System and method for debugging scan chains
View Patent ↗Scan chains are used to detect faults in integrated circuits but with the size of today's circuits, it is difficult to detect and locate scan chain faults, especially when the scan data in and scan data out have been compressed. A method for debugging scan chains includes selecting a scan chain for debugging using a scan chain selection block and then providing scan test vectors to the selected scan chain. The scan test vectors undergo various scan test stages to generate scan response vectors. The scan response vectors are compared with ideal response vectors to identify a failing scan chain.
1. A system for testing a scan chain, comprising:
a scan block for providing a scan test vector to the scan chain;
a scan chain selection block, connected to the scan block, for selecting the scan chain to be provided with the scan test vector;
a scan chain mask block, connected to the scan chain, for masking the scan chain and generating a scan test response vector; and
an enhanced mask control block, connected to the scan chain selection block and the scan chain mask block, for controlling the scan chain selection block to select the scan chain to be provided with the scan test vector and controlling the scan chain mask block to mask the scan chain; and
a compressor, connected to the scan chain mask block, for compressing the scan test response vector obtained from the scan chain mask block.
2. The scan chain testing system of claim 1 , wherein the scan test vector is received by way of a chip pin.
3. The scan chain testing system of claim 1 , wherein the scan test vector is generated on-chip.
4. The scan chain testing system of claim 1 , further comprising, an automatic test pattern generator (ATPG), connected to the scan block, for generating the scan test vector and providing the scan test vector to the scan block.
5. The scan chain testing system of claim 4 , further comprising a decompressor, connected to the ATPG, for decompressing the scan test vector received from the ATPG, wherein the decompressor randomizes the scan test vector received from the ATPG.
6. The scan chain testing system of claim 5 , further comprising:
a first multiplexer, connected to the decompressor, the scan chain selection block, and the scan chain, for providing the scan test vector received from at least one of the decompressor and the scan chain selection block; and
a mode control block for providing a first mode select signal to the first multiplexer to control an output of the first multiplexer.
7. The scan chain testing system of claim 6 , wherein the mode control block generates a second mode select signal, the system further comprising:
a customary mask control block, connected to the scan chain mask block, for controlling the scan chain mask block to mask the scan chain based on the scan test response vector; and
a second multiplexer, connected to the enhanced mask control block, the customary mask control block, and the mode control block, for providing a mask signal generated by at least one of the enhanced mask control block and the customary mask control block, wherein the second multiplexer operates based on a second mode select signal generated by the mode control block.
8. A system for testing a scan chain, comprising:
an automatic test pattern generator (ATPG) for generating a scan test vector;
a scan block, connected to the ATPG, that receives the scan test vector and provides the scan test vector to the scan chain;
a decompressor, connected to the ATPG, for decompressing the scan test vector received from the ATPG;
a scan chain selection block, connected between the scan block and the scan chain, for selecting the scan chain to be provided with the scan test vector from a plurality of scan chains;
a mode control block for generating a first mode select signal;
a first multiplexer having a first data input connected to the decompressor, a second data input connected to the scan chain selection block, and an output connected to the scan chain, wherein the first multiplexer provides the scan test vector received from one of the decompressor and the scan chain selection block, and wherein the first multiplexer operates based on the first mode select signal;
a scan chain mask block, connected to the output of the scan chain, for masking a scan response vector received from the scan chain;
an enhanced mask control block, connected to the scan chain selection block, for controlling the scan chain selection block to select the scan chain to be provided with the scan test vector, wherein the enhanced mask control block also controls the scan chain mask block;
a customary mask control block for controlling the scan chain mask block to mask the scan chain based on the scan test response vector obtained from the scan chain;
a second multiplexer, connected to the enhanced mask control block, the customary mask control block, and the mode control block, for providing a masking signal generated by at least one of the enhanced mask control block and the customary mask control block, wherein the second multiplexer operates based on a second mode select signal generated by the mode control block; and
a compressor, connected to the scan chain mask block, for compressing the scan test response vector obtained from the scan chain mask block.
9. The scan chain testing system of claim 8 , wherein the decompressor randomizes the scan test vector received from the ATPG.
10. A method for testing a scan chain, comprising:
selecting a scan chain from a plurality of scan chains;
providing a scan test vector to the selected scan chain using at least one of a scan logic and a decompressor logic, wherein the decompressor logic randomizes the scan test vector;
receiving a scan test response vector from the selected scan chain;
masking the non-selected scan chains; and
compressing the scan test response vector.
11. The method of claim 10 , wherein providing the scan test vector comprises providing the scan test vector in a broadcast mode.
12. The method of claim 10 , further comprising loading constant data into the non-selected scan chains.