposed between the silicon layer and the optical detector, wherein the bonding region comprises:

a metal-assisted bond at a first portion of the bonding region, wherein the metal-assisted bond includes an interface layer positioned between the silicon layer and the optical detector; and

a direct semiconductor-semiconductor bond at a second portion of the bonding region.

2. The composite integrated optical device of claim 1 wherein the metal-assisted bond provides an ohmic contact between the optical detector and the silicon layer.

3. The composite integrated optical device of claim 1 wherein the metal-assisted bond provides a Schottky contact between the optical detector and the silicon layer.

4. The composite integrated optical device of claim 1 wherein the CMOS substrate comprises a silicon on insulator wafer.

5. The composite integrated optical device of claim 1 wherein the optical detector comprises a III-V optical device.

6. The composite integrated optical device of claim 1 wherein the III-V optical device comprises an APD receiver.

7. The composite integrated optical device of claim 1 wherein the interface layer comprises In x Pd y .

8. The composite integrated optical device of claim 7 wherein x=0.7 and y=0.3.

9. The composite integrated optical device of claim 1 wherein a thickness of the interface layer is less than 100 Å.

10. The composite integrated optical device of claim 9 wherein the thickness is less than 50 Å.

11. The composite integrated optical device of claim 1 wherein the waveguide supports a fundamental mode and a first portion of the waveguide associated with a maximum intensity of the fundamental mode includes a direct semiconductor-semiconductor bond and a second portion of the waveguide associated with a wing of the fundamental mode includes a metal-assisted bond.

12. The composite integrated optical device of claim 1 wherein the waveguide supports a higher order mode and a node of the higher order mode is positioned at a metal-assisted bond.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Nov 22, 2017
From: PACIFIC WESTERN BANK
To: SKORPIOS TECHNOLOGIES, INC.
Reel/Frame 044751/0469 →
SECURITY INTEREST Recorded Oct 23, 2017
From: SKORPIOS TECHNOLOGIES, INC.
To: PACIFIC WESTERN BANK
Reel/Frame 044272/0557 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 26, 2011
From: KRASULICK, STEPHEN B.; DALLESASSE, JOHN
To: SKORPIOS TECHNOLOGIES, INC.
Reel/Frame 026346/0218 →
Continuity (3)
Continuation In Part 12902621 · Oct 12, 2010
Provisional Application 61251132 · Oct 13, 2009
Related Publication 20120057816A1 · Mar 8, 2012