IP Library Granted Patent US 9,310,924
Granted Patent B2
US 9,310,924 · App. 13/627,028 · Granted Apr 12, 2016

Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit

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Quick Facts
Patent No.
US 9,310,924
App. No.
13/627,028
Granted
Apr 12, 2016
Kind
B2
Abstract

In one embodiment, a method includes deactivating an integrator of a mutual-capacitive measurement circuit and configuring the mutual-capacitive measurement circuit according to a first voltage configuration. The first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit. The method also includes adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase an output range of the mutual-capacitive measurement circuit. The method also includes applying the supply voltage to the mutual-capacitive measurement circuit and obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit.

Claims (95)

1. A method of detecting a change in capacitance, comprising:

adjusting a variable reference voltage input of an integrator of a mutual-capacitive measurement circuit to a first reference voltage, wherein the first reference voltage is selected to increase a range of voltages that can be output by the mutual-capacitive measurement circuit during a first half of a differential measurement cycle;

configuring the mutual-capacitive measurement circuit for obtaining a first reference measurement during the first half of the differential measurement cycle;

obtaining the first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit;

configuring the mutual-capacitive measurement circuit for obtaining a first output measurement during the first half of the differential measurement cycle;

obtaining the first output measurement from the analog-digital-converter;

adjusting the variable reference voltage input to a second reference voltage, wherein the second reference voltage is selected to increase the range of voltages that can be output by the mutual-capacitive measurement circuit during a second half of the differential measurement cycle;

configuring the mutual-capacitive measurement circuit for obtaining a second reference measurement during the second half of the differential measurement cycle;

obtaining the second reference measurement from the analog-digital-converter;

configuring the mutual-capacitive measurement circuit for obtaining a second output measurement during the second half of the differential measurement cycle;

obtaining the second output measurement from the analog-digital-converter; and

determining whether a touch or proximity event relative to a touch sensitive device has occurred based on calculating a differential measurement using a difference between the first reference measurement and the first output measurement and a difference between the second reference measurement and the second output measurement.

2. The method of claim 1 , wherein configuring the mutual-capacitive measurement circuit for obtaining a first reference measurement during the first half of the differential measurement cycle comprises:

deactivating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to a voltage configuration for obtaining the first reference measurement; and

applying a supply voltage to the mutual-capacitive measurement circuit.

3. The method of claim 1 , wherein configuring the mutual-capacitive measurement circuit for obtaining a first output measurement during the first half of the differential measurement cycle comprises:

activating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to a voltage configuration for obtaining the first output measurement; and

applying a supply voltage to the mutual-capacitive measurement circuit.

4. The method of claim 3 , wherein configuring the mutual-capacitive measurement circuit for obtaining a first output measurement during the first half of the differential measurement cycle further comprises calibrating a compensation capacitor of the mutual-capacitive measurement circuit.

5. The method of claim 1 , wherein configuring the mutual-capacitive measurement circuit for obtaining a second reference measurement during the second half of the differential measurement cycle comprises:

deactivating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to a voltage configuration for obtaining the second reference measurement; and

applying a supply voltage to the mutual-capacitive measurement circuit.

6. The method of claim 1 , wherein configuring the mutual-capacitive measurement circuit for obtaining a second output measurement during the second half of the differential measurement cycle comprises:

activating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to a voltage configuration for obtaining the second output measurement; and

applying a supply voltage to the mutual-capacitive measurement circuit.

7. The method of claim 6 , wherein configuring the mutual-capacitive measurement circuit for obtaining a second output measurement during the second half of the differential measurement cycle further comprises calibrating a compensation capacitor of the mutual-capacitive measurement circuit.

8. The method of claim 1 , further comprising detecting a proximity of an object relative to the touch sensitive device based on the differential measurement.

9. An apparatus comprising:

a mutual-capacitive measurement circuit comprising:

a mutual-capacitive sensor comprising a sensor capacitor and a compensation capacitor;

an integrator coupled to the mutual-capacitive sensor, the integrator having a variable reference voltage input capable of being adjusted to increase a range of voltages that can be output by the mutual-capacitive measurement circuit;

an analog-to-digital converter coupled to an output of the mutual-capacitive measurement circuit; and

a controller operable to:

dynamically adjust, over a plurality of measurement phases, the variable reference voltage input of the integrator; and

adjust the compensation capacitor until a voltage representing a charge share between the sensor capacitor and the compensation capacitor is equal to a particular reference voltage to which the variable reference voltage input is dynamically adjusted.

10. The apparatus of claim 9 , wherein the mutual-capacitive measurement circuit is embodied in a touch sensitive device.

