Silicon carbide semiconductor device and method for manufacturing same

1. A silicon carbide semiconductor device comprising:

a substrate that is made of silicon carbide having a single-crystal structure of one of hexagonal system and cubic system and that is provided with a main surface having an off angle of 0.5° to 5° relative to a reference plane, said reference plane being a {000-1} plane in the case of the hexagonal system and being a {111} plane in the case of the cubic system; and

a silicon carbide layer epitaxially formed on said main surface of said substrate, said silicon carbide layer being provided with a trench having first and second side walls opposite to each other, each of said first and second side walls including a channel region, each of said first and second side walls substantially including one of a {0-33-8} plane and a {01-1-4} plane in the case of the hexagonal system and substantially including a {100} plane in the case of the cubic system,

wherein an inclination of said first and second side walls with respect to said main surface is controlled by said off angle from said reference plane, and

wherein said substrate has a single-crystal structure of hexagonal system, and surfaces of said first and second side walls comprise a first plane and a second plane, said first plane having substantially a plane orientation of {0-33-8} and said second plane, which is connected to said first plane, having a plane orientation different from that of said first plane are alternately provided.

2. The silicon carbide semiconductor device according to claim 1 , wherein a difference between inclination of said first side wall relative to said main surface and inclination of said second side wall relative to said main surface is 10° or smaller.

3. The silicon carbide semiconductor device according to claim 1 , wherein said second plane has substantially a plane orientation of {0-11-1}.

4. A method for manufacturing a silicon carbide semiconductor device comprising the steps of:

preparing a substrate that is made of silicon carbide having a single-crystal structure of one of hexagonal system and cubic system and that is provided with a main surface having an off angle of 5° or smaller relative to a reference plane, said reference plane being a {000-1} plane in the case of the hexagonal system and being a {111} plane in the case of the cubic system;

epitaxially forming a silicon carbide layer on said main surface of said substrate; and

forming a trench in said silicon carbide layer, said trench having first and second side walls opposite to each other,

the step of forming said trench including the steps of

providing a mask layer having a pattern, on said silicon carbide layer,

partially etching said silicon carbide layer using said mask layer as a mask,

removing said mask layer after said etching,

forming a silicon layer on a surface of said trench, and

forming a reconstitution layer of silicon carbide by heating said silicon carbide layer while forming said silicon layer,

the step of etching including a step of inclining said first and second side walls by heating said silicon carbide layer in a reactive gas containing oxygen and chlorine, each of said first and second side walls substantially including one of a {0-33-8} plane and a {01-1-4} plane in the case of the hexagonal system and substantially including a {100} plane in the case of the cubic system,

wherein an inclination of said first and second side walls with respect to said main surface is controlled by said off angle from said reference plane.

5. The method for manufacturing the silicon carbide semiconductor device according to claim 4 , wherein the step of etching includes the step of supplying said reactive gas to said silicon carbide layer under a condition that a ratio of a flow rate of the oxygen to a flow rate of the chlorine is not less than 0.1 and not more than 2.0.

6. The method for manufacturing the silicon carbide semiconductor device according to claim 4 , wherein the step of etching includes the step of setting a temperature of said silicon carbide layer at not less than 700° C. and not more than 1200° C.

7. The method for manufacturing the silicon carbide semiconductor device according to claim 4 , the step of forming said trench further including the steps of:

removing said reconstitution layer, and

removing said silicon layer after removing said reconstitution layer.

8. A silicon carbide semiconductor device comprising:

a substrate that is made of silicon carbide having a single-crystal structure of one of hexagonal system and cubic system and that is provided with a main surface having an off angle of 0.5° to 5° relative to a reference plane, said reference plane being a {000-1} plane in the case of the hexagonal system and being a {111} plane in the case of the cubic system; and

a silicon carbide layer epitaxially formed on said main surface of said substrate, said silicon carbide layer being provided with a trench having first and second side walls opposite to each other, each of said first and second side walls including a channel region, each of said first and second side walls substantially including one of a {0-33-8} plane and a {01-1-4} plane in the case of the hexagonal system and substantially including a {100} plane in the case of the cubic system,

wherein an inclination of said first and second side walls with respect to said main surface is controlled by said off angle from said reference plane, and

wherein inclinations of said first and second side walls with respect to said main surface are different by an angle corresponding to twice as large as said off angle from said reference plane.

9. The silicon carbide semiconductor device according to claim 8 , wherein a difference between the inclination of said first side wall relative to said main surface and the inclination of said second side wall relative to said main surface is 10° or smaller.

10. A silicon carbide semiconductor device comprising:

a silicon carbide substrate including a main surface having an off angle of 5° or smaller relative to a reference plane;

a silicon carbide layer on said main surface of said silicon carbide substrate;

first and second mesa structures formed on said silicon carbide layer with a space interposed therebetween, each of said first and second mesa structures including an upper surface having a hexagonal shape and six side walls; and

a gate electrode formed between said first and second mesa structures with a gate insulation layer interposed therebetween,

said reference plane being a (000-1} plane in the case of the hexagonal system and being a {111} plane in the case of the cubic system,

said first mesa structure having a first side wall and said second mesa structure having a second side wall arranged next to said first side wall,

each of said first and second side walls substantially including one of a {0-33-8} plane and a {01-1-4} plane in the case of the hexagonal system and substantially including a {100} plane in the case of the cubic system,

an inclination of said first and the second side walls with respect to said main surface being controlled by said off angle from said reference plane.