IP Library Granted Patent US 8,730,625
Granted Patent B2
US 8,730,625 · App. 13/239,640 · Granted May 20, 2014

Electrostatic discharge protection circuit for an integrated circuit

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Quick Facts
Patent No.
US 8,730,625
App. No.
13/239,640
Granted
May 20, 2014
Kind
B2
Abstract

An electrostatic discharge (ESD) protection circuit includes a clamping transistor and a trigger circuit. The clamping transistor is coupled between a first power supply voltage terminal and a second power supply voltage terminal. The trigger circuit includes a detection circuit, first and second transistors, and first, second, and third inverters. The detection circuit is coupled to monitor a power supply voltage. The first inverter has an input terminal coupled to a current electrode of the first transistor, and an output terminal coupled to a control electrode of the clamping transistor. The second inverter and the third inverter form a feedback path from the output of the first inverter to the control electrode of the first transistor. The second inverter has a switching voltage that is lower than a midpoint voltage of a power supply voltage provided to the first and second power supply voltage terminals.

Claims (65)

1. An electrostatic discharge (ESD) protection circuit comprising:

a clamping transistor having a first current electrode coupled to a first power supply voltage terminal, a second current electrode coupled to a second power supply voltage terminal, and a control electrode; and

a trigger circuit comprising:

a detection circuit having an input terminal coupled to monitor a power supply voltage, and having an output terminal;

a first transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode, and a second current electrode;

a second transistor having a first current electrode coupled to the second current electrode of the first transistor, a control electrode coupled to the output terminal of the detection circuit, and a second current electrode coupled to the second power supply voltage terminal;

a first inverter having an input terminal coupled to the second current electrode of the first transistor, and an output terminal coupled to the control electrode of the clamping transistor for providing a trigger signal to the control electrode of the clamping transistor;

a second inverter having an input terminal coupled to the output terminal of the first inverter, and an output terminal, wherein the second inverter having a switching voltage that is lower than a midpoint voltage of a power supply voltage provided to the first and second power supply voltage terminals; and

a third inverter having an input terminal coupled to the output terminal of the second inverter, and an output terminal coupled to the control electrode of the first transistor and not coupled to the control electrode of the clamping transistor, wherein the third inverter is configured to provide a feedback signal to the first transistor that is distinct from the trigger signal provided by the first inverter to the clamping transistor.

2. The ESD protection circuit of claim 1 , wherein the second inverter comprises:

a third transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the output terminal of the first inverter, and a second current electrode;

a fourth transistor having a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the input terminal of the third inverter;

a fifth transistor having a first current electrode coupled to the second current electrode of the fourth transistor, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the second power supply voltage terminal; and

a sixth transistor having a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the second current electrode of the fourth transistor, and a second current electrode coupled to the second power supply voltage terminal.

3. The ESD protection circuit of claim 2 , wherein the third transistor is sized to provide a higher channel resistance than a channel resistance of the fourth transistor.

4. The ESD protection circuit of claim 2 , wherein the sixth transistor has a lower channel resistance than a channel resistance of the fourth transistor.

5. The ESD protection circuit of claim 2 , further comprising:

a seventh transistor having a first current electrode coupled to the first power supply voltage terminal, and a control electrode and a second current electrode coupled together;

an eighth transistor having a first current electrode coupled to the second current electrode of the seventh transistor, a control electrode coupled to the output terminal of the third inverter, and a second current electrode coupled to the second power supply voltage terminal; and

a ninth transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the control electrode of the seventh transistor, and a second current electrode coupled to the input terminal of the first inverter.

6. The ESD protection circuit of claim 2 , wherein a ratio of channel length to channel width of the third transistor is higher than a ratio of channel length to channel width of the fourth transistor.

7. The ESD protection circuit of claim 2 , wherein a ratio of channel length to channel width of the sixth transistor is less than a ratio of channel length to channel width of the fourth transistor.

8. The ESD protection circuit of claim 1 , wherein the detection circuit comprises:

a capacitive element having a first terminal coupled to the first power supply voltage terminal, and a second terminal coupled to the output terminal of the detection circuit; and

a resistive element having a first terminal coupled to the second terminal of the capacitive element, and a second terminal coupled to the second power supply voltage terminal.

9. The ESD protection circuit of claim 1 , further comprising a resistive element having a first terminal coupled to the control electrode of the clamping transistor, and a second terminal coupled to the second power supply voltage terminal.

