An object of the invention is to provide a polishing pad which has a polishing layer with a phase-separated structure and can provide high polishing rate and high planarization property and with which scratching can be suppressed. The polishing pad comprises the polishing layer. The polishing layer comprises a product of curing reaction of a polyurethane-forming raw material composition containing: (A) an isocyanate-terminated prepolymer obtained by reaction of a prepolymer-forming raw material composition (a) containing an isocyanate component and a polyester-based polyol; (B) an isocyanate-terminated prepolymer obtained by reaction of a prepolymer-forming raw material composition (b) containing an isocyanate component and a polyether-based polyol; and a chain extender, wherein the product of curing reaction has a phase-separated structure.
1. A polishing pad having a polishing layer,
the polishing layer comprising a product of curing reaction of a polyurethane-forming raw material composition containing: an isocyanate-terminated prepolymer (A) obtained by reaction of a prepolymer-forming raw material composition (a) containing an isocyanate component and a polyester-based polyol; an isocyanate-terminated prepolymer (B) obtained by reaction of a prepolymer-forming raw material composition (b) containing an isocyanate component and a polyether-based polyol; and a chain extender, wherein the product of curing reaction has a phase-separated structure,
wherein an amount of the isocyanate-terminated prepolymer (A) is from 15 to 570 parts by weight based on 100 parts by weight of the isocyanate-terminated prepolymer (B).
2. The polishing pad according to claim 1 , wherein the phase-separated structure has island and sea components, wherein the island component has an average maximum length of 0.5 μm to 100 μm.
3. The polishing pad according to claim 1 , wherein the total content of an oxycarbonyl group constituting the polyester-based polyol is from 8 to 43% by weight based on the total weight of high-molecular weight polyols in the prepolymer-forming raw material compositions (a) and (b).
4. The polishing pad according to claim 1 , wherein the polyester-based polyol is at least one selected from the group consisting of polyethylene adipate glycol, polybutylene adipate glycol, and polyhexamethylene adipate glycol.
5. The polishing pad according to claim 1 , wherein the polyether-based polyol is polytetramethylene ether glycol.
6. A method for manufacturing a semiconductor device, comprising the step of polishing a surface of a semiconductor wafer using the polishing pad according to claim 1 .