IP Library Granted Patent US 8,866,300
Granted Patent B1
US 8,866,300 · App. 13/488,991 · Granted Oct 21, 2014

Devices and methods for solder flow control in three-dimensional microstructures

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Quick Facts
Patent No.
US 8,866,300
App. No.
13/488,991
Granted
Oct 21, 2014
Kind
B1
Abstract

Structures, materials, and methods to control the spread of a solder material or other flowable conductive material in electronic and/or electromagnetic devices are provided.

Claims (56)

1. An electronic microstructure, comprising:

a mounting surface having at least a portion thereof configured to bond to one or more of a metallic solder and a conductive epoxy;

a wick stop structure disposed away from the mounting surface at a location on the microstructure proximate the mounting surface, the wick stop structure configured to deter a flow of one or more of the metallic solder and the conductive epoxy from the mounting surface to a location on the microstructure beyond the location of the wick stop structure, wherein the wick stop structure comprises a shelf which extends outwardly away from a surface of the microstructure at which the shelf is located.

2. The electronic microstructure according to claim 1 , wherein the wick stop structure comprises a material which is non-wetting to metallic solder.

3. The electronic microstructure according to claim 1 , wherein the wick stop structure comprises a material which is non-wetting to conductive epoxy.

4. The electronic microstructure according to claim 1 , wherein the wick stop structure comprises a dielectric.

5. The electronic microstructure according to claim 1 , wherein the wick stop structure comprises a non-wetting metal.

6. The electronic microstructure according to claim 5 , wherein the non-wetting metal comprises nickel.

7. The electronic microstructure according to claim 1 , wherein the wick stop structure comprises a metal oxide.

8. The electronic microstructure according to claim 1 , wherein the shelf comprises a portion disposed within the microstructure.

9. The electronic microstructure according to claim 1 , wherein the shelf circumscribes a portion of the microstructure.

10. The electronic microstructure according to claim 1 , wherein the microstructure comprises a three-dimensional structure comprising multiple layers.

11. The electronic microstructure according to claim 10 , wherein the mounting surface is disposed at a first layer of the multiple layers and wherein the shelf is disposed at a second layer of the multiple layers, wherein the second layer is disposed over the first layer.

12. The electronic microstructure according to claim 11 , wherein the first and second layers are disposed in direct contact with one another.

13. The electronic microstructure according to claim 1 , wherein the microstructure comprises a three-dimensional structure formed by a multi-layer build process.

14. The electronic microstructure according to claim 1 , wherein the mounting surface comprises a raised surface to provide a mechanical stop between the mounting surface and a part to be mounted thereto.

15. The electronic microstructure according to claim 14 , wherein the raised surface provides a gap of predefined height between the raised surface and mounting surface.

16. The electronic microstructure according to claim 1 , wherein the metallic solder comprises a solder paste.

17. The electronic microstructure according to claim 1 , comprising a chip flip-chip mounted to the mounting surface.

18. The electronic microstructure according to claim 1 , comprising a surface mount component mounted to the mounting surface.

19. The electronic microstructure according to claim 1 , wherein the shelf has a longitudinal axis which is oriented substantially parallel to the mounting surface.

20. An electronic microstructure, comprising:

a mounting surface having at least a portion thereof configured to bond to one or more of a metallic solder and a conductive epoxy;

a wick stop structure disposed away from the mounting surface at a location on the microstructure proximate the mounting surface, the wick stop structure configured to deter a flow of one or more of the metallic solder and the conductive epoxy from the mounting surface to a location on the microstructure beyond the location of the wick stop structure, wherein the wick stop structure is disposed internal to the microstructure at a surface of the microstructure.

21. The electronic microstructure according to claim 20 , wherein the wick stop structure is recessed within the microstructure.

22. An electronic microstructure, comprising:

a mounting surface having at least a portion thereof configured to bond to one or more of a metallic solder and a conductive epoxy;

a wick stop structure disposed away from the mounting surface at a location on the microstructure proximate the mounting surface, the wick stop structure configured to deter a flow of one or more of the metallic solder and the conductive epoxy from the mounting surface to a location on the microstructure beyond the location of the wick stop structure, wherein the mounting surface comprises mounting feet to provide a G-S-G termination.

23. The electronic microstructure according to claim 22 , wherein the wick stop structure is disposed proximate the mounting feet.

