IP Library Granted Patent US 8,906,747
Granted Patent B2
US 8,906,747 · App. 13/478,557 · Granted Dec 9, 2014

Cavity-type semiconductor package and method of packaging same

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Quick Facts
Patent No.
US 8,906,747
App. No.
13/478,557
Granted
Dec 9, 2014
Kind
B2
Abstract

A method ( 30 ) of forming a semiconductor package ( 20 ) entails applying ( 56 ) an adhesive ( 64 ) to a portion ( 66 ) of a bonding perimeter ( 50 ) of a base ( 22 ), with a section ( 68 ) of the perimeter ( 50 ) being without the adhesive ( 64 ). A lid ( 24 ) is placed on the base ( 22 ) so that a bonding perimeter ( 62 ) of the lid ( 24 ) abuts the bonding perimeter ( 50 ) of the base ( 22 ). The lid ( 24 ) includes a cavity ( 25 ) in which dies ( 38 ) mounted to the base ( 22 ) are located. A gap ( 70 ) is formed without the adhesive ( 64 ) at the section ( 68 ) between the base ( 22 ) and the lid ( 24 ). The structure vents from the gap ( 70 ) as air inside the cavity ( 25 ) expands during heat curing ( 72 ). Following heat curing ( 72 ), another adhesive ( 80 ) is dispensed in the section ( 68 ) to close the gap ( 70 ) and seal the cavity ( 25 ).

Claims (21)

1. A method of attaching a lid to a base to form a cavity-type semiconductor package, said lid being shaped to include a cavity, a semiconductor die being coupled to a surface of said base within an area delineated by a first bonding perimeter of said base, said lid having a second bonding perimeter, and said method comprising:

applying an electrically conductive epoxy adhesive material to a portion of at least one of said first and second bonding perimeters such that a remaining section of both of said first and second bonding perimeters is without said electrically conductive epoxy adhesive material;

placing said lid on said base so that said second bonding perimeter abuts said first bonding perimeter and a gap is produced between said base and said lid at a location where said remaining section is without said electrically conductive epoxy adhesive material;

heat curing said electrically conductive epoxy adhesive material, said heat curing occurring at a first temperature of at least one hundred seventy degrees Celsius, wherein during said heat curing operation, air inside said cavity expands in response to said first temperature and said gap allows venting of said air from said cavity; and

following said heat curing, applying a second adhesive material to said remaining section to close said gap.

2. A method as claimed in claim 1 wherein said method further comprises curing said second adhesive material applied to said remaining section at a second temperature that is less than said first temperature.

3. A method as claimed in claim 2 wherein said second temperature is room temperature.

4. A method as claimed in claim 1 further comprising curing said second adhesive material applied to said remaining section by exposing said second adhesive material to ultraviolet radiation.

5. A method as claimed in claim 1 further comprising curing said second adhesive material applied to said remaining section to hermetically seal said cavity.

6. A method as claimed in claim 1 wherein said applying said second adhesive material occurs following said placing operation.

7. A method as claimed in claim 1 further comprising applying said second adhesive material around an entire outer perimeter of said lid at a junction between said base and said lid.

8. A method as claimed in claim 1 wherein:

said applying said first adhesive material includes producing multiple remaining sections of both of said first and second bonding perimeters that are without said first adhesive material so that multiple gaps are produced following said placing operation; and

said applying said second adhesive material dispenses said second adhesive material to close each of said multiple gaps.

9. A method of attaching a lid to a base to form a cavity-type semiconductor package, said lid being shaped to include a cavity, a semiconductor die being coupled to a surface of said base within an area delineated by a first bonding perimeter of said base, said lid having a second bonding perimeter, and said method comprising:

applying a first adhesive material to a portion of at least one of said first and second bonding perimeters such that a remaining section of both of said first and second bonding perimeters is without said first adhesive material;

placing said lid on said base so that said second bonding perimeter abuts said first bonding perimeter and a gap is produced between said base and said lid at a location where said remaining section is without said first adhesive material;

heat curing said first adhesive material, said heat curing occurring at a first temperature of at least one hundred seventy degrees Celsius, wherein during said heat curing operation, air inside said cavity expands in response to said first temperature and said gap allows venting of said air from said cavity; and

following said placing and heat curing operations, applying a second adhesive material to said remaining section to close said gap.

10. A method as claimed in claim 9 further comprising curing said second adhesive material applied to said remaining section to hermetically seal said cavity, said curing said second adhesive occurring at room temperature.

11. A method as claimed in claim 10 wherein said curing said second adhesive material includes exposing said second adhesive material to ultraviolet radiation.

Assignments (32)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2026
From: NXP USA, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 075219/0798 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0535 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0555 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0575 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030258/0501 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030258/0479 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 030256/0706 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2012
From: HOOPER, STEPHEN R.; BOWLES, PHILIP H.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 028257/0176 →