IP Library › Granted Patent US 8,638,605
Granted Patent B2
US 8,638,605 · App. 13/115,786 · Granted Jan 28, 2014

Apparatus and methods including a bipolar junction transistor coupled to a string of memory cells

Inventors: Paolo Tessariol (Montebelluna, IT); Roberto Gastaldi (Agrate Brianza, IT)
Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 8,638,605
App. No.
13/115,786
Granted
Jan 28, 2014
Kind
B2
Abstract

Some embodiments include apparatus and methods having a string of memory cells, a conductive line and a bipolar junction transistor configured to selectively couple the string of memory cells to the conductive line. Other embodiments including additional apparatus and methods are described.

Claims (55)

1. A device comprising:

a first conductive line and a second conductive line;

a first memory cell string coupled between the first conductive line and the second conductive line;

a first select transistor coupled between the first conductive line and the first memory cell string;

a second memory cell string coupled between the first conductive line and the second conductive line;

a first bipolar junction transistor coupled between the first memory cell string and the second conductive line;

a second bipolar junction transistor coupled between the second memory cell string and the second conductive line;

a second select transistor coupled between the first conductive line and the second memory cell string; and

wherein the first conductive line comprises a data line of the device, and the second conductive line comprises a source line of the device.

2. The device of claim 1 , wherein the first bipolar junction transistor includes a first base, and the second bipolar junction transistor includes a second base coupled to the first base.

3. The device of claim 2 , further comprising:

a third memory cell string coupled between the first conductive line and the second conductive line; and

a third bipolar junction transistor coupled between the third memory cell string and the second conductive line, wherein the third bipolar junction transistor includes a third base uncoupled to the first base and the second base.

4. A device comprising:

a first conductive line and a second conductive line, wherein the first conductive line comprises a data line of the device, and the second conductive line comprises a source line of the device;

a first memory cell string coupled between the first conductive line and the second conductive line;

a second memory cell string coupled between the first conductive line and the second conductive line;

a first bipolar junction transistor coupled between the first memory cell string and the second conductive line;

a second bipolar junction transistor coupled between the second memory cell string and the second conductive line;

a third memory cell string coupled between the first conductive line and the second conductive line; and

a third bipolar junction transistor coupled between the third memory cell string and the second conductive line, wherein the third bipolar junction transistor includes a third base uncoupled to the first base and the second base.

5. A device comprising:

a first conductive line and a second conductive line;

a first memory cell string coupled between the first conductive line and the second conductive line;

a second memory cell string coupled between the first conductive line and the second conductive line;

a first bipolar junction transistor coupled between the first memory cell string and the second conductive line;

a second bipolar junction transistor coupled between the second memory cell string and the second conductive line;

a first select transistor coupled between the first conductive line and the first memory cell string; and

a second select transistor coupled between the first conductive line and the second memory cell string, wherein the first select transistor includes a gate uncoupled to a gate of the second select transistor.

6. A device comprising:

a first region having a semiconductor material of a first type;

gates located along a length of the first region, each of the gates being separated from the first region by a respective charge storage structure;

a second region having a semiconductor material of the first type;

a third region coupling the first region to the second region, the third region having a semiconductor material of a second type; and

a conductive line directly coupled to the third region, wherein the first region forms an emitter of a bipolar junction transistor, the second region forms a collector of the bipolar junction transistor, and the third region forms a base of the bipolar junction transistor.

7. The device of claim 6 , wherein the first type includes p-type silicon.

8. The device of claim 7 , wherein the second type includes n-type silicon.

9. A device comprising:

a first region having a semiconductor material of a first type;

gates located along a length of the first region, each of the gates separated from the first region by a respective charge storage structure;

a second region having a semiconductor material of the first type;

a third region coupling the first region to the second region, the third region having a semiconductor material of a second type;

a conductive line directly coupled to the third region; and

a source line directly coupled to the second region.

10. The device of claim 9 , wherein the first region, the second region, and the third region are configured to form at least a part of a bipolar junction transistor.

11. The device of claim 9 , further comprising a substrate, wherein the second region line overlies the substrate, the third region overlies the second region, and the first region overlies the third region.

12. The device of claim 11 , further comprising a select transistor coupled to and overlying the first region, wherein the select transistor comprises a field effect transistor.

13. A device comprising:

a first region having a semiconductor material of a first type;

gates located along a length of the first region, each of the gates being separated from the first region by a respective charge storage structure;

a second region having a semiconductor material of the first type;

a third region coupling the first region to the second region, the third region having a semiconductor material of a second type; and

a conductive line directly coupled to the third region, wherein the first region forms a collector of a bipolar junction transistor, the second region forms an emitter of the bipolar junction transistor, and the third region forms a base of the bipolar junction transistor.

14. The device of claim 13 , wherein the first type includes n-type silicon.

15. The device of claim 14 , wherein the second type includes p-type silicon.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 11, 2012
From: TESSARIOL, PAOLO; GASTALDI, ROBERTO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 028388/0383 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2012
From: TESSARIOL, PAOLO; GASTALDI, ROBERTO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 028292/0555 →
Continuity (1)
Related Publication 20120300546A1 · Nov 29, 2012