Col-based semiconductor package including electrical connections through a single layer leadframe
View Patent ↗A semiconductor package is disclosed including a leadframe, memory die and controller die, one or more of which are customized to facilitate electrical connection of the memory and controller die bond pads to the contact pads of the host device via the leadframe. By customizing one or more of the leadframe, memory die and controller die, an interposer layer normally required to connect the die in the semiconductor package with a host device may be omitted.
1. A semiconductor package for transferring signals to and from contact pads of a host device, the semiconductor package, comprising:
a leadframe including a plurality of leads;
a memory die mounted to the leadframe, the memory die including memory die bond pads;
a controller die mounted on the leadframe, the controller die including controller die bond pads;
a first set of wire bonds between the memory die bond pads and a first set of leads of the plurality of leads of the leadframe; and
a second set of wire bonds between the memory die bond pads and a second set of leads of the plurality of leads of the leadframe;
wherein the plurality of leads of the leadframe are customized with a purpose of enabling the memory die bond pads to be electrically connected to the contact pads of the host device, and the controller die bond pads to be electrically connected to the contact pads of the host device, entirely by the plurality of leads of the leadframe and the first and second sets of wire bonds.
2. The semiconductor package of claim 1 , the leadframe including customized leads configured to minimize a length of the first set of wire bonds.
3. The semiconductor package of claim 1 , the leadframe including customized leads configured to minimize a length of the second set of wire bonds.
4. The semiconductor package of claim 1 , the leadframe including customized leads configured to provide an electrical connection between the contact pads of the host device and the die bond pads of the memory die and controller die without crossing over of leads of the plurality of leads.
5. The semiconductor package of claim 1 , the memory die including customized positions of the memory die bond pads configured to allow an electrical connection between the contact pads of the host device and the die bond pads of the memory die without crossing over of leads of the plurality of leads.
6. The semiconductor package of claim 1 , the controller die including customized positions of the controller die bond pads configured to allow an electrical connection between the contact pads of the host device and the die bond pads of the controller die without crossing over of leads of the plurality of leads.
7. The semiconductor package of claim 1 , wherein the memory die and controller die are positioned on opposite sides of the leadframe.
8. The semiconductor package of claim 7 , wherein memory die and controller die are mounted directly to the leadframe using a die attach adhesive.
9. The semiconductor package of claim 1 , wherein the memory die and controller die are positioned on the same side of the leadframe.
10. The semiconductor package of claim 9 , wherein the memory die has a first surface mounted to the leadframe, and a second surface opposite the first surface, the controller die being mounted to the second surface of the memory die.
11. The semiconductor package of claim 1 , wherein the leadframe includes forty-eight leads.
12. A semiconductor package for transferring signals to and from contact pads of a host device, the semiconductor package, comprising:
a leadframe including a plurality of leads;
a memory die mounted to the leadframe, the memory die including memory die bond pads;
a controller die mounted on the leadframe, the controller die including controller die bond pads;
wherein the plurality of leads of the leadframe are configured so as to enable signals to be transferred between the memory die bond pads and the contact pads of the host device, and between the controller die bond pads and the contact pads of the host device, without assistance of an interposer layer.
13. The semiconductor package of claim 12 , the leadframe including customized leads which bend in such a way to provide an electrical connection between the contact pads of the host device and the die bond pads of the memory die and controller die without crossing over of leads of the plurality of leads.
14. The semiconductor package of claim 12 , the memory die including customized positions of the memory die bond pads configured to allow an electrical connection between the contact pads of the host device and the die bond pads of the memory die without crossing over of leads of the plurality of leads.
15. The semiconductor package of claim 12 , the controller die including customized positions of the controller die bond pads configured to allow an electrical connection between the contact pads of the host device and the die bond pads of the controller die without crossing over of leads of the plurality of leads.
16. The semiconductor package of claim 12 , wherein the memory die and controller die are positioned on opposite sides of the leadframe.
17. The semiconductor package of claim 16 , wherein memory die and controller die are mounted directly to the leadframe using a die attach adhesive.
18. The semiconductor package of claim 12 , wherein the memory die and controller die are positioned on the same side of the leadframe.
19. The semiconductor package of claim 18 , wherein the memory die has a first surface mounted to the leadframe, and a second surface opposite the first surface, the controller die being mounted to the second surface of the memory die.
20. A semiconductor package for transferring signals to and from contact pads of a host device, the semiconductor package, comprising:
a leadframe including a plurality of leads;
a memory die mounted to the leadframe, the memory die including memory die bond pads;
a controller die mounted on the leadframe, the controller die including controller die bond pads;
wherein each of: a) the leads of the leadframe, b) the positions of the memory die bond pads, and c) the positions of the controller die bond pads are customized to facilitate electrical connection of the memory and controller die bond pads to the contact pads of the host device via the leadframe.
21. The semiconductor package of claim 20 , further comprising a first set of wire bonds between the memory die bond pads and a first set of leads of the plurality of leads of the leadframe.
22. The semiconductor package of claim 21 , the customized leads and customized positions of the memory die bond pads together allowing each wire bond of the first set of wire bonds to be below a predefined length.
23. The semiconductor package of claim 20 , further comprising a second set of wire bonds between the controller die bond pads and a second set of leads of the plurality of leads of the leadframe.
24. The semiconductor package of claim 23 , the customized leads and customized positions of the controller die bond pads together allowing each wire bond of the second set of wire bonds to be below a predefined length.