IP Library Granted Patent US 8,492,870
Granted Patent B2
US 8,492,870 · App. 13/159,190 · Granted Jul 23, 2013

Semiconductor package with interconnect layers

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Quick Facts
Patent No.
US 8,492,870
App. No.
13/159,190
Granted
Jul 23, 2013
Kind
B2
Abstract

A chip package comprising a glass substrate, wherein a first opening in the glass substrate passes vertically through the glass substrate, a semiconductor chip, a wiring structure comprising a first portion in the first opening and a second portion over the glass substrate, wherein the first portion is connected to the semiconductor chip, wherein the wiring structure comprises a passive device, wherein the wiring structure comprises copper, and a dielectric layer over the glass substrate and on the wiring structure, wherein a second opening in the dielectric layer is over a contact point of the wiring structure, and the contact point is at a bottom of the second opening.

Claims (18)

1. A chip package comprising:

an etchable glass substrate, wherein a first opening in said etchable glass substrate passes through said etchable glass substrate;

a semiconductor chip coupled to the etchable glass substrate;

a conductive structure comprising a first portion disposed within said first opening and a second portion coupled to the etchable glass substrate, wherein said first portion is coupled to said semiconductor chip, wherein said conductive structure comprises a passive device; and

a dielectric layer over said etchable glass substrate and over said conductive structure, wherein a second opening in said dielectric layer exposes a contact point of said conductive structure.

2. The chip package of claim 1 , wherein said passive device comprises an inductor.

3. The chip package of claim 1 , wherein said passive device comprises a capacitor.

4. The chip package of claim 1 , wherein said passive device comprises a resistor.

5. The chip package of claim 1 , wherein said first opening is aligned with said semiconductor chip.

6. The chip package of claim 1 , wherein said semiconductor chip is at a bottom side of said etchable glass substrate.

7. The chip package of claim 1 further comprises a conductive interconnect over said etchable glass substrate, wherein said conductive interconnect is coupled to said semiconductor chip.

8. The chip package of claim 7 , wherein said conductive interconnect comprises a gold interconnect.

9. The chip package of claim 7 , wherein said conductive interconnect comprises a solder interconnect.

10. The chip package of claim 1 , wherein said etchable glass substrate has a width greater than that of said semiconductor chip.

11. The chip package of claim 1 , wherein said dielectric layer comprises a polymer layer.

12. The chip package of claim 1 , wherein said semiconductor chip is coupled with said etchable glass substrate.

13. The chip package of claim 1 , wherein said semiconductor chip joins said conductive structure.

14. The chip package of claim 1 , wherein said conductive structure comprises electroplated copper.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2014
From: MEGIT ACQUISITION CORP.
To: QUALCOMM INCORPORATED
Reel/Frame 033303/0124 →
MERGER Recorded Sep 25, 2013
From: MEGICA CORPORATION
To: MEGIT ACQUISITION CORP.
Reel/Frame 031283/0198 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2013
From: MEGIC CORPORATION
To: MEGICA CORPORATION
Reel/Frame 030451/0398 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2013
From: LIN, MOU-SHIUNG; LEE, JIN-YUAN; HUANG, CHING-CHENG
To: MEGIC CORPORATION
Reel/Frame 030451/0410 →