Circuit and method for measuring voltage
View Patent ↗A testing circuit in an integrated circuit indirectly measures a voltage at a node of other circuitry in the integrated circuit. The testing circuit includes a transistor having a control electrode, a first conducting electrode coupled to a first pad, a second conducting electrode coupled to a terminal of a power supply, and one or more switches for selectively coupling the control electrode to one of the node and a second pad. A method includes determining a relationship between drain current and gate voltage of the transistor when the control electrode is coupled to the second pad. A voltage at the node is determined by relating the current through the first conducting electrode of the transistor when control electrode is coupled to the node.
1. An integrated circuit, comprising:
a circuit-supporting substrate;
circuitry under test including a nod, disposed on the circuit supporting substrate;
a first test pad, disposed on the circuit supporting substrate;
a second test pad, disposed on the circuit supporting substrate; and
a testing circuit for determining a voltage at the node, the testing circuit disposed on the circuit supporting substrate, the testing circuit including:
a transconductance converter device having a control electrode, a first conducting electrode coupleable to the first test pad, and a second conducting electrode coupleable to a terminal of a power supply, and
one or more switches for selectively coupling the control electrode to one of the node and the second test pad,
wherein, during a test mode of the integrated circuit, a voltage at the node is related to a current through the first conducting electrode of the transconductance converter device when the control electrode is coupled to the node, when the first conducting electrode is coupled to the first test pad and when a second conducting electrode is coupled to the terminal of a power supply.
2. The integrated circuit of claim 1 , wherein the transconductance converter device is a MOSFET.
3. The integrated circuit of claim 2 , wherein the first test pad is coupled to a terminal of a power supply to bias the MOSFET such that it operates in a saturation region during the test mode.
4. The integrated circuit of claim 1 , wherein the circuitry under test comprises a charge pump having an output terminal coupled to a load, wherein, during operation of the charge pump, an output voltage at the output terminal of the charge pump is higher than an input voltage of the charge pump, and wherein the node is the output terminal of the charge pump.
5. The integrated circuit of claim 4 , wherein the testing circuit includes diodes coupled to the first test pad and to the second test pad, and wherein a maximum voltage that appears on the first test pad and on the second test pad without one of the diodes conducting is a lower voltage than the output voltage of the charge pump.
6. The integrated circuit of claim 4 , wherein the charge pump is a low output current capacity charge pump.
7. The integrated circuit of claim 6 , wherein the output current capacity of the low output current capacity charge pump is less than 10 μA.
8. The integrated circuit of claim 1 , wherein the first test pad and the second test pad are low-voltage test pads.
9. The integrated circuit of claim 1 , wherein the integrated circuit is coupled to a power supply having a voltage, wherein the testing circuit includes diodes coupled to the first test pad and to the second test pad, and wherein a maximum voltage that can appear on the first test pad and on the second test pad without one of the diodes conducting is approximately the voltage of the power supply.
10. A method with a MOSFET disposed in an integrated circuit for determining a voltage at a node of other circuitry within the integrated circuit, comprising:
biasing the MOSFET such that it operates in a saturation region;
applying a first voltage V FIRST to a control electrode of the MOSFET, and measuring a resulting first current I 1 through a conducting electrode of the MOSFET;
applying a second voltage V SECOND to the control electrode of the MOSFET, and measuring a resulting second current I 2 through the conducting electrode of the MOSFET;
coupling the node of the other circuitry to the control electrode of the MOSFET, and measuring a resulting third current I 3 through the conducting electrode of the MOSFET; and
determining the voltage at the node of the other circuitry from V FIRST , V SECOND , I 1 and I 2 .
11. The method of claim 10 , wherein the step of determining includes calculating
V
THIRD
=
V
FIRST
(
I
3
-
I
2
)
+
V
SECOND
(
I
1
-
I
3
)
I
1
-
I
2
,
where V THIRD has a same value as the voltage at the node of the other circuitry.
12. The method of claim 10 , wherein, prior to the step of biasing, a first conducting electrode of the MOSFET is coupled to a first test pad, and a second conducting electrode of the MOSFET is coupled to a terminal at ground potential, and wherein a bias voltage of the MOSFET is applied to the first test pad.
13. The method of claim 12 , wherein the bias voltage that is applied to the first test pad is from a first voltage source external to the integrated circuit.
14. The method of claim 13 , wherein the currents I 1 , I 2 and I 3 are measured by a current meter external to the integrated circuit and coupled to the first test pad.
15. The method of claim 10 , wherein the control electrode of the MOSFET is selectively coupled to one of: the node of the other circuitry, and a second test pad.
16. The method of claim 15 , wherein, prior to the step of applying, the control electrode of the MOSFET is coupled to the second test pad, and the step of applying includes applying one or more voltages to the second test pad while the control electrode of the MOSFET is coupled to the second test pad.
17. The method of claim 16 , wherein the one or more voltages are applied to the second test pad from a second voltage source external to the integrated circuit.
18. An integrated circuit, comprising:
a circuit-supporting substrate;
a charge pump for outputting an output voltage at an output terminal thereof, disposed on the circuit supporting substrate;
a load, coupled to the output terminal of the charge pump, disposed on the circuit supporting substrate;
a first test pad, disposed on the circuit supporting substrate;
a second test pad, disposed on the circuit supporting substrate; and
a testing circuit selectively coupled to the output terminal of the charge pump only during a test mode of the integrated circuit, the testing circuit for determining the output voltage of the charge pump, the testing circuit disposed on the circuit supporting substrate, the testing circuit including:
a MOSFET having a gate terminal, a first conducting electrode coupled to the first test pad, and a second conducting electrode coupled to a terminal of a power supply, and
one or more switches for selectively coupling the gate terminal of the MOSFET to one of the output terminal and the second test pad,
wherein, during the test mode, a voltage at the output terminal of the charge pump is related to a current through the first conducting electrode of the MOSFET when the gate terminal of the MOSFET is coupled to the output terminal.
19. The integrated circuit of claim 18 , wherein the MOSFET has a channel length that is much greater than a channel width.
20. The integrated circuit of claim 18 , wherein the current through the first conducting electrode of the MOSFET is less than 100 μA.