IP Library Granted Patent US 8,828,505
Granted Patent B2
US 8,828,505 · App. 13/405,453 · Granted Sep 9, 2014

Plasma enhanced cyclic chemical vapor deposition of silicon-containing films

Inventors: Hareesh Thridandam (Carlsbad, CA); Manchao Xiao (San Diego, CA); Xinjian Lei (Vista, CA); Thomas Richard Gaffney (Carlsbad, CA); Eugene Joseph Karwacki, Jr. (Orefield, PA)
Assignee: Air Products and Chemicals, Inc.
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Quick Facts
Patent No.
US 8,828,505
App. No.
13/405,453
Granted
Sep 9, 2014
Kind
B2
Abstract

The present invention is a process of plasma enhanced cyclic chemical vapor deposition of silicon nitride, silicon carbonitride, silicon oxynitride, silicon carboxynitride, and carbon doped silicon oxide from alkylaminosilanes having Si—H 3 , preferably of the formula (R 1 R 2 N)SiH 3 wherein R 1 and R 2 are selected independently from C 2 to C 10 and a nitrogen or oxygen source, preferably ammonia or oxygen has been developed to provide films with improved properties such as etching rate, hydrogen concentrations, and stress as compared to films from thermal chemical vapor deposition.

Claims (10)

1. A process to deposit silicon oxynitride, silicon carboxynitride, and carbon doped silicon oxide on a semi-conductor substrate comprising:

a. contacting a heated substrate with an oxygen-containing plasma comprising oxygen-containing radicals to absorb at least a portion of the oxygen-containing radicals on the heated substrate, wherein the oxygen-containing plasma was generated at a location remote relative to the substrate;

b. purging away any unabsorbed oxygen-containing radicals;

c. contacting the heated substrate with a silicon-containing source having one or more Si—H 3 fragments to react with the absorbed oxygen-containing radicals, wherein the silicon-containing source is selected from the group consisting of di-iso-propylaminosilane (DIPAS), di-tert-butylaminosilane (DTBAS), di-sec-butylaminosilane, di-tert-pentylamino silane and mixtures thereof; and

d. purging away any unreacted silicon-containing source.

2. The process of claim 1 wherein the process is repeated until a desired thickness of film is established.

3. The process of claim 1 wherein the process is an atomic layer deposition.

4. The process of claim 1 wherein the process is a plasma enhanced cyclic chemical vapor deposition.

5. The process of claim 1 wherein the substrate temperature is in the range of 200 to 600° C.

6. The process of claim 1 wherein the oxygen-containing radicals are generated by subjecting an oxygen-containing gas to plasma energy, wherein the oxygen-containing gas is selected from the group consisting of oxygen, nitrous oxide, ozone, and mixture thereof.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Oct 7, 2019
From: CITIBANK, N.A., AS AGENT
To: VERSUM MATERIALS US, LLC
Reel/Frame 050647/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2017
From: AIR PRODUCTS AND CHEMICALS, INC.
To: VERSUM MATERIALS US, LLC
Reel/Frame 041772/0733 →
PATENT SECURITY AGREEMENT Recorded Oct 27, 2016
From: VERSUM MATERIALS US, LLC
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 040503/0442 →
Continuity (2)
Division 12030186 · Feb 12, 2008
Related Publication 20120171874A1 · Jul 5, 2012