IP Library Granted Patent US 8,299,829
Granted Patent B2
US 8,299,829 · App. 13/064,234 · Granted Oct 30, 2012

Clock generation circuit, semiconductor device including the same, and method of generating clock signal

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Quick Facts
Patent No.
US 8,299,829
App. No.
13/064,234
Granted
Oct 30, 2012
Kind
B2
Abstract

To provide a DLL circuit incorporating a duty adjustment circuit that is independent of the frequency of a clock signal. The DLL circuit includes: a delay line that delays a first internal clock signal to generate a second internal clock signal; a counter circuit that specifies an amount of delay of the delay line; a counter control circuit that adjusts a count value of the counter circuit; and a subtraction circuit that determines a difference between first and second count values at which the rise edge of the first internal clock signal coincides with that of a replica clock signal. The fall edge of the second internal clock signal is adjusted based on a value equivalent to one-half of the difference obtained. This prevents the applicable frequency range from being limited as with a type of duty adjustment circuit that alternately discharges capacitors.

Claims (44)

1. A clock generation circuit comprising:

a delay line that delays a first clock signal to generate a second clock signal;

a counter circuit that specifies an amount of delay of the delay line based on a count value thereof;

a counter control circuit that adjusts the count value of the counter circuit so that first active edges of the first and second clock signals have a predetermined relationship; and

a duty adjustment circuit that adjusts a second active edge of the second clock signal based on first and second count values at each of which the first active edges of the first and second clock signals have the predetermined relationship.

2. The clock generation circuit as claimed in claim 1 , wherein

a difference between the first count value and the second count value is equivalent to a natural number multiple of a cycle of the first clock signal,

the duty adjustment circuit performs an arithmetic operation using the difference to generate a third count value equivalent to half the cycle of the first clock signal, and

the duty adjustment circuit adjusts the second active edge of the second clock signal based on the third count value.

3. The clock generation circuit as claimed in claim 2 , wherein the duty adjustment circuit adjusts the second active edge of the second clock signal based on a sum of or a difference between the first or second count value and the third count value.

4. The clock generation circuit as claimed in claim 1 , wherein,

the counter control circuit updates the count value of the counter circuit so that a first active edge of a third clock signal generated based on the second clock signal coincides with the first active edge of the first clock signal, and

the first and second count values both are count values where the first active edges of the first and third clock signals coincide with each other.

5. A semiconductor device having a clock generation circuit, the clock generation circuit comprising:

a delay line that delays a first clock signal to generate a second clock signal;

a counter circuit that specifies an amount of delay of the delay line based on a count value thereof;

a counter control circuit that adjusts the count value of the counter circuit so that first active edges of the first and second clock signals have a predetermined relationship; and

a duty adjustment circuit that adjusts a second active edge of the second clock signal based on first and second count values at each of which the first active edges of the first and second clock signals have the predetermined relationship.

6. The semiconductor device as claimed in claim 5 , wherein

a difference between the first count value and the second count value is equivalent to a natural number multiple of a cycle of the first clock signal,

the duty adjustment circuit performs an arithmetic operation using the difference to generate a third count value equivalent to half the cycle of the first clock signal, and

the duty adjustment circuit adjusts the second active edge of the second clock signal based on the third count value.

7. The semiconductor device as claimed in claim 6 , wherein the duty adjustment circuit adjusts the second active edge of the second clock signal based on a sum of or a difference between the first or second count value and the third count value.

8. The semiconductor device as claimed in claim 5 , wherein,

the counter control circuit updates the count value of the counter circuit so that a first active edge of a third clock signal generated based on the second clock signal coincides with the first active edge of the first clock signal, and

the first and second count values both are count values where the first active edges of the first and third clock signals coincide with each other.

9. A semiconductor device comprising:

a clock generation circuit;

an output buffer that outputs output data to outside in synchronization with a second clock signal; and

a replica buffer that is a replica of the output buffer and generates a third clock signal in synchronization with the second clock signal, wherein

the clock generation circuit comprises:

a delay line that delays a first clock signal to generate the second clock signal;

a counter circuit that specifies an amount of delay of the delay line based on a count value thereof;

a counter control circuit that adjusts the count value of the counter circuit so that first active edges of the first and second clock signals have a predetermined relationship; and

a duty adjustment circuit that adjusts a second active edge of the second clock signal based on first and second count values at each of which the first active edges of the first and second clock signals have the predetermined relationship, and wherein

the counter control circuit updates the count value of the counter circuit so that a first active edge of the third clock signal coincides with the first active edge of the first clock signal, and

the first and second count values both are count values where the first active edges of the first and third clock signals coincide with each other.

10. A method of generating a clock signal comprising:

providing a clock generation circuit that includes a delay line and a counter circuit, the delay line delaying a first clock signal to generate a second clock signal, the counter circuit specifying an amount of delay of the delay line based on a count value thereof;

acquiring a first count value by adjusting the count value of the counter circuit so that first active edges of the first and second clock signals have a predetermined relationship;

acquiring a second count value different from the first count value by adjusting the count value of the counter circuit so that the first active edges of the first and second clock signals have the predetermined relationship;

performing an arithmetic operation using the first and second count values to generate a third count value; and

adjusting a second active edge of the second clock signal based on the third count value.

11. The method of generating a clock signal as claimed in claim 10 , further comprising adjusting the first active edge of the second clock signal based on the first or second count value.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2014
From: ELPIDA MEMORY, INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 032645/0422 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2011
From: KITAGAWA, KATSUHIRO
To: ELPIDA MEMORY, INC.
Reel/Frame 026001/0743 →