Substrate processing apparatus and method of manufacturing semiconductor device
View Patent ↗The substrate processing apparatus includes a reaction chamber configured to accommodate a substrate; a first gas supply unit configured to supply a first process gas containing a silicon element to the substrate; a second gas supply unit configured to supply a second process gas containing a silicon element and a chlorine element to the substrate; an exhaust unit configured to exhaust the first process gas and the second process gas; a cleaning gas bypass supply unit configured to supply a cleaning gas to the exhaust unit; a cleaning monitoring unit installed in the exhaust unit; a gas flow rate control unit configured to adjust an amount of the cleaning gas supplied; and a main control unit configured to control the gas flow rate control unit in response to a signal received from the cleaning gas monitoring unit.
1. A method of manufacturing a semiconductor device, comprising:
a film formation process in a process chamber including supplying a first process gas containing a silicon element to a substrate and supplying a second process gas containing a silicon element and a chlorine element to the substrate; and
a cleaning process including supplying a cleaning gas to an exhaust unit via a cleaning gas bypass line without passing through the process chamber configured to process the substrate, monitoring the exhaust unit, and controlling a flow rate of the cleaning gas in response to a signal received from a cleaning monitoring unit including at least one of a gas analysis unit configured to analyze a gas generated in the exhaust unit and a by-product monitoring unit configured to measure an amount of by-products in the exhaust unit.
2. The method according to claim 1 , wherein the monitoring of the exhaust unit comprises measuring a temperature in the exhaust unit using the cleaning monitoring unit.
3. The method according to claim 1 , wherein the cleaning process comprises:
a first cleaning process of cleaning a rear end of a main valve of the exhaust unit whenever the film formation process is performed; and
a second cleaning process of cleaning a reaction chamber and the exhaust unit whenever the film formation process is performed a predetermined number of times.
4. The method according to claim 1 , further comprising suspending the supplying of the cleaning gas when a predetermined value is detected from the signal received from the cleaning monitoring unit.
5. The method according to claim 1 , further comprising displaying a warning message on at least one of an output device and a warning display unit when a predetermined value is detected from the signal received from the cleaning monitoring unit.
6. A non-transitory computer-readable recording medium that stores a program that causes a computer to perform:
a film formation sequence including supplying a first process gas containing a silicon element to a substrate and supplying a second process gas containing a silicon element and a chlorine element to the substrate in a process chamber; and
a cleaning sequence including supplying a cleaning gas to an exhaust unit via a cleaning gas bypass line without passing through the process chamber configured to process the substrate, monitoring the exhaust unit, and controlling a flow rate of the cleaning gas in response to a signal received from a cleaning monitoring unit including at least one of a gas analysis unit configured to analyze a gas generated in the exhaust unit and a by-product monitoring unit configured to measure an amount of by-products in the exhaust unit.
7. The medium according to claim 6 , wherein the monitoring of the exhaust unit comprises measuring a temperature in the exhaust unit using the cleaning monitoring unit.
8. The medium according to claim 6 , wherein the cleaning sequence comprises:
a first cleaning sequence of cleaning a rear end of a main valve of the exhaust unit whenever the film formation sequence is performed; and
a second cleaning sequence of cleaning a reaction chamber and the exhaust unit whenever the film formation sequence is performed a predetermined number of times.
9. The medium of claim 6 , further comprising suspending the supplying of the cleaning gas when a predetermined value is detected from the signal received from the cleaning monitoring unit.
10. The medium according to claim 6 , further comprising displaying a warning message on at least one of an output device and a warning display unit when a predetermined value is detected from the signal received from the cleaning monitoring unit.
11. The method according to claim 1 , further comprising locking a predetermined unit when a predetermined value is detected from the signal received from the cleaning monitoring unit.
12. The method according to claim 11 , wherein the predetermined value comprises a deterioration temperature of a seal member installed in the exhaust unit.
13. The method according to claim 11 , wherein the predetermined unit comprises at least one of a door configured to open and close a housing of a substrate processing apparatus and an input device.
14. The medium according to claim 6 , further comprising locking a predetermined unit when a predetermined value is detected from the signal received from the cleaning monitoring unit.
15. The medium according to claim 14 , wherein the predetermined value comprises a deterioration temperature of a seal member installed in the exhaust unit.
16. The medium according to claim 14 , wherein the predetermined unit comprises at least one of a door configured to open and close a housing of a substrate processing apparatus and an input device.