IP Library Granted Patent US 8,653,529
Granted Patent B2
US 8,653,529 · App. 13/092,633 · Granted Feb 18, 2014

Semiconductor device and method of manufacturing the same

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,653,529
App. No.
13/092,633
Granted
Feb 18, 2014
Kind
B2
Abstract

In a semiconductor device in which a glass substrate is attached to a surface of a semiconductor die with an adhesive layer being interposed therebetween, it is an object to fill a recess portion of an insulation film formed on a photodiode with the adhesive layer without bubbles therein. In a semiconductor die in which an optical semiconductor integrated circuit including a photodiode having a recess portion of an interlayer insulation film in the upper portion, an NPN bipolar transistor, and so on are formed, generally, a light shield film covers a portion except the recess portion region on the photodiode and except a dicing region. In the invention, an opening slit is further formed in the light shield film, extending from the recess portion to the outside of the recess portion, so as to attain the object.

Claims (19)

1. A semiconductor device comprising:

a semiconductor die;

a semiconductor integrated circuit formed in a front surface portion of the semiconductor die and comprising a light receiving element;

an insulation film disposed on the semiconductor integrated circuit and having a recess portion on the light receiving element;

a light shield film disposed on the insulation film and having an opening on the recess portion and a slit extending, in a plan view of the light shield film, from the recess portion toward outside of the recess portion, the entire light shield film being made in one plane, and the slit and the opening having different shapes, the slit in the light shield film being an opening or a dent made by removing a portion of the light shield film;

a pad electrode disposed on the semiconductor die and connected to the semiconductor integrated circuit;

a supporting substrate attached to the front surface portion of the semiconductor die;

an adhesive layer disposed between the semiconductor die and the supporting substrate so as to attach the supporting substrate to the front surface portion of the semiconductor die; and

a back surface wiring electrode formed on a back surface of the semiconductor die and connected to the pad electrode.

2. The semiconductor device of claim 1 , wherein the slit cuts through the light shield film.

3. The semiconductor device of claim 1 , wherein the light shield film comprises a metal film.

4. The semiconductor device of claim 1 , wherein the light receiving element comprises a Blu-ray compatible photodiode.

5. The semiconductor device of claim 1 , wherein the supporting substrate comprises a glass substrate.

6. A method of manufacturing a semiconductor device, comprising:

providing a semiconductor die comprising a semiconductor integrated circuit comprising a light receiving element formed on a front surface of the semiconductor die; forming an insulation film on the semiconductor integrated circuit; forming a recess portion on the light receiving element by etching the insulation film; forming a light shield film on the insulation film having the recess portion; patterning the light shield film so as to form an opening on the recess portion, to remove the light shield film from a dicing region and to form an opening slit extending from the recess portion toward outside of the recess portion; forming on the semiconductor die a pad electrode connected to the semiconductor integrated circuit near the dicing region; attaching a supporting substrate to the front surface of the semiconductor die using an adhesive; and forming a back surface wiring electrode connected to the pad electrode on a back surface of the semiconductor die, wherein the entire light shield film being made in one plane, and the slit and the opening having different shapes.

7. The method of claim 6 , further comprising etching the insulation film exposed through the opening slit of the light shield film so that the opening slit extends into the insulation film.

8. The method of claim 6 , wherein the light shield film comprises a metal film.

9. The method of claim 6 , wherein the light receiving element comprises a Blu-ray compatible photodiode.

10. The method of claim 6 , wherein the supporting substrate comprises a glass substrate.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2014
From: ON SEMICONDUCTOR TRADING SARL
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 032035/0470 →
CHANGE OF NAME Recorded Jan 23, 2014
From: ON SEMICONDUCTOR TRADING, LTD.
To: ON SEMICONDUCTOR TRADING SARL
Reel/Frame 032143/0286 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2011
From: ISHIBE, SHINZO; KITAGAWA, KATSUHIKO
To: ON SEMICONDUCTOR TRADING, LTD.
Reel/Frame 026174/0178 →