IP Library Granted Patent US 8,116,109
Granted Patent B2
US 8,116,109 · App. 13/065,755 · Granted Feb 14, 2012

Low-cost high-density rectifier matrix memory

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Quick Facts
Patent No.
US 8,116,109
App. No.
13/065,755
Granted
Feb 14, 2012
Kind
B2
Abstract

A high-density memory device is fabricated three-dimensionally in layers. To keep points of failure low, address decoding circuits are included within each layer so that, in addition to power and data lines, only the address signal lines need be interconnected between the layers.

Claims (30)

1. An electronic memory device comprising a plurality of layers of circuitry, wherein:

a first layer comprises (i) storage circuitry for storing and facilitating retrieval of information and

(ii) non-storage circuitry contributing to the access of the storage circuitry; and

a substrate layer, disposed beneath the first layer, comprises a plurality of transistors which receive signals from the first layer.

2. The electronic memory device of claim 1 , wherein the first layer is connected to the substrate layer by conductive vias.

3. The electronic memory device of claim 1 , wherein the transistors are NMOS transistors.

4. The electronic memory device of claim 1 , wherein the transistors are PMOS transistors.

5. The electronic memory device of claim 1 , further comprising one or more additional layers.

6. The electronic memory device of claim 1 , wherein the storage circuitry for storing and facilitating retrieval of information comprises:

a first plurality of generally parallel conductors;

a second plurality of generally parallel conductors overlapping and generally orthogonal to the first plurality of generally parallel conductors; and

a plurality of nonlinear conductive devices, each device located proximate to a point of overlap between the first and second pluralities of generally parallel conductors.

7. The electronic memory device of claim 6 , wherein at least one of the plurality of nonlinear conductive devices is connected to the second plurality of generally parallel conductors proximate to the point of overlap between the first and second pluralities of generally parallel conductors.

8. The electronic memory device of claim 1 , wherein the storage circuitry comprises a programmable device.

9. The electronic memory device of claim 8 , wherein the programmable device comprises a phase-change material.

10. The electronic memory device of claim 9 , wherein the phase-change material comprises a chalcogenide alloy.

11. The electronic memory device of claim 1 , wherein the storage circuitry comprises one of a fusible link and an antifusible link.

12. The electronic memory device of claim 6 , wherein each of the plurality of nonlinear conductive devices comprises a programmable element.

13. The electronic memory device of claim 1 , wherein the non-storage circuitry comprises circuitry for precharging the gate of a transistor.

14. The electronic memory device of claim 1 , wherein the non-storage circuitry comprises circuitry for discharging the gate of a transistor.

15. The electronic memory device of claim 1 , wherein the non-storage circuitry comprises circuitry for address decoding.

16. The electronic memory device of claim 1 , wherein the non-storage circuitry comprises circuitry for output sensing.

17. An electronic memory device comprising a plurality of layers of circuitry, wherein:

a first layer comprises (i) storage circuitry for storing and facilitating retrieval of information comprising:

(a) a first plurality of generally parallel conductors;

(b) a second plurality of generally parallel conductors overlapping and generally orthogonal to the first plurality of generally parallel conductors; and

(c) a plurality of nonlinear conductive devices, each device connected to the first plurality of generally parallel conductors at approximately a point of overlap between the first and second pluralities of generally parallel conductors, and

(ii) non-storage circuitry contributing to the access of the storage circuitry; and

a substrate layer, disposed beneath the first layer, comprises a plurality of transistors which receive signals from the non-storage circuitry,

wherein each of the plurality of nonlinear conductive devices comprises a fuse, an antifuse, or a phase-change material.

Assignments (15)
PATENT COLLATERAL AGREEMENT - A&R LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 064715/0001 →
PATENT COLLATERAL AGREEMENT - DDTL LOAN AGREEMENT Recorded Aug 21, 2023
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 067045/0156 →
RELEASE OF SECURITY INTEREST AT REEL 039389 FRAME 0684 Recorded Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 058965/0535 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2018
From: HGST, INC.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 046939/0587 →
RELEASE OF SECURITY INTEREST Recorded Aug 16, 2016
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: HGST, INC.
Reel/Frame 039689/0950 →
SECURITY AGREEMENT Recorded Jul 19, 2016
From: HGST, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 039389/0684 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME AND ADDRESS OF THE ASSIGNEE PREVIOUSLY RECORDED ON REEL 035748 FRAME 0909. ASSIGNOR(S) HEREBY CONFIRMS THE NAME AND ADDRESS OF THE ASSIGNEE SI HGST, INC.,3403 YERBA BUENA ROAD,SAN JOSE, CA 95135. Recorded Jun 2, 2015
From: CONTOUR SEMICONDUCTOR, INC.
To: HGST, INC.
Reel/Frame 035831/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 21, 2015
From: CONTOUR SEMICONDUCTOR, INC.
To: HGST NETHERLANDS B.V.
Reel/Frame 035748/0909 →
RELEASE OF SECURITY INTEREST Recorded May 20, 2015
From: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; SARAH G. KURZON 2001 REVOCABLE TRUST; OVONYX, INC.; PERRIN, DONALD; RUNNING DEER FOUNDATION; RUNNING DEER TRUST
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 035749/0956 →
RELEASE OF SECURITY INTEREST Recorded May 15, 2015
From: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; SARAH G. KURZON 2001 REVOCABLE TRUST; OVONYX, INC.; PERRIN, DONALD; RUNNING DEER FOUNDATION; RUNNING DEER TRUST
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 035685/0571 →
RELEASE OF SECURITY INTEREST Recorded Jun 24, 2014
From: AMERICAN CAPITAL, LTD.
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 033225/0330 →
SECURITY INTEREST Recorded Jun 20, 2014
From: CONTOUR SEMICONDUCTOR, INC.
To: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; SARAH G. KURZON 2001 REVOCABLE TRUST; OVONYX, INC.; PERRIN, DONALD; RUNNING DEER FOUNDATION; RUNNING DEER TRUST
Reel/Frame 033204/0428 →
SECURITY INTEREST Recorded May 30, 2014
From: CONTOUR SEMICONDUCTOR, INC.
To: AMERICAN CAPITAL, LTD.
Reel/Frame 033063/0617 →
SECURITY AGREEMENT Recorded Jan 18, 2013
From: CONTOUR SEMICONDUCTOR, INC.
To: AMERICAN CAPITAL, LTD.; STILL RIVER FUND III, LIMITED PARTNERSHIP; RUNNING DEER TRUST; RUNNING DEER FOUNDATION; SARAH G. KURZON 2001 REVOCABLE TRUST; PERRIN, DONALD
Reel/Frame 029659/0615 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2012
From: SHEPARD, DANIEL R.; LANGDO, THOMAS A.; PITERA, ARTHUR J.
To: CONTOUR SEMICONDUCTOR, INC.
Reel/Frame 029216/0517 →