IP Library Granted Patent US 10,365,562
Granted Patent B2
US 10,365,562 · App. 13/340,989 · Granted Jul 30, 2019

Coating compositions for use with an overcoated photoresist

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,365,562
App. No.
13/340,989
Granted
Jul 30, 2019
Kind
B2
Abstract

Organic coating compositions, particularly antireflective coating compositions, are provided that comprise that comprise a component that comprises one or more uracil moieties. Preferred compositions of the invention are useful to reduce reflection of exposing radiation from a substrate back into an overcoated photoresist layer and/or function as a planarizing, conformal or via-fill layer.

Claims (36)

1. A coated substrate comprising:

(a) a layer of a coating composition on a substrate, the coating composition comprising a polyester resin that comprises one or more uracil moieties,

wherein the composition coating layer further comprises phenyl or anthacene groups, or where the uracil moieties are halogen-substituted; and

(b) a photoresist layer over the coating composition layer.

2. The substrate of claim 1 wherein the resin further comprises one or more cyanurate groups.

3. The substrate of claim 1 wherein the coating composition further comprises phenyl or anthracene groups.

4. A method of forming a photoresist relief image, comprising:

(a) applying a coating composition on a substrate, the coating composition comprising a polyester resin that comprises one or more uracil moieties,

wherein the coating composition further comprises phenyl or anthacene groups, or where the uracil moieties are halogen-substituted;

(b) applying a photoresist composition above the coating composition layer; and

(c) exposing and developing the photoresist layer to provide a resist relief image.

5. The method of claim 4 wherein the coating composition further comprises a component that comprises phenyl or anthracene groups.

6. The method of claim 4 wherein the photoresist is exposed with 193 nm radiation.

7. The method of claim 4 wherein the applied coating composition is crosslinked prior to applying the photoresist composition.

8. An antireflective composition for use with an overcoated photoresist composition, the antireflective composition comprising a polyester resin that comprises one or more uracil moieties,

wherein the antireflective composition further comprises phenyl or anthacene groups, or where the uracil moieties are halogen-substituted.

9. The antireflective composition of claim 8 wherein the resin comprises phenyl groups.

10. The antireflective composition of claim 8 wherein the composition further comprises a crosslinker component.

11. The substrate of claim 1 wherein the uracil moieties correspond to the following Formula (I):

wherein R is a hydrogen or non-hydrogen substituent; and

each R1 is the same or different any may be hydrogen, a chemical bond or a non-hydrogen substituent.

12. The method of claim 4 wherein the uracil moieties correspond to the following Formula (I):

wherein R is a hydrogen or non-hydrogen substituent; and

each R1 is the same or different any may be hydrogen, a chemical bond or a non-hydrogen substituent.

13. The composition of claim 8 wherein the uracil linkages correspond to the following Formula (I):

wherein R is a hydrogen or non-hydrogen substituent; and

each R1 is the same or different any may be hydrogen, a chemical bond or a non-hydrogen substituent.

14. The substrate of claim 1 wherein the uracil moieties are fluoro-substituted.

15. The method of claim 4 wherein the uracil moieties are fluoro-substituted.

16. The composition of claim 8 wherein the uracil moieties are fluoro-substituted.

17. The substrate of claim 11 wherein R is fluoro or nitro.

18. The method of claim 12 wherein R is fluoro or nitro.

19. The composition of claim 13 wherein R is fluoro or nitro.

20. The substrate of claim 1 wherein the uracil moieties are halogen-substituted.

21. The method of claim 4 wherein the uracil moieties are halogen-substituted.

22. The composition of claim 8 wherein the uracil moieties are halogen-substituted.

Assignments (4)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS LLC
To: DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC
Reel/Frame 069272/0383 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2016
From: ONGAYI, OWENDI, MR.; JAIN, VIPUL, MR.; COLEY, SUZANNE, MS.; ZAMPINI, ANTHONY, MR.
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 040196/0400 →