11. The apparatus of claim 10 , wherein the controller is further operable to:

deactivate the integrator of the mutual-capacitive measurement circuit;

configure the mutual-capacitive measurement circuit according to a first voltage configuration, wherein the first voltage configuration results in a charge on the sensor capacitor and the compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit;

adjust the variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase the range of voltages that can be output by the mutual-capacitive measurement circuit;

apply the supply voltage to the mutual-capacitive measurement circuit; and

obtain a first reference measurement from the analog-digital-converter.

12. The apparatus of claim 11 , wherein the controller is further operable to:

activate the integrator of the mutual-capacitive measurement circuit;

configure the mutual-capacitive measurement circuit according to a second voltage configuration, wherein the second voltage configuration results in a reversed polarity of the charge resulting from the first voltage configuration;

adjust the variable reference voltage input to the first reference voltage;

apply the supply voltage to the mutual-capacitive measurement circuit; and

obtain a first output measurement from the analog-digital-converter.

13. The apparatus of claim 12 , wherein the controller is further operable to:

deactivate the integrator of the mutual-capacitive measurement circuit;

configure the mutual-capacitive measurement circuit according to the second voltage configuration;

adjust the variable reference voltage input to a second reference voltage, wherein the second reference voltage is selected to increase the range of voltages that can be output by the mutual-capacitive measurement circuit;

apply the supply voltage to the mutual-capacitive measurement circuit; and

obtain a second reference measurement from the analog-digital-converter.

14. The apparatus of claim 13 , wherein the controller is further operable to:

activate the integrator of the mutual-capacitive measurement circuit;

configure the mutual-capacitive measurement circuit according to the first voltage configuration;

adjust the variable reference voltage input to the second reference voltage;

apply the supply voltage to the mutual-capacitive measurement circuit; and

obtain a second output measurement from the analog-digital-converter.

15. The apparatus of claim 14 , wherein the controller is further operable to:

calculate a differential measurement using the first reference measurement, the first output measurement, the second reference measurement, and the second output measurement; and

detect a proximity of an object relative to the touch sensitive device based on the differential measurement.

16. A method of detecting a change in capacitance, comprising:

deactivating an integrator of a mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to a first voltage configuration, wherein the first voltage configuration results in a charge on a sensor capacitor and a compensation capacitor when a supply voltage is applied to the mutual-capacitive measurement circuit;

adjusting a variable reference voltage input of the integrator to a first reference voltage, wherein the first reference voltage is selected to increase a range of voltages that can be output by the mutual-capacitive measurement circuit;

applying the supply voltage to the mutual-capacitive measurement circuit;

obtaining a first reference measurement from an analog-digital-converter coupled to an output of the mutual-capacitance measurement circuit, wherein the first reference measurement represents an output voltage equal to a voltage between the sensor capacitor and the compensation capacitor when the mutual-capacitive measurement circuit is balanced; and

determining whether a touch or proximity event has occurred based on calculating a differential measurement at least in part by using a difference between the first reference measurement and an output measurement.

17. The method of claim 16 , further comprising:

activating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to a second voltage configuration, wherein the second voltage configuration results in a reversed polarity of the charge resulting from the first voltage configuration;

adjusting the variable reference voltage input to the first reference voltage;

applying the supply voltage to the mutual-capacitive measurement circuit; and

obtaining a first output measurement from the analog-digital-converter.

18. The method of claim 17 , further comprising:

deactivating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to the second voltage configuration;

adjusting the variable reference voltage input to a second reference voltage, wherein the second reference voltage is selected to increase the range of voltages that can be output by the mutual-capacitive measurement circuit;

applying the supply voltage to the mutual-capacitive measurement circuit; and

obtaining a second reference measurement from the analog-digital-converter.

19. The method of claim 18 , further comprising:

activating the integrator of the mutual-capacitive measurement circuit;

configuring the mutual-capacitive measurement circuit according to the first voltage configuration;

adjusting the variable reference voltage input to the second reference voltage;

applying the supply voltage to the mutual-capacitive measurement circuit; and

obtaining a second output measurement from the analog-digital-converter.

20. The method of claim 19 , further comprising:

calculating the differential measurement using the first reference measurement, the first output measurement, the second reference measurement, and the second output measurement; and

detecting a proximity of an object relative to a touch sensitive device based on the differential measurement.

Assignments (11)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2013
From: ATMEL TECHNOLOGIES IRELAND LIMITED
To: ATMEL CORPORATION
Reel/Frame 030436/0467 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2012
From: HANSSEN, INGAR
To: ATMEL CORPORATION
Reel/Frame 029027/0021 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2012
From: WHELAN, RIAN
To: ATMEL TECHNOLOGIES IRELAND LIMITED
Reel/Frame 029027/0071 →