IP Library › Granted Patent US 9,184,031
Granted Patent B2
US 9,184,031 · App. 13/550,303 · Granted Nov 10, 2015

Plasma equipment and methods of using the same

Inventors: Hyun Su Jun (Hwaseong-si, KR); YongKyu Kim (Osan-si, KR); DooByeong Park (Osan-si, KR); Bongsun Kim (Hwaseong-si, KR); Dongbock Lee (Suwon-si, KR); Minjae Na (Suwon-si, KR); Dongyoon Lee (Yongin-si, KR); Jaehong Jeong (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01J37/32944H01J37/32972
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Quick Facts
Patent No.
US 9,184,031
App. No.
13/550,303
Granted
Nov 10, 2015
Kind
B2
Abstract

Plasma equipments are provided. The plasma equipment includes a chamber in which a plasma reaction occurs, a detector outputting a spectrum signal in response to light generated from the plasma reaction, and a plasma monitoring module determining whether the spectrum signal includes an arcing signal or a hunting signal. Related methods are also provided.

Claims (13)

1. Plasma equipment comprising:

a chamber in which a plasma reaction occurs;

a detector configured to output a spectrum signal in response to light generated from the plasma reaction; and

a plasma monitoring module configured to determine whether the spectrum signal includes an arcing signal or a hunting signal,

wherein the plasma monitoring module comprises a high pass filter configured to output a high frequency signal in response to the spectrum signal,

wherein the plasma monitoring module further comprises a probability analyzer configured to apply an amplitude variation of the high frequency signal to a probability function to determine whether the high frequency signal includes the arcing signal or the hunting signal.

2. The plasma equipment of claim 1 , wherein the high pass filter is configured to remove a low frequency noise signal from the spectrum signal.

3. The plasma equipment of claim 1 , wherein the probability function comprises a Gaussian distribution function.

4. The plasma equipment of claim 3 , wherein the Gaussian distribution function includes an amplitude and a variance of the high frequency signal as variable parameters.

5. The plasma equipment of claim 4 , wherein the probability analyzer is configured to calculate a normalized probability value of the high frequency signal using the Gaussian distribution function and regards a signal having an amplitude over the normalized probability value as the arcing signal or the hunting signal.

6. The plasma equipment of claim 1 , wherein the plasma monitoring module further comprises:

a gain adjustor configured to amplify the spectrum signal; and

an analog-to-digital converter configured to convert the amplified spectrum signal into a digital signal.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE SECOND ASSIGNEE INADVERTENTLY OMITTED PREVIOUSLY RECORDED ON REEL 028563 FRAME 0406. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT ASSIGNEES ARE: SAMSUNG ELECTRONICS, CO., LTD. AND TOS. Recorded Jul 27, 2012
From: JUN, HYUN SU; KIM, YONGKYU; PARK, DOOBYEONG; KIM, BONGSUN; LEE, DONGBOCK; NA, MINJAE; LEE, DONGYOON; JEONG, JAEHONG
To: SAMSUNG ELECTRONICS, CO., LTD.; TOS
Reel/Frame 028655/0497 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2012
From: JUN, HYUN SU; KIM, YOUGKYU; PARK, DOOBYEONG; KIM, BONGSUN; LEE, DONGBOCK; NA, MINJAE; LEE, DONGYOON; JEONG, JAEHONG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028563/0406 →
Priority Claims (1)
KR 10-2011-0107064 · Oct 19, 2011 · national
Continuity (1)
Related Publication 20130103347A1 · Apr 25, 2013