IP Library Granted Patent US 8,766,453
Granted Patent B2
US 8,766,453 · App. 13/660,243 · Granted Jul 1, 2014

Packaged integrated circuit having large solder pads and method for forming

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Quick Facts
Patent No.
US 8,766,453
App. No.
13/660,243
Filed
Oct 25, 2012
Granted
Jul 1, 2014
Kind
B2
Art Unit
2897
USPC
257/773
Abstract

A package substrate has a die mounted on a first side. One or more inner solder pads are on an inner portion of a second side. A perimeter of the inner portion is aligned with a perimeter of the die. The one or more inner solder pads are the only solder pads on the inner portion. The one or more inner solder pads number no more than five. A plurality of outer solder pads are on an outer portion of the second side. An average of areas of the one or more inner solder pads is at least five times an average of areas of the one or more inner solder pads. The plurality of outer solder ball pads are for receiving solder ball balls. The outer portion is spaced from the perimeter of the inner portion. The outer portion and the inner portion are coplanar.

Claims (44)

1. A packaged integrated circuit, comprising:

a package substrate;

a die mounted to a first major surface of the package substrate;

one or more inner solder pads on an inner portion of a second major surface of the package substrate, wherein the second major surface is opposite the first major surface, a perimeter of the inner portion is aligned with a perimeter of the die, the one or more inner solder pads are the only solder pads on the inner portion, the one or more inner solder pads number no more than five, and an average of areas of the one or more inner solder pads is an inner average; and

a plurality of outer solder ball pads on an outer portion of the second major surface that comprise all of the solder ball pads on the second major surface exclusive of the one or more inner solder pads, wherein an average of areas of the plurality of outer solder ball pads is an outer average, the inner average area is at least five times the outer average, the plurality of outer solder ball pads are for receiving solder balls, the outer portion is spaced from the perimeter of the inner portion, and the outer portion and the inner portion are coplanar.

2. The packaged integrated circuit of claim 1 , wherein each of the one or more inner solder pads are non-circular.

3. The packaged integrated circuit of claim 1 , wherein each of the one or more inner solder pads is for carrying a power supply voltage.

4. The packaged integrated circuit of claim 3 , wherein the power supply voltage is ground.

5. The packaged integrated circuit of claim 4 further comprising solder on the outer solder ball pads and the one or more inner solder pads, wherein an average volume of solder on the one or more inner solder pads is at least five times an average volume of solder on the outer solder ball pads.

6. The packaged integrated circuit of claim 5 , wherein a height of the solder on the outer solder ball pads exceeds a height of the solder on the one or more inner solder pads.

7. The packaged integrated circuit of claim 6 being attached to a printed circuit board, wherein the printed circuit board has outer solder joints attached to the solder on the outer solder ball pads and inner solder joints attached to the solder on the inner solder ball pads, wherein the inner solder joints extend further from surface of the printed circuit board than the outer solder joints extend from the surface of the printed circuit board.

8. The packaged integrated circuit of claim 1 , wherein the one or more inner solder pads number four.

9. The packaged integrated circuit of claim 1 , wherein the die is electrically attached to the one or more inner solder pads.

10. The packaged integrated circuit of claim 1 , wherein:

the die is electrically attached to the one or more inner solder pads and the outer solder ball pads through the package substrate; and

the die is covered with an encapsulant.

11. A method of forming a packaged integrated circuit using a package substrate, comprising:

forming a plurality of outer solder ball pads and one or more inner solder pads on a first major surface of the package substrate, wherein:

the inner solder pads are in an inner portion of the first major surface;

a perimeter of the inner portion is aligned with a perimeter of a die region on a second major surface of the package substrate opposite the first major surface;

the one or more inner solder pads are the only solder pads on the inner portion;

the one or more inner solder pads number no more than five;

an average of areas of the one or more inner solder pads is an inner average;

the output solder ball pads are in an outer portion of the first major surface outside the perimeter of the inner portion;

the outer solder ball pads comprise all of the solder pads on the first major surface exclusive of the one or more inner solder pads;

an average of areas of the plurality of outer solder ball pads is an outer average;

the inner average area is at least five times the outer average;

the plurality of outer solder ball pads are for receiving solder balls;

the outer portion is spaced from the perimeter of the inner portion; and

the outer portion and the inner portion are coplanar; and

mounting a die on the second major surface in the die region.

12. The method of claim 11 , further comprising forming soldering flux on the one or more inner solder pads and the outer solder ball pads.

13. The method of claim 12 , further comprising placing solder balls on the soldering flux that is on the one or more inner solder pads and the outer solder ball pads.

14. The method of claim 13 , wherein the placing solder balls is further characterized by placing an average of at least five solder balls on the one or more inner solder pads.

15. The method of claim 14 , further comprising reflowing the solder balls.

16. The method of claim 15 , further comprising coupling the one or more inner solder pads to the die to provide a power supply to the die.

17. The method of claim 15 , further comprising encapsulating the die.

18. The method of claim 15 , further comprising attaching the packaged integrated circuit to a printed circuit board after the reflowing, the attaching comprising coupling the solder balls that have been reflowed to the printed circuit board.

19. A packaged integrated circuit, comprising:

a package substrate having a first major surface and a second major surface;

a die attached to the first major surface, a perimeter of the die defining an inner portion of the package substrate on the second major surface;

a plurality of inner solder pads on the inner portion, wherein the plurality of inner solder pads is all of the solder pads in the inner portion, is no more than five solder pads, and has a first average area; and

a plurality of outer solder pads that comprise all of the solder pads different from the plurality of inner solder pads on the second major surface, wherein the solder pads are for receiving solder balls, are on the second major surface, and have a second average area, wherein the first average area is at least five times the second average area.

20. The packaged integrated circuit of claim 19 , wherein the plurality of inner solder pads are for carrying ground to the die.

Assignments (16)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
PATENT RELEASE Recorded Jan 14, 2016
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037494/0312 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0671 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0685 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030258/0523 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030258/0558 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 030258/0540 →