IP Library Granted Patent US 8,536,697
Granted Patent B2
US 8,536,697 · App. 13/307,622 · Granted Sep 17, 2013

Packaged die for heat dissipation and method therefor

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Quick Facts
Patent No.
US 8,536,697
App. No.
13/307,622
Granted
Sep 17, 2013
Kind
B2
Abstract

A heat spreader die holder that covers at least 50% of both major sides of a semiconductor die. The heat spreader die holder includes at least one opening. The heat spreader die holder is attached to a substrate. Electrically conductive structures of the die are electrically coupled to electrically conductive structures of the substrate.

Claims (33)

1. A semiconductor die assembly, comprising:

a semiconductor die;

a heat spreader die holder for receiving the semiconductor die through an opening having a greater width and thickness than the semiconductor die;

wherein:

the semiconductor die is at least partially within the heat spreader die holder;

at least 50% of a first major side of the semiconductor die and at least 50% of a second major side of the die are covered by thermally conductive material of the heat spreader die holder;

the semiconductor die includes an open region having a plurality of electrically conductive connector structures;

the open region of the semiconductor die is not covered by the thermally conductive material; and

a substrate, the heat spreader die holder attached to the substrate, the substrate including a plurality of electrically conductive structures electrically coupled to the plurality of electrically conductive connector structures at the open region, wherein the first major side and the second major side of the semiconductor die are parallel to a major side of the substrate.

2. The semiconductor die assembly of claim 1 further comprising:

a plurality of solder balls, wherein the plurality of electrically conductive connector structures are electrically coupled to the plurality of electrically conductive structures of the substrate with the plurality of solder balls.

3. The semiconductor die assembly of claim 2 wherein the plurality of electrically conductive connector structures are located on the first major side of the semiconductor die, the first major side of the semiconductor die facing the major side of the substrate, the plurality of solder balls are located between the first major side of the semiconductor die and the first major side of the substrate.

4. The semiconductor die assembly of claim 3 wherein the heat spreader die holder includes a major side structure of a thermally conductive material, the major side structure is located between the first major side of the semiconductor die and the first major side of the substrate at a location adjacent to the plurality of solder balls.

5. The semiconductor die assembly of claim 1 further comprising:

a plurality of bond wires, wherein the plurality of electrically conductive connector structures are electrically coupled to the plurality of electrically conductive structures of the substrate with the plurality of bond wires.

6. The semiconductor die assembly of claim 1 wherein the plurality of electrically conductive connector structures are located on the first major side of the semiconductor die, the first major side of the semiconductor die faces away from the major side of the substrate.

7. The semiconductor die assembly of claim 1 further comprising:

thermal interface material located between the semiconductor die and the heat spreader die holder.

8. The semiconductor die assembly of claim 1 wherein the heat spreader die holder includes a major side structure generally parallel to the first major side and the second major side, wherein the major side structure includes an opening at an edge location, the plurality of electrically conductive connector structures are electrically coupled to the plurality of electrically conductive structures of the substrate through the opening.

9. The semiconductor die assembly of claim 1 wherein the heat spreader die holder is characterized as a unitary structure of thermally conductive material.

10. A semiconductor die assembly comprising:

a semiconductor die;

a heat spreader die holder for receiving the semiconductor die through an opening having a greater width and thickness than the semiconductor die;

wherein:

the semiconductor die is at least partially within the heat spreader die holder;

at least 50% of a first major side of the die, at least 50% of a second major side of the die, at least 50% of a first minor side of the semiconductor die, and at least 50% of a second minor side of the semiconductor die are covered by thermally conductive material of the heat spreader die holder;

the semiconductor die includes a plurality of electrically conductive connector structures in an open region of the semiconductor die not covered by the thermally conductive material; and

a substrate, the heat spreader die holder attached to the substrate, the substrate including a plurality of electrically conductive structures electrically coupled to the plurality of electrically conductive connector structures at the open region.

11. A semiconductor die assembly, comprising:

a heat spreader die holder;

a semiconductor die at least partially within the heat spreader die holder, wherein at least 50% of a first major side of the semiconductor die and at least 50% of a second major side of the die are covered by thermally conductive material of the heat spreader die holder; wherein the semiconductor die includes plurality of electrically conductive connector structures; and

a substrate, the heat spreader die holder attached to the substrate, the substrate including a plurality of electrically conductive structures electrically coupled to the plurality of electrically conductive connector structures, wherein the first major side and the second major side of the semiconductor die are parallel to a major side of the substrate;

wherein the heat spreader die holder includes a major side structure generally parallel to the first major side and the second major side, wherein the major side structure includes an opening at an edge location, the plurality of electrically conductive connector structures are electrically coupled to the plurality of electrically conductive structures of the substrate through the opening.

Assignments (20)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0439 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0379 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0447 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 7, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027821/0967 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 7, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027821/0982 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Mar 7, 2012
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 027821/0662 →