IP Library Granted Patent US 8,889,978
Granted Patent B2
US 8,889,978 · App. 13/619,605 · Granted Nov 18, 2014

III-V semiconductor interface with graded GeSn on silicon

Inventors: Radek Roucka (Mountain View, CA); Michael Lebby (Apache Junction, AZ); Scott Semans (Sunnyvale, CA)
Assignee: Translucent, Inc.
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Quick Facts
Patent No.
US 8,889,978
App. No.
13/619,605
Granted
Nov 18, 2014
Kind
B2
Abstract

A method of depositing III-V solar collection materials on a GeSn template on a silicon substrate including the steps of providing a crystalline silicon substrate and epitaxially growing a single crystal GeSn layer on the silicon substrate using a grading profile to grade Sn through the layer. The single crystal GeSn layer has a thickness in a range of approximately 3 μm to approximately 5 μm. A layer of III-V solar collection material is epitaxially grown on the graded single crystal GeSn layer. The graded single crystal GeSn layer includes Sn up to an interface with the layer of III-V solar collection material.

Claims (24)

1. A method of depositing III-V solar collection materials on a GeSn template on a silicon substrate comprising the steps of:

providing a crystalline silicon substrate;

epitaxially growing a graded single crystal GeSn layer on the silicon substrate using a grading profile to grade Sn through the layer, the graded single crystal GeSn layer having a thickness in a range of approximately 3 μm to approximately 5 μm, and

epitaxially growing a layer of III-V solar collection material on the graded single crystal GeSn layer, the graded single crystal GeSn layer including Sn up to an interface with the layer of III-V solar collection material.

2. A method as claimed in claim 1 wherein the grading profile includes starting the Sn at or near zero with the Ge at zero, varying the percentage of Sn to a maximum mid-area, and reducing the percentage of SN as the growth progresses.

3. A method of fabricating a solar cell on a silicon substrate comprising the steps of:

providing a crystalline silicon substrate;

epitaxially growing a graded single crystal GeSn layer on the silicon substrate using a grading profile to grade Sn through the layer, the graded single crystal GeSn layer having a thickness in a range of approximately 3 μm to approximately 5 μm;

epitaxially growing a single crystal layer of Ge on the graded single crystal GeSn layer;

epitaxially growing a single crystal layer of GeSn on the single crystal Ge layer; and

epitaxially growing a layer of single crystal III-V solar collection material on the single crystal layer of GeSn.

4. III-V solar collection material on a GeSn template comprising;

a crystalline silicon substrate;

a single crystal graded GeSn layer epitaxially grown on the silicon substrate, the Sn being graded through the layer, and the graded single crystal GeSn layer having a thickness in a range of approximately 3 μm to approximately 5 μm; and

a layer of III-V solar collection material epitaxially grown on the graded single crystal GeSn layer, the graded single crystal GeSn layer including Sn up to an interface with the layer of III-V solar collection material.

5. III-V solar collection material on a GeSn template as claimed in claim 4 wherein the graded single crystal GeSn layer starts with the Sn at or near zero with the Ge at zero, and the percentage of Sn varies to a maximum mid-area with the percentage of SN reducing as the growth progresses.

6. A solar collection device on a silicon substrate comprising;

a crystalline silicon substrate;

a graded single crystal GeSn layer epitaxially grown on the silicon substrate, the Sn being graded through the layer, and the graded single crystal GeSn layer having a thickness in a range of approximately 3 μm to approximately 5 μm;

a single crystal Ge layer epitaxially grown on the graded single crystal GeSn layer;

a single crystal GeSn layer epitaxially grown on the single crystal Ge layer; and

a layer of III-V solar collection material epitaxially grown on the single crystal GeSn layer.

7. A solar collection device on a silicon substrate as claimed in claim 6 wherein the graded single crystal GeSn layer starts with the Sn at or near zero with the Ge at zero, and the percentage of Sn varies to a maximum mid-area with the percentage of SN reducing as the growth progresses.

8. A solar collection device on a silicon substrate as claimed in claim 6 wherein the layer of III-V solar collection material includes InGaP.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2018
From: TRANSLUCENT INC.
To: IQE PLC
Reel/Frame 046329/0511 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2014
From: ROUCKA, RADEK; LEBBY, MICHAEL; SEMANS, SCOTT
To: TRANSLUCENT, INC.
Reel/Frame 033890/0167 →
Continuity (1)
Related Publication 20140076390A1 · Mar 20, 2014