IP Library Granted Patent US 8,369,170
Granted Patent B2
US 8,369,170 · App. 13/053,727 · Granted Feb 5, 2013

Temperature detector in an integrated circuit

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Quick Facts
Patent No.
US 8,369,170
App. No.
13/053,727
Granted
Feb 5, 2013
Kind
B2
Abstract

A method for determining a temperature in a circuit comprises receiving a periodic signal. A frequency of the periodic signal is an increasing function of temperature. A number of oscillations of the periodic signal is determined during a time interval. A length of the time interval is an increasing function of temperature. The temperature is based on the determined number of oscillations.

Claims (44)

1. A method for determining a temperature in a circuit comprising:

receiving a periodic signal, a frequency of the periodic signal being an increasing function of temperature;

determining a number of oscillations of the periodic signal during a time interval, a length of the time interval being an increasing function of temperature; and

determining the temperature based on the determined number of oscillations.

2. The method of claim 1 , wherein determining the temperature comprises decoding the number of oscillations according to a look-up table.

3. The method of claim 1 , wherein receiving a periodic signal comprises:

generating the periodic signal by a ring oscillator having a temperature dependent supply voltage; and

receiving the periodic signal from the ring oscillator.

4. The method of claim 3 , wherein the temperature-dependent supply voltage is generated by a temperature-dependent voltage generator.

5. The method of claim 4 , further comprising determining the length of the time interval by a timer.

6. The method of claim 5 , wherein determining the length of the time interval by the timer comprises receiving a time-out signal from the timer corresponding to the length of the time interval.

7. The method of claim 6 , wherein:

the temperature-dependent supply voltage is a first temperature-dependent supply voltage; and

determining the length of the time interval by the timer further comprises generating the time-out signal by the timer based on a second temperature-dependent supply voltage.

8. The method of claim 7 , wherein the second temperature-dependent supply voltage is generated based on the first temperature-dependent supply voltage.

9. The method of claim 1 , wherein determining the number of oscillations comprises:

enabling a counter;

receiving the periodic signal by the counter;

counting the number of oscillations of the periodic signal by the counter; and

disabling the counter after the time interval has elapsed.

10. The method of claim 1 , wherein determining the number of oscillations comprises:

enabling a shift register;

receiving the periodic signal by the shift register;

counting the number of oscillations of the periodic signal by the shift register; and

disabling the shift register after the time interval has elapsed.

11. A temperature detector in a circuit comprising:

an oscillator configured to generate a periodic signal, a frequency of the periodic signal being an increasing function of temperature;

a timer for determining a time interval, a length of the time interval being an increasing function of temperature; and

a recorder in electrical communication with the ring oscillator and the timer for determining a number of oscillations of the periodic signal during the timer interval.

12. The temperature detector of claim 11 , further comprising a look-up table stored in a memory for decoding a content of the recorder.

13. The temperature detector of claim 11 , wherein the recorder is a counter.

14. The temperature detector of claim 11 , wherein the recorder is a shift register.

15. The temperature detector of claim 11 , wherein the oscillator is a ring oscillator.

16. The temperature detector of claim 15 , further comprising:

a temperature-dependent voltage generator for supplying a first temperature-dependent supply voltage to the ring oscillator.

17. The temperature-dependent detector of claim 16 , wherein the temperature-dependent voltage generator further supplies a second temperature-dependent supply voltage to the timer.

18. The temperature detector of claim 17 , wherein:

the timer is configured to generate a time-out signal corresponding to the length of the time interval; and

the recorder is configured to receive the periodic signal from the oscillator and count a number of oscillations of the periodic signal during the timer interval.

19. The temperature detector of claim 18 , wherein the time-out signal is operative to disable the recorder at the end of the time interval.

20. A method for refreshing a dynamic random access memory (DRAM) comprising:

receiving a periodic signal, a frequency of the periodic signal being an increasing function of temperature;

determining a number of oscillations of the periodic signal during a time interval a length of the time interval being an increasing function of temperature; and

determining a refresh rate of the DRAM based on the determined number of oscillations.

Assignments (8)
RELEASE OF U.S. PATENT AGREEMENT (FOR NON-U.S. GRANTORS) Recorded Oct 12, 2018
From: ROYAL BANK OF CANADA, AS LENDER
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 047645/0424 →
U.S. PATENT SECURITY AGREEMENT (FOR NON-U.S. GRANTORS) Recorded Sep 9, 2014
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CPPIB CREDIT INVESTMENTS INC., AS LENDER; ROYAL BANK OF CANADA, AS LENDER
Reel/Frame 033706/0367 →
CHANGE OF ADDRESS Recorded Sep 3, 2014
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 033678/0096 →
RELEASE OF SECURITY INTEREST Recorded Aug 7, 2014
From: ROYAL BANK OF CANADA
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.; CONVERSANT IP N.B. 868 INC.; CONVERSANT IP N.B. 276 INC.
Reel/Frame 033484/0344 →
CHANGE OF NAME Recorded Mar 13, 2014
From: MOSAID TECHNOLOGIES INCORPORATED
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 032439/0638 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 24, 2012
From: CHEN, CHUNG ZEN
To: ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC.
Reel/Frame 027760/0447 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2012
From: ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 027573/0390 →
U.S. INTELLECTUAL PROPERTY SECURITY AGREEMENT (FOR NON-U.S. GRANTORS) - SHORT FORM Recorded Jan 10, 2012
From: 658276 N.B. LTD.; 658868 N.B. INC.; MOSAID TECHNOLOGIES INCORPORATED
To: ROYAL BANK OF CANADA
Reel/Frame 027512/0196 →