Granted Patent B1

US 8,601,426 · App. 13/717,646 · Granted Dec 3, 2013

Abstract

Claims (33)

1. A method of identifying one or more missing level shifters in a multi-voltage domain integrated circuit (IC) design, the method comprising:

receiving a physical layout design data file for the IC design;

analysing the received physical layout design data file to identify connected nets of devices within the IC design having one or more missing level shifters, comprising:

extracting power supply voltage data and/or physical recognition layer data from the physical layout design data file, and

perform a power domain crossing check on the extracted layout data using the power supply voltage and physical recognition layer data for each device instance in the IC design, wherein the power domain crossing check comprises,

determining an instance type for each instance of a device entity within a net under test, said instance type indicative of an intended voltage level to be used with said each instance of a device entity in the net under test,

determining an actual power supply voltage connection for use with each instance of a device entity in the net under test, and

determining if there is an invalid voltage level by comparison of the intended power supply voltage connection for a particular instance and the actual power supply voltage for the same instance of each device entity in the net under test; and

inserting one or more suitably configured level shifters into the IC design where any one or more missing level shifters are identified.

2. The method of claim 1 , wherein analysing the received physical layout design data file comprises:

determining if there is power supply voltage data and/or physical recognition layer data in the physical layout design data file; and

if not, adding power supply voltage data and/or physical recognition layer data to the physical layout design data file.

3. The method of claim 1 , wherein the actual power supply voltage connection data takes greater priority than the intended voltage for an instance of each device entity within the net under test.

4. The method of claim 1 , wherein the instance type for each instance of a device entity within the net under test including intended power supply voltage and the actual power supply voltage connection for use with each instance of a device entity are determined from one or more power supply voltage data and/or physical recognition layer data in the physical layout design data file.

5. The method of claim 1 , further comprising defining constraints on an extent of the IC design to be analysed.

6. The method of claim 5 , further comprising defining constraints to exclude any analog portion(s) of the IC design from being analysed.

7. The method of claim 1 , wherein identifying connected nets of devices having one or more missing level shifters comprises determining, by testing, any nets in IC design having an invalid power domain crossing, wherein a net having an invalid power domain crossing has a first voltage level associated with at least one end of a net under test, and a second, different, voltage level associated with at least one other end of the net under test.

8. The method of claim 7 , wherein different voltage levels associated at different ends of the net are indicative of a missing level shifter.

9. A system for verifying a multi-voltage domain integrated circuit (IC) design, the system comprising:

a memory for storing a physical layout design data file for the IC design;

means for analysing the physical layout design data file to identify connected nets of devices within the IC design having one or more missing level shifters, comprising:

means for extracting power supply voltage data and/or physical recognition layer data from the physical layout design data file, and

means for performing a power domain crossing check on the extracted layout data using the power supply voltage and physical recognition layer data for each device instance in the IC design, comprising,

means for determining an instance type for each instance of a device entity within a net under test, said instance type indicative of an intended voltage level to be used with said each instance of a device entity in the net under test;

means for determining an actual power supply voltage connection for use with each instance of a device entity in the net under test, and

means for determining if there is an invalid voltage level by comparison of the intended power supply voltage connection for a particular instance and the actual power supply voltage for the same instance of each device entity in the net under test; and

means for inserting one or more suitably configured level shifters into the IC design where any one or more missing level shifters are identified.

10. The system of claim 9 , wherein the means for analysing the physical layout design data file,

determines if there is power supply voltage data and/or physical recognition layer data in the physical layout design data file; and

if not, adds power supply voltage data and/or physical recognition layer data to the physical layout design data file.

11. The system of claim 9 , wherein the actual power supply voltage connection data takes greater priority than the intended voltage for an instance of each device entity within the net under test.

12. The system of claim 9 , wherein the instance type for each instance of a device entity within the net under test including intended power supply voltage and the actual power supply voltage connection for use with each instance of a device entity are determined from one or more power supply voltage data and/or physical recognition layer data in the physical layout design data file.

13. The system of claim 9 , wherein the physical layout design file is a GDSII or OASIS data file.

Assignments (21)