Memory system and method using partial ECC to achieve low power refresh and fast access to data
A DRAM memory device includes several banks of memory cells each of which are divided into first and second sets of memory cells. The memory cells in the first set can be refreshed at a relatively slow rate to reduce the power consumed by the DRAM device. Error checking and correcting circuitry in the DRAM device corrects any data retention errors in the first set of memory cells caused by the relatively slow refresh rate. The memory cells in the second set are refreshed at a normal rate, which is fast enough that data retention errors do not occur. A mode register in the DRAM device may be programmed to select the size of the second set of memory cells.
1. A method of refreshing an array of memory cells arranged in rows and columns in a dynamic random access memory (“DRAM”) device, the method comprising:
refreshing, a first set of the memory cells in the array at a first rate, wherein the first set of memory cells store a first type of data;
refreshing a second set of the memory cells in the array at a second rate that is significantly faster than the first rate, wherein the second set of memory cells store a second type of data; and
using ECC technique to correct any data retention errors that arise in the memory cells in the first set of the memory cells.
2. The method of claim 1 wherein the act of using ECC technique to correct any data retention errors that arise in the memory cells in the first set comprises:
when writing data of a first type to the memory cells in the first set, generating a syndrome corresponding to the data and storing the syndrome; and
when reading data from the memory cells in the first set, reading the stored syndrome corresponding to the data and using the syndrome to correct any errors that exist in the data.
3. The method of claim 2 , further comprising overwriting the read data stored in the memory cells in the first set with data that has been corrected using the corresponding syndrome.
4. The method of claim 2 wherein the act of storing the syndrome comprises storing the syndrome in the SDRAM device.
5. The method of claim 4 wherein the act of storing the syndrome in the SDRAM device comprises storing the syndrome in memory cells in the first set.
6. The method of claim 1 , further comprising, selectively enabling the first set of the memory cells in the array to be refreshed at the first rate.
7. The method of claim 6 wherein the DRAM device includes a mode register that is programmable to select various operating modes of the DRAM device, and wherein the act of enabling the first set of the memory cells in the array to be refreshed at first rate comprises programming the mode register to enable the first set of the memory cells in the array to be refreshed at the first rate.
8. The method of claim 1 , further comprising selecting the size of the second set of the memory cells in the array.
9. The method of claim 8 wherein the DRAM device includes a mode register that is programmable to select various operating modes of the DRAM device, and wherein the act of selecting the size of the second set of the memory cells in the array comprises programming the mode register with at least one bit having values which correspond to respective sizes of the second set of the memory cells in the array.
10. The method of claim 1 wherein the memory cells in the first and second sets comprise all of the memory cells in the DRAM device.