Chip package having a chip combined with a substrate via a copper pillar
View Patent ↗A method of assembling chips. A first chip and a second chip are provided. At least one conductive pillar is formed on the first chip, and a conductive connecting material is formed on the conductive pillar. The second chip also comprises at least one conductive pillar. The first chip is connected to the second chip via the conductive pillars and the conductive connecting material.
1. A chip package comprising:
a carrier comprising a glass substrate;
a first chip over said carrier and an opening in said glass substrate, wherein said opening passes completely through said glass substrate;
a first metal bump between said first chip and said carrier, wherein said first metal bump comprises a first copper pillar between said first chip and said carrier and a solder between said first copper pillar and said carrier, wherein said first copper pillar has a height greater than a vertical distance between a bottom end of said first copper pillar and said carrier;
a second chip located in said opening in said glass substrate, and a second metal bump located between said first chip and said second chip, wherein said second chip is connected to said first chip only through said second metal bump, wherein a first end of said second metal bump physically connects to said first chip and a second end of said second metal bump physically connects to said second chip; an encapsulating material between said first chip and said glass substrate, wherein said encapsulating material covers said second chip and a top surface of said glass substrate, wherein said encapsulating material exposes a bottom surface of said glass substrate; and
multiple solder balls under said carrier.
2. The chip package of claim 1 , wherein said solder comprises a tin-containing alloy.
3. The chip package of claim 2 , wherein said tin-containing alloy comprises copper.
4. The chip package of claim 2 , wherein said tin-containing alloy comprises silver.
5. The chip package of claim 2 , wherein said tin-containing alloy comprises gold.
6. The chip package of claim 2 , wherein said tin-containing alloy comprises lead.
7. The chip package of claim 1 , wherein said second metal bump comprises a second copper pillar between said first and second chips.
8. The chip package of claim 1 , wherein said second metal bump comprises a tin-containing alloy between said first and second chips.
9. The chip package of claim 8 , wherein said tin-containing alloy comprises silver.
10. The chip package of claim 8 , wherein said tin-containing alloy comprises gold.
11. A chip package comprising:
an organic substrate;
a first chip over said organic substrate;
a first copper bump between said first chip and said organic substrate, wherein said first copper bump has a height greater than a vertical distance between a bottom end of said first copper bump and said organic substrate;
a first tin-and-gold-containing alloy between said first copper bump and said organic substrate;
a second chip located in an opening in said organic substrate, and a metal bump located between said first chip and said second chip, wherein said second chip is connected to said first chip only through said metal bump, wherein a first end of said metal bump physically connects to said first chip and a second end of said metal bump physically connects to said second chip; and
an encapsulating material between said first chip and said organic substrate, wherein said encapsulating material contacts said first chip, said encapsulating material covering said second chip, a top surface of said organic substrate and a sidewall of said first copper bump said encapsulating material exposing a bottom surface of said organic substrate.
12. The chip package of claim 11 , wherein said first tin-and-gold-containing alloy comprises silver.
13. The chip package of claim 11 , wherein said metal bump comprises a second copper bump between said first and second chips.
14. The chip package of claim 11 , wherein said metal bump comprises a tin-containing alloy between said first and second chips.
15. The chip package of claim 11 , wherein said metal bump comprises a second tin-and-gold-containing alloy between said first and second chips.
16. The chip package of claim 11 , wherein said metal bump comprises a tin-and-silver-containing alloy between said first and second chips.
17. The chip package of claim 11 , wherein said first copper bump has a sidewall with a portion not covered by said tin-and-gold-containing alloy.
18. A chip package comprising:
a carrier comprising a glass substrate;
a first chip over said carrier and an opening in said glass substrate, wherein said opening passes completely through said glass substrate;
a first metal bump between said first chip and said carrier, wherein said first metal bump comprises a first copper pillar between said first chip and said carrier and a solder between said first copper pillar and said carrier, wherein said first copper pillar has a height greater than a vertical distance between a bottom end of said first copper pillar and said carrier, and greater than a height of said solder;
a second chip located in said opening in said glass substrate, and a second metal bump located between said first chip and said second chip, wherein said second chip is connected to said first chip only through said second metal bump, and wherein said second metal bump comprises a second copper pillar, and wherein a first end of said second metal bump physically connects to said first chip and a second end of said second metal bump physically connects to said second chip; an encapsulating material between said first chip and said glass substrate, wherein said encapsulating material covers said second chip and a top surface of said glass substrate, wherein said encapsulating material exposes a bottom surface of said glass substrate; and
multiple solder balls under said carrier.