24. An electronic microstructure, comprising:

a mounting surface having at least a portion thereof configured to bond to one or more of a metallic solder and a conductive epoxy;

a wick stop structure disposed away from the mounting surface at a location on the microstructure proximate the mounting surface, the wick stop structure configured to deter a flow of one or more of the metallic solder and the conductive epoxy from the mounting surface to a location on the microstructure beyond the location of the wick stop structure, wherein the microstructure comprises a coaxial microstructure.

25. A method of forming an electronic structure comprising:

(a) depositing a plurality of layers over a substrate, wherein the layers comprise one or more of a metal material, a sacrificial photoresist material, and a dielectric material, thereby forming an electronic structure above the substrate, the structure comprising the microstructure of claim 1 , wherein the wick stop structure comprises a selected one of the plurality of layers; and

(b) removing the microstructure from the substrate to provide a freestanding part.

26. The method according to claim 25 , wherein the wick stop structure comprises a material which is non-wetting to metallic solder.

27. The method according to claim 25 , wherein the wick stop structure comprises a material which is non-wetting to conductive epoxy.

28. The method according to claim 25 , wherein the wick stop structure comprises a dielectric.

29. The method according to claim 25 , wherein the wick stop structure comprises a non-wetting metal.

30. The method according to claim 29 , wherein the non-wetting metal comprises nickel.

31. The method according to claim 25 , wherein the wick stop structure comprises a metal oxide.

32. The method according to claim 25 , wherein the wick stop structure comprises a shelf which extends outwardly away from a surface of the microstructure at which the shelf is located.

33. The method according to claim 32 , wherein the shelf comprises a portion disposed within the microstructure.

34. The method according to claim 32 , wherein the shelf circumscribes a portion of the microstructure.

35. The method according to claim 25 , wherein the wick stop structure circumscribes a portion of the microstructure.

36. The method according to claim 25 , wherein the wick stop structure is disposed internal to the microstructure at a surface of the microstructure.

37. The method according to claim 36 , wherein the wick stop structure is recessed within the microstructure.

38. The method according to claim 25 , wherein the microstructure comprises a three-dimensional structure comprising multiple layers.

39. The method according to claim 25 , wherein the microstructure comprises a three-dimensional structure formed by a multi-layer build process.

40. The method according to claim 25 , wherein the mounting surface comprises a raised surface to provide a mechanical stop between the mounting surface and a part to be mounted thereto.

41. The method according to claim 25 , wherein the mounting surface comprises mounting feet to provide a G-S-G termination.

42. The method according to claim 41 , wherein the wick stop structure is disposed proximate the mounting feet.

43. The method according to claim 25 , wherein the microstructure comprises a coaxial microstructure.

44. The method according to claim 25 , wherein the metallic solder comprises a solder paste.

45. The method according to claim 25 , comprising a chip flip-chip mounted to the mounting surface.

46. The method according to claim 25 , comprising a surface mount component mounted to the mounting surface.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Jul 30, 2025
From: ALTER DOMUS (US) LLC
To: CUBIC CORPORATION; CUBIC DIGITAL SOLUTIONS LLC; NUVOTRONICS, INC.
Reel/Frame 072281/0176 →
RELEASE OF SECURITY INTEREST AT REEL/FRAME 056393/0281 Recorded Jul 28, 2025
From: BARCLAYS BANK PLC, AS ADMINISTRATIVE AGENT
To: CUBIC CORPORATION; CUBIC DEFENSE APPLICATIONS, INC.; CUBIC DIGITAL SOLUTIONS LLC (FORMERLY PIXIA CORP.)
Reel/Frame 072282/0124 →
FIRST LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: BARCLAYS BANK PLC
Reel/Frame 056393/0281 →
SECOND LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: ALTER DOMUS (US) LLC
Reel/Frame 056393/0314 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE INSIDE THE ASSIGNMENT DOCUMENTATION PREVIOUSLY RECORDED AT REEL: 048698 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 10, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048843/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048698/0301 →
CHANGE OF NAME Recorded Oct 13, 2015
From: NUVOTRONICS, LLC
To: NUVOTRONICS, INC.
Reel/Frame 036851/0027 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2012
From: SHERRER, DAVID W.; REID, JR., JAMES R.
To: NUVOTRONICS, LLC.
Reel/Frame 028398/0972 →