SiGe HBT and manufacturing method thereof
View Patent ↗A silicon-germanium (SiGe) heterojunction bipolar transistor (HBT) is disclosed, which includes: two isolation structures each being formed in a trench; a set of three or more pseudo buried layers formed under each trench with every adjacent two pseudo buried layers of the set being vertically contacted with each other; and a collector region. In this design, the lowermost pseudo buried layers of the two sets are laterally in contact with each other, and the collector region is surrounded by the two isolation structures and the two sets of pseudo buried layers. As the breakdown voltage of a SiGe HBT according to the present invention is determined by the distance between an uppermost pseudo buried layer and the edge of an active region, SiGe HBTs having different breakdown voltages can be achieved. A manufacturing method of the SiGe HBT is also disclosed.
1. A silicon-germanium (SiGe) heterojunction bipolar transistor (HBT), comprising:
a substrate;
two trenches formed in the substrate, each having an isolation structure formed therein;
two sets of pseudo buried layers, each set being formed in the substrate under a corresponding trench, each set comprising three or more pseudo buried layers with every adjacent two pseudo buried layers vertically contacting with each other, the lowermost pseudo buried layers of the two sets laterally contacting with each other, the uppermost pseudo buried layer of each set being in contact with its corresponding trench; and
a collector region, surrounded by the isolation structures in the two trenches and the two sets of pseudo buried layers.
2. The SiGe HBT according to claim 1 , wherein except for the lowermost pseudo buried layer, each of the other pseudo buried layers in a set is not laterally connected to its corresponding pseudo buried layer in the other set.
3. The SiGe HBT according to claim 1 , wherein each trench has a cross section shape of trapezoid, which is narrow at top and wide at bottom.
4. The SiGe HBT according to claim 1 , wherein the collector region has a cross section shape of an inverted “T”, which is narrow at top and wide at bottom with recessed portions around its middle part on both sides.
5. The SiGe HBT according to claim 4 , wherein on each side of the collector region, a distance between the uppermost pseudo buried layer and the recessed portion is adjustable.