Imaging systems with backside isolation trenches
View Patent ↗An image sensor such as a backside illumination image sensor may be provided with analog circuitry, digital circuitry, and an image pixel array on a semiconductor substrate. Trench isolation structures may separate the analog circuitry from the digital circuitry on the substrate. The trench isolation structures may be formed from dielectric-filled trenches in the substrate that isolate the portion of the substrate having the analog circuitry from the portion of the substrate having the digital circuitry. The trench isolation structures may prevent digital circuit operations such as switching operations from negatively affecting the performance of the analog circuitry. Additional trench isolation structures may be interposed between portions of the substrate on which bond pads are formed and other portions of the substrate to prevent capacitive coupling between the bond pad structures and the substrate, thereby enhancing the high frequency operations of the image sensor.
1. An image sensor, comprising:
a substrate;
digital circuitry on a first portion of the substrate;
analog circuitry on a second portion of the substrate;
an array of image pixels on a third portion of the substrate;
an intermetal dielectric stack attached to the substrate; and
at least one trench isolation structure in the substrate that electrically isolates the analog circuitry from the digital circuitry, wherein the at least one trench isolation structure is interposed between the first portion of the substrate and the second portion of the substrate, and wherein the at least one trench isolation structure comprises dielectric material formed in a trench in the substrate.
2. The image sensor defined in claim 1 wherein the trench in the substrate extends from a backside surface of the substrate to an interface between the substrate and the intermetal dielectric stack.
3. The image sensor defined in claim 2 wherein the array of image pixels comprises an array of backside illuminated image pixels that receive light through the backside surface of the substrate.
4. The image sensor defined in claim 1 , further comprising a conductive via, wherein the conductive via is formed in an additional trench that extends through the substrate and through at least a portion of the intermetal dielectric stack.
5. The image sensor defined in claim 4 wherein the trench in the substrate and a portion of the additional trench have been formed in a common etch process.