Memory device and method using encode values for access error condition detection
View Patent ↗A memory module decodes an address to determine a one or more wordline select pattern, or other spatial select pattern. An encoder determines an encoded value based upon the wordline select pattern that is compared to an expected encode value. The encode value has fewer than twice the number of address bits used to determine the wordline select pattern.
1. A method comprising:
receiving, at a select decoder of a memory module, N bits of an input address value received at the memory module, the N bits corresponding to a first valid spatial select pattern to be provided to a corresponding select interconnect by the select decoder during a decode portion of a first access cycle; and
determining, during an encode portion of the first memory access cycle, a first encoded value at an encode interconnect, the encode interconnect having a bit size less than twice N (2×N), wherein no desired encode value at the encode interconnect for any received N bits can alias a desired encoded value corresponding to an invalid spatial select pattern of the received N bits.
2. The method of claim 1 , wherein the spatial select pattern is a set of wordline select signals.
3. The method of claim 1 , wherein the spatial select pattern is a set of column select signals.
4. The method of claim 1 , wherein the spatial select pattern is a set of block select signals.
5. The method of claim 1 , wherein the spatial select pattern is a set of signals including one or more of wordline select signals, column select signals, and block select signals.
6. The method of claim 1 , wherein the invalid spatial select pattern is invalid for the memory module.
7. The method of claim 1 , wherein the invalid spatial select pattern is a valid spatial select pattern of the memory module, but not for the received N bits.
8. The method of claim 1 , wherein determining the first encoded value at the select interface includes wire-ORing a plurality of switches.
9. The method of claim 8 , wherein each wire-ORed switch of the corresponding plurality of switches is controlled by a corresponding bit of the asserted memory array select pattern.
10. The method of claim 8 , wherein each switch of the plurality of switches includes a pair of switches.
11. The method of claim 1 further comprising:
determining an expected encoded value based on the N bits of the input address value; and
determining a validity of the first access cycle based upon a comparison of the first encoded value to the expected encoded value.
12. A method of accessing a memory array comprising:
receiving at a decode module N address bits, the N address bits corresponding to a first valid spatial select pattern of a plurality of valid spatial select patterns of the memory array to be asserted at a set of spatial select interconnects, each valid spatial select pattern of the memory array having M-bit positions, where M is greater than N;
determining a desired encode value based upon an asserted spatial select pattern at the set of spatial select interconnects, wherein desired encode value of the memory array has a first number of logic 1s, and a second number of logic 0s, a sum of the first and second number is less than two times N (2×N).
13. The method of claim 12 , wherein the number of invalid encode values of the memory module having first number of logic is less than one-half the number of valid encode values having the first number of logic 1s.
14. The method of claim 12 , wherein the number of logic 1s of each desired encode value is the same as the number of logic 0s in each desired encode value.
15. The method of claim 12 , wherein determining the desired encode value includes wire-ORing a plurality of switches controlled by bits of the desired encode value.
16. The method of claim 12 further comprising:
determining an expected encoded value based on the N address bits; and
determining a validity of an access of the memory array based upon a comparison of the first encoded value to the expected encoded value.
17. A device comprising:
a wordline encoder comprising an N-bit input coupled to N wordlines including wordlines WL_ 1 through WL_N, and an M-bit output to provide an encoded value for each valid word line pattern, the wordline encoder further comprises
a plurality of encode blocks, each encode block coupled to the N wordlines, and comprising M transistor sets, each transistor set comprising an output corresponding to one of the M-bit outputs, wherein
each encode block to provide a first valid encode value for one valid word line pattern and a second valid encode value that is the complement of the first valid encode value for a different valid wordline pattern.
18. The device of claim 17 , wherein each transistor set is a two transistor set.
19. The device of claim 17 , wherein each transistor of each transistor set is wire-ORed to each other transistor of the transistor set.
20. The device of claim 17 , wherein each transistor set is to have no more than one conductive transistor for any valid encode value.