IP Library Granted Patent US 9,156,785
Granted Patent B2
US 9,156,785 · App. 13/296,949 · Granted Oct 13, 2015

Base reactive photoacid generators and photoresists comprising same

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Quick Facts
Patent No.
US 9,156,785
App. No.
13/296,949
Granted
Oct 13, 2015
Kind
B2
Abstract

This invention relates to new photoacid generator compounds and photoresist compositions that comprise such compounds. In particular, the invention relates to photoacid generator compounds that comprise base-cleavable groups.

Claims (13)

1. A photoacid generator compound of formula (I)

R 5 M + R 6 R 7 r − O 3 S—R 1 p —X y —(R 2 Z w R 3 ) x   (I)

wherein each R 1 is chosen from (C 1 -C 10 )alkyl, heteroatom-containing (C 1 -C 10 )alkyl, fluoro(C 1 -C 10 )alkyl, heteroatom-containing fluoro (C 1 -C 10 )alkyl, (C 6 -C 10 )aryl, and fluoro(C 6 -C 10 )aryl; each R 2 is a chemical bond or a (C 1 -C 30 )hydrocarbyl group; each R 3 is H or a (C 1 -C 30 )hydrocarbyl group; R 5 , R 6 and R 7 independently are chosen from an optionally substituted carbocylic aryl group, an allyl group, and an optionally substituted (C 1 -C 20 )alkyl group; X is a chemical bond or a divalent linking group; Z is chosen from an acetoacetoxy ester, —C(O)—O—C(O)—R 1 —, —C(CF 3 ) 2 —, —COO—R f —, —SO 3 —R f —, —OCH 3-z (CH 2 OC(═O)—R f —) z , and a (C 5 -C 30 )cyclohydrocarbyl group comprising a base-reactive group chosen from fluoroalkyl esters, fluorosulfonate esters, and —C(CF 3 ) 2 O—; each R f is independently a fluoro(C 1 -C 10 )alkyl; p=0-6; w=1-3; x=1-4; y=0-5; z=1-2; r=0-1; M is S or I; wherein when M=I, r=0, and when M=S, r=1.

2. The photoacid generator compound of claim 1 wherein X is chosen from —C(O)O—, —C(O)S—, —SO 3 —, —S(O)—, —SO 2 —,

and combination thereof.

3. A photoresist composition comprising a photoacid generator compound of claim 1 .

4. A method for forming a photoresist relief image on a substrate comprising: (a) applying a coating layer of a photoresist composition of claim 3 on a substrate; and (b) exposing the photoresist coating layer to patterned activating radiation and developing the exposed photoresist layer to provide a relief image.

5. The method of claim 4 further comprising developing the exposed photoresist layer with aqueous alkaline developer whereby the one or more base-reactive groups undergo a bond-breaking reaction to provide one or more polar groups.

6. The photoacid generator compound of claim 1 wherein R 1 is (CR a 2 ) n , wherein each R a is chosen from H, F, (C 1 -C 10 )alkyl and fluoro(C 1 -C 10 )alkyl; and n=0-6.

7. The photoacid generator compound of claim 1 wherein R 3 is chosen from H, (C 1 -C 30 )alkyl, fluoro(C 1 -C 30 )alkyl and (C 6 -C 20 )aryl.

8. The photoacid generator compound of claim 1 wherein X is a divalent linking group of the formula —X 2 t1 —(Y 2 ═X 3 )X 3 t2 —, wherein X 2 ═O, S, or NR; Y 2 ═C, S, or S═O, X 3 ═O or S; t1=0 or 1; and t2=0 or 1.

9. The photoacid generator compound of claim 1 wherein the photoacid generator of formula (I) has a structure

10. The photoacid generator compound of claim 1 wherein Z is —C(CF 3 ) 2 O— or a (C 5 -C 30 )cyclohydrocarbyl group comprising —C(CF 3 ) 2 O—; and R 3 is H.

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS LLC
To: DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC
Reel/Frame 069272/0383 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2015
From: AQAD, EMAD; LI, MINGQI; XU, CHENG-BAI; WANG, DEYAN; LIU, CONG; OH, JOON SEOK; YAMADA, SHINTARO
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 036467/0807 →