Lead frame array package with flip chip die attach
View Patent ↗A small form factor near chip scale package is provided that includes input/output contacts not only along the periphery of the package, but also along the package bottom area. Embodiments provide these additional contacts through use of an array lead frame coupled to under die signal contacts through the use of flip chip bonding techniques. The array lead frame contacts are electrically isolated through the use of a partial sawing process performed during package singulation.
1. An array lead frame for a semiconductor device package, the array lead frame comprising:
a first row of a first plurality of edge leads;
a second row of a second plurality of edge leads;
a third row of a third plurality of center leads;
a first set of tie bars coupling a center lead of the third plurality of center leads to one or more edge leads of the first plurality of edge leads; and
a second set of tie bars coupling the center lead of the third plurality of center leads to one or more edge leads of the second plurality of edge leads,
wherein
each lead is configured for electrical coupling to a corresponding die bonding pad using a flip chip die attach.
2. The array lead frame of claim 1 , wherein
a quantity of the first plurality of edge leads is the same as a quantity of the second plurality of edge leads.
3. The array lead frame of claim 2 , wherein
a quantity of the third plurality of center leads is the same as the quantity of the first plurality of edge leads;
the first set of tie bars comprises one tie bar from the center lead to a corresponding edge lead of the first plurality of edge leads; and
the second set of tie bars comprises one tie bar from the center lead to a corresponding edge lead of the second plurality of edge leads.
4. A semiconductor device package comprising:
an array lead frame comprising
a first row of a first plurality of edge leads,
a second row of a second plurality of edge leads,
a third row of a third plurality of center leads,
a first set of tie bars coupling a center lead of the third plurality of center leads to one or more edge leads of the first plurality of edge leads,
a second set of tie bars coupling the center lead of the third plurality of center leads to one or more edge leads of the second plurality of edge leads;
a semiconductor device die comprising a first major surface and a plurality of bond pads on the first major surface, wherein
each bond pad is located in a geometric location corresponding to an edge lead or center lead of the array lead frame, and
each bond pad is electrically coupled to the corresponding edge lead or center lead of the array lead frame; and
a mold compound formed over and around the semiconductor device die and encapsulating a portion of each lead of the array lead frame.
5. The semiconductor device package of claim 4 wherein the semiconductor device die further comprises:
a conductive bump formed on each bond pad, wherein said electrical coupling of each bond pad to a corresponding edge lead or center lead is performed using the conductive bump for a flip chip die attach.
6. The semiconductor device package of claim 5 wherein the conductive bump comprises one of a copper pillar bump, a solder bump, a stud, and a conductive adhesive bump.
7. The semiconductor device package of claim 4 further comprising:
the first plurality of edge leads exposed along a first edge of the semiconductor device package on a first major surface of the semiconductor device package;
the second plurality of edge leads exposed along a second edge of the semiconductor device package on the first major surface of the semiconductor device package, wherein the second edge is opposite the first edge of the semiconductor device package; and
the third plurality of center leads exposed in a center region of the first major surface of the semiconductor device package.
8. The semiconductor device package of claim 4 wherein the first plurality of edge leads, the second plurality of edge leads, and the third plurality of center leads are electrically isolated by removal of the first set of tie bars and the second set of tie bars subsequent to formation of the mold compound.
9. The semiconductor device package of claim 8 wherein said removal of the first set of tie bars and the second set of tie bars is performed by a partial sawing operation.