10. An electrostatic discharge (ESD) protection circuit comprising:

a clamping transistor having a first current electrode coupled to a first power supply voltage terminal, a second current electrode coupled to a second power supply voltage terminal, and a control electrode; and

a trigger circuit comprising:

a transient detection circuit coupled to monitor a power supply voltage and having an output terminal;

a first transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode, and a second current electrode;

a second transistor having a first current electrode coupled to the second current electrode of the first transistor, a control electrode coupled to the output terminal of the transient detection circuit, and a second current electrode coupled to the second power supply voltage terminal;

a first inverter having an input terminal coupled to the second current electrode of the first transistor, and an output terminal for providing a trigger signal to the control electrode of the clamping transistor;

a second inverter having an input terminal coupled to the output terminal of the first inverter, and an output terminal, wherein the second inverter having a switching voltage that is lower than a midpoint voltage of a power supply voltage provided to the first and second power supply voltage terminals; and

a third inverter having an input terminal coupled to the output terminal of the second inverter, and an output terminal coupled to the control electrode of the first transistor and not coupled to the control electrode of the clamping transistor, wherein the third inverter is configured to provide a feedback signal to the first transistor that is distinct from the trigger signal provided by the first inverter to the clamping transistor,

wherein the clamping transistor is conductive when the trigger voltage is at a first voltage level, wherein the clamping transistor is non-conductive when the trigger voltage is at a second voltage level, and wherein the second inverter and third inverter are enabled to control a rate at which the trigger voltage transitions from the first voltage level to the second voltage level by delaying when a logic state of the first inverter changes following detection of a fast rising voltage the first power supply voltage terminal by the detection circuit.

11. The ESD protection circuit of claim 10 , wherein the second inverter comprises:

a third transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the output terminal of the first inverter, and a second current electrode;

a fourth transistor having a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the input terminal of the third inverter;

a fifth transistor having a first current electrode coupled to the second current electrode of the fourth transistor, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the second power supply voltage terminal; and

a sixth transistor having a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the second current electrode of the fourth transistor, and a second current electrode coupled to the second power supply voltage terminal.

12. The ESD protection circuit of claim 11 , wherein the third transistor is sized to provide a higher channel resistance than a channel resistance of the fourth transistor.

13. The ESD protection circuit of claim 11 , wherein the sixth transistor has a lower channel resistance than a channel resistance of the fourth transistor.

14. The ESD protection circuit of claim 11 , wherein a ratio of channel length over channel width of the third transistor is higher than a ratio of channel length over channel width of the fourth transistor.

15. The ESD protection circuit of claim 11 , wherein a ratio of channel length over channel width of the sixth transistor is less than a ratio of channel length over channel width of the fourth transistor.

16. The ESD protection circuit of claim 11 , further comprising:

a seventh transistor having a first current electrode coupled to the first power supply voltage terminal, and a control electrode and a second current electrode coupled together;

an eighth transistor having a first current electrode coupled to the second current electrode of the seventh transistor, a control electrode coupled to the output terminal of the third inverter, and a second current electrode coupled to the second power supply voltage terminal; and

a ninth transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the control electrode of the seventh transistor, and a second current electrode coupled to the input terminal of the first inverter.

17. An electrostatic discharge (ESD) protection circuit comprising:

a clamping transistor having a first current electrode coupled to a first power supply voltage terminal, a second current electrode coupled to a second power supply voltage terminal, and a control electrode; and

a trigger circuit comprising:

a transient detection circuit coupled to monitor a power supply voltage and having an output terminal;

a first transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode, and a second current electrode;

a second transistor having a first current electrode coupled to the second current electrode of the first transistor, a control electrode coupled to the output terminal of the transient detection circuit, and a second current electrode coupled to the second power supply voltage terminal;

a first inverter having an input terminal coupled to the second current electrode of the first transistor, and an output terminal for providing a trigger signal to the control electrode of the clamping transistor;

a second inverter comprising:

a third transistor having a first current electrode coupled to the first power supply voltage terminal, a control electrode coupled to the output terminal of the first inverter, and a second current electrode;

a fourth transistor having a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the input terminal of the third inverter;

a fifth transistor having a first current electrode coupled to the second current electrode of the fourth transistor, a control electrode coupled to the output terminal of the first inverter, and a second current electrode coupled to the second power supply voltage terminal; and

a sixth transistor having a first current electrode coupled to the second current electrode of the third transistor, a control electrode coupled to the second current electrode of the fourth transistor, and a second current electrode coupled to the second power supply voltage terminal; and

a third inverter having an input terminal coupled to the output terminal of the second inverter, and an output terminal coupled to the control electrode of the first transistor and not coupled to the control electrode of the clamping transistor, wherein the third inverter is configured to provide a feedback signal to the first transistor that is distinct from the trigger signal provided by the first inverter to the clamping transistor.

18. The ESD protection circuit of claim 17 , wherein a ratio of channel length over channel width of the third transistor is higher than a ratio of channel length over channel width of the fourth transistor.

19. The ESD protection circuit of claim 17 , wherein a ratio of channel length over channel width of the sixth transistor is less than a ratio of channel length over channel width of the fourth transistor.

20. The ESD protection circuit of claim 17 , further comprising a resistive element having a first terminal coupled to the control electrode of the clamping transistor, and a second terminal coupled to the second power supply voltage terminal.

Assignments (21)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0285 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0387 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0334 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027622/0075 →
SECURITY AGREEMENT Recorded Jan 31, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2011
From: STOCKINGER, MICHAEL A.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 026948/0642 →