IP Library Granted Patent US 8,539,424
Granted Patent B2
US 8,539,424 · App. 13/058,176 · Granted Sep 17, 2013

System and method for designing integrated circuits that employ adaptive voltage scaling optimization

Inventor: Alexander Tetelbaum (Hayward, CA)
Assignee: LSI Corporation
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Quick Facts
Patent No.
US 8,539,424
App. No.
13/058,176
Granted
Sep 17, 2013
Kind
B2
Abstract

A design process optimization system and method for designing a circuit, which may be an integrated circuit (IC) employing adaptive voltage and scaling optimization (AVSO). In one embodiment, the system includes: (1) a process-voltage-temperature (PVT) libraries database configured to contain PVT libraries of PVT characterizations of devices of cells from which the circuit is to be constructed and (2) a PVT library selector coupled to the PVT libraries database and configured to receive a selection indicating a supplemental objective and respond to the selection by selecting one of the PVT libraries from the PVT libraries database, a timing signoff tool later employing at most two corners from the one of the PVT libraries to perform a timing signoff with respect to the circuit.

Claims (35)

1. A design process system for designing a circuit, comprising:

a process-voltage-temperature (PVT) libraries database configured to contain PVT libraries of PVT characterizations of devices of cells from which said circuit is to be constructed; and

a PVT library selector coupled to said PVT libraries database and configured to receive a selection indicating a supplemental objective for said designing said circuit and respond to said selection by selecting one of said PVT libraries from said PVT libraries database, a timing signoff tool later employing at most two corners from said one of said PVT libraries to perform a timing signoff with respect to said circuit, wherein said at most two PVT corners are realistic corners.

2. The system as recited in claim 1 wherein said PVT library selector selects:

a fast-low-nominal PVT library if said supplemental objective is a reduced power consumption,

a typical-typical-nominal PVT library if said supplemental objective is a compromise between said reduced power consumption and a reduced turn-around time, and

a slow-high-nominal PVT library if said supplemental objective is said reduced turn-around time.

3. The system as recited in claim 2 wherein said reduced power consumption is a minimum power consumption.

4. The system as recited in claim 1 wherein said PVT libraries include a selected one of R, C and RC characterizations of said devices.

5. The system as recited in claim 1 wherein:

timing is closed for setup and hold violations with respective high and low temperature reports at a fast-low-nominal/Cbest corner if said supplemental objective is a reduced power consumption;

timing is closed for setup and hold violations with maximum and minimum reports at a typical-typical-nominal/Cnom corner if said supplemental objective is a compromise between said reduced power consumption and a reduced turn-around time; and

timing is closed for setup and hold violations with respective high and low temperature reports at a slow-high-nominal/Cworst corner if said supplemental objective is said reduced turn-around time.

6. The system as recited in claim 1 wherein said timing signoff tool also employs static or dynamic adaptive voltage and scaling optimization margins to perform said timing signoff.

7. The system as recited in claim 1 wherein said circuit is an integrated circuit employing adaptive voltage and scaling optimization.

8. The design process system as recited in claim 1 wherein a primary objective for designing said circuit is to operate at a nominal operating frequency and said supplemental objective differs from said primary objective.

9. A method of designing a circuit, comprising:

receiving a selection for a supplemental objective for said designing of said circuit;

selecting a process-voltage-temperature (PVT) library from a PVT libraries database in response to said selection of said supplemental objective;

synthesizing a logical structure of said circuit;

placing constituent cells of said circuit in a layout using an appropriate cell library;

routing interconnects among said constituent cells; and

performing a timing signoff using at most two PVT corners from said PVT library, wherein said at most two PVT corners are realistic corners.

10. The method as recited in claim 9 wherein said selecting said PVT library comprises:

selecting a fast-low-nominal PVT library if said supplemental objective is a reduced power consumption,

selecting a typical-typical-nominal PVT library if said supplemental objective is a compromise between reduced power consumption and reduced turn-around time, and

selecting a slow-high-nominal PVT library if said supplemental objective is said reduced turn-around time.

11. The method as recited in claim 10 wherein said reduced power consumption is a minimum power consumption.

12. The method as recited in claim 9 wherein said PVT libraries include a selected one of R, C and RC characterizations of said devices.

13. The method as recited in claim 9 further comprising:

employing respective high and low temperature reports at a fast-low-nominal/Cbest corner to close timing for setup and hold violations in said circuit if said supplemental objective is a reduced power consumption;

employing respective maximum and minimum reports at a typical-typical-nominal/Cnom corner to close timing for setup and hold violations in said circuit if said supplemental objective is a compromise between said reduced power consumption and a reduced turn-around time; and

employing respective high and low temperature reports at a slow-high-nominal/Cworst corner to close timing for setup and hold violations in said circuit if said supplemental objective is said reduced turn-around time.

14. The method as recited in claim 9 further comprising employing static or dynamic adaptive voltage and scaling optimization margins to perform said timing signoff.

15. The method as recited in claim 9 wherein said circuit is an integrated circuit employing adaptive voltage and scaling optimization.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059720/0223 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044887/0109 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2011
From: TELELBAUM, ALEXANDER Y.
To: LSI CORPORATION
Reel/Frame 026967/0237 →
Continuity (1)
Related Publication 20110138347A1 · Jun 9, 2011