IP Library Granted Patent US 8,749,251
Granted Patent B2
US 8,749,251 · App. 13/116,764 · Granted Jun 10, 2014

Proximity sensor

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Quick Facts
Patent No.
US 8,749,251
App. No.
13/116,764
Granted
Jun 10, 2014
Kind
B2
Abstract

In one embodiment, a method includes monitoring detection by a sensing element of a key touch on a touch screen; determining an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of a key touch on the touch screen; and, if the amount of time that has elapsed exceeds a predetermined time duration, then initiating a particular function of an apparatus.

Claims (30)

1. An apparatus comprising:

a sensing element of a touch screen; and

one or more computer-readable non-transitory storage media coupled to the sensing element and embodying logic that is operable when executed to:

determine an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of a key touch on the touch screen; and

if the amount of time that has elapsed exceeds a predetermined time duration, then initiate a particular function of the apparatus.

2. The apparatus of claim 1 , wherein the particular function comprises deactivation of measurement of changes in capacitance by the sensing element.

3. The apparatus of claim 1 , wherein the particular function comprises recalibration of measurement of changes in capacitance by the sensing element.

4. The apparatus of claim 1 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of power supply voltages or an output voltage of the sensing element.

5. The apparatus of claim 1 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of delay multipliers determined by a polarity of a voltage pulse.

6. The apparatus of claim 1 , wherein the particular function comprises turning off the apparatus.

7. The apparatus of claim 1 , wherein sensing element comprises a control circuit.

8. The apparatus of claim 7 , wherein the sensing element further comprises a pattern of electrodes within the touch screen, the electrodes being coupled to the control circuit.

9. The apparatus of claim 8 , wherein the electrodes comprise indium tin oxide (ITO).

10. A method comprising:

monitoring detection by a sensing element of a key touch on a touch screen, the sensing element being of the touch screen;

determining an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of a key touch on the touch screen; and

if the amount of time that has elapsed exceeds a predetermined time duration, then initiating a particular function of an apparatus.

11. The method of claim 10 , wherein the particular function comprises deactivating measurement of changes in capacitance by the sensing element.

12. The method of claim 10 , wherein the particular function comprises recalibrating measurement of changes in capacitance by the sensing element.

13. The method of claim 10 further comprises calculating the predetermined time duration based on one of a plurality of power supply voltages or an output voltage of the sensing element.

14. The method of claim 10 further comprises calculating the predetermined time duration based on one of a plurality of delay multipliers determined by a polarity of a voltage pulse.

15. The method of claim 10 , wherein the particular function comprises turning off power to an apparatus.

16. A computer-readable non-transitory storage media embodying logic that is operable when executed to:

monitor detection by a sensing element of a key touch on a touch screen, the sensing element being of a touch screen;

determine an amount of time that has elapsed since the sensing element last detected a change of capacitance indicative of a key touch on the touch screen; and

if the amount of time that has elapsed exceeds a predetermined time duration, then initiate a particular function of an apparatus.

17. The media of claim 16 , wherein the particular function comprises deactivation of measurement of changes in capacitance by the sensing element.

18. The media of claim 16 , wherein the particular function comprises recalibration of measurement of changes in capacitance by the sensing element.

19. The media of claim 16 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of power supply voltages or an output voltage of the sensing element.

20. The media of claim 16 , wherein the logic is further operable to calculate the predetermined time duration based on one of a plurality of delay multipliers determined by a polarity of a voltage pulse.

Assignments (14)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 27, 2019
From: SOLAS OLED LIMITED
To: NEODRÓN LIMITED
Reel/Frame 050518/0457 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2019
From: MICROCHIP TECHNOLOGY INCORPORATED; AMTEL CORPORATION
To: SOLAS OLED LIMITED
Reel/Frame 048201/0225 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0884 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0937 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2013
From: QRG LIMITED
To: ATMEL CORPORATION
Reel/Frame 030284/0752 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2013
From: PHILIPP, HARALD; SNOAD, KEVIN
To: QRG LIMITED
Reel/Frame 030284/0692 →