IP Library Granted Patent US 9,438,030
Granted Patent B2
US 9,438,030 · App. 13/682,604 · Granted Sep 6, 2016

Trigger circuit and method for improved transient immunity

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Quick Facts
Patent No.
US 9,438,030
App. No.
13/682,604
Granted
Sep 6, 2016
Kind
B2
Abstract

A trigger circuit detects a transient voltage increase on an integrated circuit. The trigger circuit controls a conductivity state of a clamping device to limit the transient voltage increase. The trigger circuit comprises a common capacitive element having a capacitive value, wherein a first time value and a second time value are dependent upon the capacitive value of the common capacitive element, the first time value applicable to an unpowered state of the integrated circuit and the second time value applicable to a powered state of the integrated circuit. The first time value and the second time value control a trigger circuit parameter which may include a detection range within which a rate of transient voltage increase causes the trigger circuit to become active or an “on” time upon which an active duration of control of the conductivity state of the clamping device depends.

Claims (36)

1. A method comprising:

detecting a transient voltage increase on an integrated circuit; and

controlling a conductivity state of a clamping device to limit the transient voltage increase, wherein at least one of the detecting and the controlling are dependent upon a first time value and a second time value, the first time value applicable to an unpowered state of the integrated circuit and the second time value applicable to a powered state of the integrated circuit, wherein the first time value and the second time value are dependent upon a capacitive value of a common capacitive element, wherein the controlling is dependent upon the first time value and the second time value and wherein the controlling occurs for an active duration, the active duration being dependent upon the first time value for the unpowered state of the integrated circuit and the second time value for the powered state of the integrated circuit.

2. The method of claim 1 wherein the detecting is dependent upon the first time value and the second time value and wherein the detecting occurs in response to a rate of transient voltage increase being within a detection range, the detection range being dependent upon the first time value for the unpowered state of the integrated circuit and the second time value for the powered state of the integrated circuit.

3. The method of claim 1 further comprising:

selecting between the first time value and the second time value based on a signal responsive to the unpowered state and the powered state of the integrated circuit.

4. The method of claim 1 wherein the controlling the conductivity state of the clamping device to limit the transient voltage increase comprises:

responding to the transient voltage increase in the powered state in proportion to the transient voltage increase relative to a preexisting voltage of the powered state.

5. The method of claim 1 wherein the detecting is dependent upon the first time value and the second time value and wherein the controlling is dependent upon a third time value and a fourth time value, wherein the third time value and the fourth time value are dependent upon the capacitive value of the common capacitive element.

6. The method of claim 5 , wherein the detecting occurs in response to a rate of transient voltage increase being within a detection range, the detection range being dependent upon the first time value for the unpowered state of the integrated circuit and the second time value for the powered state of the integrated circuit, wherein the controlling occurs for an active duration, the active duration being dependent upon the third time value for the unpowered state of the integrated circuit and the fourth time value for the powered state of the integrated circuit.

7. The method of claim 1 wherein the first time value is unequal to the second time value.

8. An integrated circuit comprising:

a clamping device; and

a trigger circuit for detection of a transient voltage increase on the integrated circuit, the trigger circuit controlling a conductivity state of the clamping device to limit the transient voltage increase, wherein the trigger circuit controls the clamping device to provide higher conductivity when the integrated circuit is in an unpowered state and controlled lower conductive to provide voltage regulation when the integrated circuit is in a powered state, the trigger circuit comprising:

a common capacitive element having a capacitive value, wherein a first time value and a second time value are dependent upon the capacitive value of the common capacitive element, the first time value applicable to the unpowered state of the integrated circuit and the second time value applicable to the powered state of the integrated circuit, wherein the first time value and the second time value control a trigger circuit parameter selected from a group consisting of:

a detection range within which a rate of transient voltage increase causes the trigger circuit to become active; and

an “on” time upon which an active duration of the controlling of the conductivity state of the clamping device depends.

9. The integrated circuit of claim 8 , wherein the first time value determines the detection range for the unpowered state of the integrated circuit and the second time value determines the detection range for the powered state of the integrated circuit.

10. The integrated circuit of claim 9 wherein the trigger circuit has a third time value for determining the active duration of a higher conductivity during the unpowered state of the integrated circuit and a fourth time value for determining the active duration of a controlled lower conductivity during the powered state of the integrated circuit, wherein the third time value and the fourth time value are dependent upon the capacitive value of the common capacitive element.

11. The integrated circuit of claim 8 wherein the trigger circuit comprises:

a driver circuit having an input coupled to the common capacitive element, the driver circuit comprising one or more inverter stages to detect and amplify a filtered signal at the input and to provide a trigger circuit output signal to drive a control terminal of the clamping device.

12. A method comprising:

selecting a first value of a variable of a linear time-invariant (LTI) function for an unpowered state of an integrated circuit and a second value of the variable of the linear time-invariant (LTI) function for a powered state of the integrated circuit, wherein the first value and the second value are dependent upon a common reactive element;

detecting a transient voltage increase on the integrated circuit; and

controlling a conductivity state of a clamping device to limit the transient voltage increase, wherein the controlling is dependent upon the LTI function and wherein the controlling occurs for an active duration, the active duration being dependent upon the LTI function.

13. The method of claim 12 wherein the detecting is dependent upon the LTI function and wherein the detecting occurs in response to a rate of transient voltage increase being within a detection range, the detection range being dependent upon the LTI function.

14. The method of claim 12 further comprising:

receiving a signal responsive to the unpowered state and the powered state of the integrated circuit, wherein the selecting further comprises:

selecting between the first value and the second value of the variable of the LTI function based on the signal.

15. The method of claim 14 further comprising:

receiving a second signal, wherein the second signal represents an inactivated state of the controlling a conductivity state of a clamping device in a first state of the second signal and an activated state of the controlling a conductivity state of a clamping device in a second state of the second signal, wherein the selecting between the first value and the second value of the variable of the LTI function comprises:

selecting, based on the signal and the second signal, the first value of the variable of the LTI function for the detecting for the unpowered state of the integrated circuit, the second value of the variable of the LTI function for the detecting for the powered state of the integrated circuit, a third value of the variable of the LTI function for the controlling for the unpowered state of the integrated circuit, and a fourth value of the variable of the LTI function for the controlling for the powered state of the integrated circuit, wherein the first value, the second value, the third value, and the fourth value are dependent upon the common reactive element.

16. The method of claim 14 wherein the signal is a power-on reset (POR) signal.

17. The method of claim 12 further comprising:

receiving a signal responsive to an inactivated state and an activated state of the controlling the conductivity of the clamping devices, wherein the selecting comprises:

selecting whether to apply the first value and the second value of the variable of the LTI function to the detecting or to the controlling based on the signal.

Assignments (21)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
PATENT RELEASE Recorded Jan 14, 2016
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037494/0312 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0685 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0671 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2012
From: STOCKINGER, MICHAEL A.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 029333/0382 →