Degree-of-focus determination module, position-of-best-focus selection modules, image processing module, imaging system, and corresponding method
View Patent ↗A system for imaging a structure of an object is provided. The imaging system includes a degree-of-focus determination module that may comprise logic for taking into account at least one of a first and a second dimension of a topological element of the structure to be imaged. An image processing module of the system may comprise: a control module for controlling a motorized focus driver; a memory for storing images; and said degree-of-focus determination module. The imaging system may comprise: a stage; a motorized focus driver for driving the stage; at least one of microscope optics, a lens, an illumination system; a camera; and an image processing module.
1. An imaging system, configured to image a structure of an object, the object comprising a plurality of buses or vias or contacts, wherein the buses respectively have at least one prevailing orientation OX, the imaging system comprising:
a stage upon which the object having the structure comprising a plurality of topological elements is to be mounted;
a motorized focus driver for driving the stage;
optics, wherein the imaging system is for:
positioning the object such that the prevailing orientation OX is perpendicular to a scanning direction OY; and
producing an image stack comprising a set of images, each image made with a different coordinate along an optical axis; and
an image processing module configured to process a set of electronic images, the image processing module comprising
a degree-of-focus determination module for taking into account at least one of a first and a second dimension of a topological element of the structure to be imaged, the degree-of-focus determination module for controlling the motorized focus driver, wherein the image processing module filters the images of the set of images using a filter matrix, the filter matrix calculated using dimensions of topological elements of the structure, wherein the structure comprises a plurality of topological elements; and
wherein the degree-of-focus determination module further performs the steps of:
determining a position of best focus along the optical axis;
determining a position of focus to guarantee focused images of the buses or vias;
if the position of best focus lies below or at the position of focus to guarantee focused images, selecting the position of best focus as a focus position; and
if the position of best focus lies above the position of focus to guarantee focused images, selecting the position of focus to guarantee focused images as the focus position.
2. The imaging system of claim 1 wherein the degree-of-focus determination module comprises a filter having a first filter parameter adapted to the first dimension of the topological element of the structure to be imaged.
3. The imaging system of claim 2 wherein the filter has a second filter parameter adapted to the second dimension of the topological element of the structure to be imaged and wherein the filter is represented by a two-dimensional array, wherein a dimension of the filter is based upon a minimum value of the first dimension and the second dimension of the topological element.
4. The imaging system of claim 3 wherein a first direction of the first dimension and a second direction of the second dimension are substantially perpendicular to each other.
5. The imaging system of claim 1 wherein the image processing module further comprises:
a position-of-best-focus selection module for selecting a position of position of best focus by taking into account a degree-of-focus histogram H z determined by the degree-of-focus determination module, wherein H z is a number of pixels with highest degree-of-focus at a distance z along an optical axis of the optics.
6. The imaging system of claim 1 wherein the image processing module further comprises:
a position-of-best-focus selection module for selecting a position of best focus by taking into account a third dimension of the topological element of the structure to be imaged.
7. The imaging system of claim 6 , wherein the third dimension of the topological element is one of a thickness of a layer, a thickness of an interlayer, and a sum of both thicknesses, wherein the structure comprises a plurality of layers.
8. The imaging system of claim 1 wherein the image processing module further comprises:
a camera; and
a memory for storing images.
9. The imaging system of claim 1 , wherein the illumination system is capable to illuminate the object surface in bright field or in dark field.
10. The imaging system of claim 1 , wherein the illumination system is capable to illuminate the object surface for observation of the object in transmitted light or in reflected light.
11. The imaging system of claim 1 , wherein the illumination system is capable to illuminate the object surface for observation of the fluorescence of the object.
12. The imaging system of claim 1 wherein the object comprises a die.
13. The imaging system of claim 12 wherein:
the die comprises a plurality of layers; and
the topological element lies within one of the plurality of layers.
14. A method for determining a degree-of-focus for imaging a structure of an object, wherein the structure comprises a plurality of buses or vias or contacts, wherein the buses respectively have at least one prevailing orientation OX, the method comprising:
positioning the object such that the prevailing orientation OX is perpendicular to a scanning direction OY;
producing an image stack comprising a set of images, each image made with a different among along an optical axis;
filtering the images of the set of images using a filter matrix, the filter matrix calculated using dimensions of topological elements of the structure, wherein the structure comprises a plurality of topological elements;
determining a position of best focus along the optical axis;
determining a geometric center of the image stack;
if the position of best focus lies above the geometric center, selecting the position of best focus as a focus position; and
if the position of best focus lies below the geometric center, selecting a position above the geometric center as the focus position.
15. The method of claim 14 further comprising composing an image with focus extension comprising:
for each two dimensional pixel position x, y, selecting a value z along the optical axis such that a pixel S x,y,z has a best focus; and
assembling the selected pixels S x,y,z into an image.
16. A non-transitory computer-readable storage medium storing instructions executable by a processor, wherein the instructions when executed by the processor determine a degree-of-focus for imaging a structure of an object, wherein the structure comprises a plurality of buses or vias or contacts, wherein the buses respectively have at least one prevailing orientation OX, the instructions comprising:
instructions to position the obiect such that the prevailing orientation OX is perpendicular to a scanning direction OY;
instructions to produce an image stack comprising a set of images, each image made with a different coordinate along an optical axis;
instructions to filter the images of the set of images using a filter matrix, the filter matrix calculated using dimensions of topological elements of the structure, wherein the structure comprises a plurality of topological elements;
instructions to determine a position of best focus along the optical axis;
instructions to determine a geometric center of the image stack;
instructions to select the position of best focus as a focus position if the position of best focus lies above the geometric center; and
instructions to select a position above the geometric center as the focus position if the position of best focus lies below the geometric center.
17. The computer-readable storage medium of claim 16 , wherein the instructions further take into account a third dimension of the topological element of the structure to be imaged.
18. The computer-readable storage medium of claim 17 , wherein the third dimension of the topological element is one of a thickness of a layer, a thickness of an interlayer, and a sum of the layer and the interlayer.