IP Library Granted Patent US 9,658,294
Granted Patent B2
US 9,658,294 · App. 13/289,671 · Granted May 23, 2017

Testing a switched mode supply with waveform generator and capture channel

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,658,294
App. No.
13/289,671
Granted
May 23, 2017
Kind
B2
Abstract

A test method and system are provided for testing a switched mode power supply in open loop on an automated test equipment device by applying a low frequency waveform signal ( 209 ) to a compensator filter ( 225 ) and simultaneously capturing and processing the input ( 223 ) and output ( 222 ) to the compensator filter ( 225 ) to determine the phase difference therebetween.

Claims (31)

1. A method for testing a compensator filter in a controller for a power supply comprising:

applying a waveform signal to generate a filter input signal at an input of the compensator filter of the controller for the power supply;

capturing the filter input signal at the input of the compensator filter and simultaneously capturing a filter output signal from the compensator filter; and

computing a phase change value between the filter input and output signals for the compensator filter by extracting frequency response values from the simultaneously captured filter input and output signals.

2. The method of claim 1 , where applying the waveform signal comprises applying a low frequency test signal to a coupling capacitor that is operably coupled across a switching transistor to the input of the compensator filter.

3. The method of claim 1 , where capturing the filter input signal comprises using an analog capture unit to capture the waveform signal that is applied to generate the filter input signal.

4. The method of claim 3 , where the analog capture unit comprises a low resolution analog-to-digital converter for capturing the waveform signal.

5. The method of claim 1 , where capturing the filter output signal comprises digitally capturing the filter output signal with a comparator circuit.

6. The method of claim 1 , where the controller comprises a voltage controller for a DC/DC converter.

7. The method of claim 1 , where the power supply comprises a switched mode power supply comprising a digital controller and buck converter circuit for receiving an input voltage and generating an output voltage that is fed back through the digital controller to the compensator filter.

8. The method of claim 1 , where computing the phase change value comprises extracting amplitude and phase response values from the simultaneously captured filter input signal and filter output signal.

9. The method of claim 1 , where computing the phase change value comprises extracting phase response values from the simultaneously captured filter input signal and filter output signal and computing a phase difference between the phase response values.

10. The method of claim 1 , where applying the waveform signal to generate the filter input signal comprises superimposing the waveform signal on a predetermined DC voltage that is applied to a Vdd supply pin to generate the filter input signal.

11. The method of claim 1 , where the compensator filter introduces a phase shift and/or a gain to the filter input signal to compensate for an error signal being supplied to the compensator filter.

12. The method of claim 1 , where the compensator filter is tested structurally in an open loop on automated test equipment.

13. A system for testing a switched mode power supply (SMPS), comprising:

a waveform signal generator coupled to provide a periodic waveform signal on a Vdd supply pin of the switched mode power supply;

a digital capture unit coupled to capture a test output of a compensator filter in the switched mode power supply;

an analog capture unit coupled to capture a test input of the compensator filter in the switched mode power supply; and

a test capture unit for controlling the digital capture unit and analog capture unit to simultaneously capture and process the test output and test input of the compensator filter to compute a phase difference value between the test input and test output for the compensator filter.

14. The system of claim 13 , further comprising a switched coupling capacitor connected between the waveform signal generator and the Vdd supply pin in response to a first connection signal generated by the test capture unit.

15. The system of claim 13 , where the analog capture unit comprises a low resolution analog-to-digital converter for capturing the periodic waveform signal.

16. The system of claim 13 , where the switched mode power supply comprises a buck converter circuit for receiving an input voltage and generating an output voltage that is fed back to the compensator filter.

17. The system of claim 13 , where the test capture unit comprises a fast Fourier transform (FFT) module for processing the test input by performing an FFT on the test input to extract magnitude and phase information for the test input of the compensator filter.

18. The system of claim 13 , where the test capture unit comprises a fast Fourier transform (FFT) module for processing the test output by performing an FFT on the test output to extract magnitude and phase information for the test output of the compensator filter.

19. The system of claim 13 , where the test capture unit computes the phase difference value by extracting amplitude and phase response values from the simultaneously captured test output and test input of the compensator filter.

20. A test load board apparatus for testing a compensator filter in a digital controller for a power supply comprising:

a waveform generator for generating a waveform signal that is AC-coupled to apply a test input signal to an input of the compensator filter;

an analog capture module for capturing the test input signal in response to a first capture signal;

a digital capture module for simultaneously capturing a test output signal at an output of the compensator filter in response to a second capture signal; and

test module for controlling the first and second capture signals to simultaneously capture the test input and test output signals and compute a phase change value between the test input and test output signals by performing a fast Fourier transform on the test input and test output signals to extract magnitude and phase information for the test input and test output signals for the compensator filter.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0439 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0447 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0379 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 7, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027821/0662 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 7, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027821/0967 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 7, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027821/0982 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2011
From: PIETRI, STEFANO; DAO, CHRIS C.; FELBER, GARRIN S.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 027178/0901 →