IP Library Granted Patent US 8,350,249
Granted Patent B1
US 8,350,249 · App. 13/245,405 · Granted Jan 8, 2013

Coalesced nanowire structures with interstitial voids and method for manufacturing the same

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Quick Facts
Patent No.
US 8,350,249
App. No.
13/245,405
Granted
Jan 8, 2013
Kind
B1
Abstract

A semiconductor device, such as an LED, includes a plurality of first conductivity type semiconductor nanowire cores located over a support, a continuous second conductivity type semiconductor layer extending over and around the cores, a plurality of interstitial voids located in the second conductivity type semiconductor layer and extending between the cores, and first electrode layer that contacts the second conductivity type semiconductor layer and extends into the interstitial voids.

Claims (20)

1. A semiconductor device, comprising:

a plurality of first conductivity type semiconductor nanowire cores located over a support;

a continuous second conductivity type semiconductor layer extending over and around the cores;

a plurality of interstitial voids located in the second conductivity type semiconductor layer and extending between the cores;

a first electrode layer that contacts the second conductivity type semiconductor layer and extends into the interstitial voids; and

at least one quantum well shell located around the cores and surrounded by a first portion of the second conductivity type semiconductor layer which completely fills interstitial spaces between the cores and by a second portion of the second conductivity type semiconductor layer which does not completely fill the interstitial spaces to leave the interstitial voids in the interstitial spaces;

wherein the cores are positioned such that a non-tessellated configuration is provided as the second conductivity type semiconductor layer extends around the cores to form the interstitial voids.

2. The device of claim 1 , wherein the device comprises a light emitting diode (LED) device.

3. The device of claim 2 , wherein the second conductivity type semiconductor layer directly physically contacts the cores to form a light emitting p-n junction at each core.

4. The device claim 2 , wherein the support comprises a semiconductor substrate.

5. The device claim 2 , wherein the first electrode layer is transparent.

6. The device of claim 2 , wherein the cores comprise semiconductor nanowires epitaxially extending from portions of a semiconductor surface of the support exposed through openings in an insulating mask layer located on the support.

7. The device of claim 1 , wherein an active region shell comprises the at least one quantum well and the second conductivity type semiconductor layer directly physically contacts the at least one quantum well shell to form a light emitting p-i-n junction at each nanowire core surrounded by the at least one quantum well shell.

8. The device of claim 7 , wherein the first conductivity type comprises n-type, the second conductivity type comprises p-type and the first electrode layer comprises a p-electrode layer.

9. The device of claim 8 , further comprising a second electrode layer which electrically connects to the n-type nanowire cores.

10. The device of claim 8 , wherein the support comprises an n-type semiconductor buffer layer on a substrate.

11. The device of claim 10 , wherein the substrate comprises an n-Si substrate, the buffer layer comprises an n-GaN or n-AlGaN layer, the cores comprise n-GaN nanowires epitaxially extending from portions of the buffer layer surface exposed through openings in an insulating mask layer on the buffer layer, the at least one quantum well comprises an InGaN quantum well, and the second conductivity type semiconductor layer comprises a p-GaN layer.

12. The device of claim 1 , wherein the second conductivity type semiconductor layer is substantially planar.

13. The device of claim 1 , wherein the first electrode layer partially or fully fills the interstitial voids to contact the second portion of the second conductivity type semiconductor layer.

14. The device of claim 13 , wherein the first electrode layer partially fills the interstitial voids such that an air-bridged electrode configuration is formed.

Assignments (9)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2024
From: GLO TECHNOLOGIES LLC
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 068297/0220 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2023
From: SYSONAN, INC.
To: GLO TECHNOLOGIES LLC
Reel/Frame 065178/0210 →
CHANGE OF NAME Recorded Oct 5, 2023
From: NANOSYS, INC.
To: SYSONAN, INC.
Reel/Frame 065156/0416 →
TERMINATION AND RELEASE OF PATENT SECURITY AGREEMENT RECORDED AT REEL 059569 / FRAME 0840 Recorded Sep 7, 2023
From: FORTRESS CREDIT CORP.,
To: NANOSYS, INC.
Reel/Frame 064836/0263 →
SECURITY INTEREST Recorded Apr 1, 2022
From: NANOSYS, INC.
To: FORTRESS CREDIT CORP., AS AGENT
Reel/Frame 059569/0840 →
NUNC PRO TUNC ASSIGNMENT Recorded Aug 13, 2021
From: GLO AB
To: NANOSYS, INC.
Reel/Frame 057184/0564 →
RELEASE OF SECURITY INTEREST Recorded Apr 12, 2021
From: HERCULES CAPITAL, INC.
To: GLO AB
Reel/Frame 057210/0690 →
SECURITY INTEREST Recorded Jan 23, 2019
From: GLO AB
To: HERCULES CAPITAL INC.
Reel/Frame 048110/0063 →
ASSIGNMENT OF IP SECURITY AGREEMENT Recorded Dec 12, 2018
From: GLO AB
To: HERCULES CAPITAL, INC., AS ADMINISTRATIVE AGENT
Reel/Frame 049042/0527 →