IP Library › Granted Patent US 9,082,589
Granted Patent B2
US 9,082,589 · App. 13/648,183 · Granted Jul 14, 2015

Hybrid impedance matching for inductively coupled plasma system

Inventors: George Thomas (Fremont, CA); Panya Wongsenakhum (San Francisco, CA); Francisco J. Juarez (Fremont, CA)
Assignee: Novellus Systems, Inc.
H01J37/321H01J37/32174H01J37/32183H03H7/40H05H1/46H05H2001/4682
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Quick Facts
Patent No.
US 9,082,589
App. No.
13/648,183
Granted
Jul 14, 2015
Kind
B2
Abstract

In one aspect, a system includes a generator configured to generate and tune a frequency of a supply signal. The system includes an auto-matching network configured to receive the supply signal and to generate an impedance-matched signal for use in powering a plasma system. In some implementations, during a first stage of an impedance matching operation, the generator is configured to tune the frequency of the supply signal until the generator identifies a frequency for which the reactance of the generator and the reactance of the load are best matched. In some implementations, during a second stage of the impedance matching operation, the auto-matching network is configured to tune a tuning element within the auto-matching network until the auto-matching network identifies a tuning of the tuning element for which the resistance of the generator and the resistance of the load are best matched.

Claims (27)

1. A system comprising:

a generator configured to generate a supply signal and to tune a frequency of the supply signal within a tuning range;

an auto-matching network configured to receive the supply signal and to generate an impedance-matched signal; and

a plasma system that receives the impedance-matched signal, the impedance-matched signal supplying power to the plasma system for one or more plasma-facilitated processes, the impedance-matched signal being based on the supply signal as modified by the impedance of the plasma system and the impedance of the auto-matching network;

wherein:

during a first stage of an impedance matching operation, the generator is configured to tune the frequency of the supply signal until the generator identifies a frequency for which the reactance of the generator and the reactance of the load on the generator are best matched for the tuning range; and

during a second stage of the impedance matching operation, the auto-matching network is configured to tune a tuning element within the auto-matching network until the auto-matching network identifies a tuning of the tuning element for which the resistance of the generator and the resistance of the load on the generator are best matched for the identified frequency.

2. The system of claim 1 , wherein the generator is configured to generate and output the supply signal in forward power mode.

3. The system of claim 1 , wherein the supply signal is a radio frequency (RF) signal.

4. The system of claim 3 , wherein the generator is configured to generate the supply signal at frequencies below 1 MHz.

5. The system of claim 4 , wherein the generator is configured to tune the frequency of the supply signal within a range that starts at approximately 380 kHz and which stops at approximately 440 kHz.

6. The system of claim 1 , wherein to identify the frequency for which the reactance of the generator and the reactance of the load on the generator are best matched, the generator is configured to identify the frequency of the supply signal for which the generator detects or determines there is the least power reflected back to the generator from the load on the generator.

7. The system of claim 1 , wherein the first stage of the impedance matching operation includes a first coarse tuning operation followed by a second fine tuning operation.

8. The system of claim 1 , wherein the auto-matching network further includes a phase and magnitude detector configured to:

detect a phase and magnitude of the supply signal; and

generate phase and magnitude error correction signals based on the detected phase and magnitude.

9. The system of claim 8 , wherein the phase and magnitude detector is further configured to detect a phase and magnitude of a signal reflected back from the plasma system.

10. The system of claim 8 , wherein the auto-matching network further includes a controller configured to:

receive the phase and magnitude error correction signals; and

generate a tuning signal based on the phase and magnitude error correction signals.

11. The system of claim 10 , wherein the tuning element is configured to receive the tuning signal, and wherein the tuning signal effects a change in the impedance of the tuning element based on the tuning signal.

12. The system of claim 11 , wherein the tuning element is a variable capacitor, and wherein the tuning signal changes a capacitance of the variable capacitor.

13. The system of claim 11 , wherein to tune the tuning element within the auto-matching network until the auto-matching network identifies a tuning of the tuning element for which the resistance of the generator and the resistance of the load on the generator are best matched, the auto-matching network is configured to tune the tuning element until one or both of the phase and magnitude error correction signals are substantially zero or are below certain thresholds.

14. The system of claim 1 , wherein the first and second stages of the impedance matching operation are performed in real time.

15. The system of claim 1 , wherein the first and second stages of the impedance matching operation are performed at each transition between process steps of a multi-step process.

16. The system of claim 1 , wherein the performance of the second stage of the impedance matching operation does not begin until the first stage of the impedance matching operation identifies the frequency for which the reactance of the generator and the reactance of the load on the generator are best matched.

17. The system of claim 1 , wherein the plasma system is an inductively coupled plasma (ICP) system and wherein the auto-matching network delivers the impedance-matched signal to an induction coil of the ICP system.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2012
From: THOMAS, GEORGE; WONGSENAKHUM, PANYA; JUAREZ, FRANCISCO J.
To: NOVELLUS SYSTEMS, INC.
Reel/Frame 029262/0067 →
Continuity (1)
Related Publication 20140097751A1 · Apr 10, 2014