Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope
View Patent ↗An interface, a scanning electron microscope and a method for observing an object that is positioned in a non-vacuum environment. The method includes: passing at least one electron beam that is generated in a vacuum environment through at least one aperture out of an aperture array and through at least one ultra thin membrane that seals the at least one aperture; wherein the at least one electron beam is directed towards the object; wherein the at least one ultra thin membrane withstands a pressure difference between the vacuum environment and the non-vacuum environment; and detecting particles generated in response to an interaction between the at least one electron beam and the object.
1. A method for observing an object that is positioned in a non-vacuum environment, the method comprising:
directing at least one electron beam generated in a vacuum environment through at least one aperture of an aperture array sealed by at least one ultra thin membrane towards the object which is positioned in the non-vacuum environment, the at least one ultra thin membrane separating the vacuum environment from the non-vacuum environment;
introducing a gas mixture into the non-vacuum environment whereby the mean free path of electrons therethrough is enhanced relative to air at atmospheric pressure; and
detecting, using a detector placed directly below the object, particles generated as a result of an interaction between the at least one electron beam and the object wherein the enhanced mean free path of electrons due to the presence of the gas mixture provides enhanced signal to noise ratio.
2. The method according to claim 1 and wherein the gas mixture comprises nitrogen.
3. The method according to claim 1 and wherein the gas mixture comprises a He enriched mixture.
4. The method according to claim 1 and also comprising:
scanning at least one area of the object by:
deflecting the at least one electron beam to pass through the at least one aperture; and
introducing a corresponding mechanical movement of the at least one aperture.
5. A scanning electron microscope assembly for observing an object comprising:
a scanning electron beam source, located in a vacuum environment, adapted to generate at least one electron beam;
an interface between the vacuum environment and a non-vacuum environment in which the object is positioned, the interface comprising an aperture array sealed by at least one ultra thin membrane that is substantially transparent to electrons and withstands a pressure difference between the vacuum environment and the non-vacuum environment;
electron optics adapted to direct the at least one electron beam through at least one aperture of the aperture array and towards the object located in the non-vacuum environment;
a gas introducer adapted to introduce a gas mixture into the non-vacuum environment whereby the mean free path of electrons therethrough is enhanced relative to air at atmospheric pressure; and
a detector placed directly below the object that detects particles generated as a result of an interaction between the at least one electron beam and the object wherein the enhanced mean free path of electrons due to the presence of the gas mixture provides enhanced signal to noise ratio.
6. The scanning electron microscope according to claim 5 and wherein the gas mixture comprises nitrogen.
7. The scanning electron microscope according to claim 5 and wherein the gas mixture comprises a He enriched mixture.