IP Library Granted Patent US 9,186,772
Granted Patent B2
US 9,186,772 · App. 13/788,485 · Granted Nov 17, 2015

Chemical mechanical polishing pad with broad spectrum, endpoint detection window and method of polishing therewith

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Quick Facts
Patent No.
US 9,186,772
App. No.
13/788,485
Granted
Nov 17, 2015
Kind
B2
Abstract

A chemical mechanical polishing pad is provided, comprising: a polishing layer having a polishing surface; and, a broad spectrum, endpoint detection window block having a thickness along an axis perpendicular to a plane of the polishing surface; wherein the broad spectrum, endpoint detection window block, comprises a cyclic olefin addition polymer; wherein the broad spectrum, endpoint detection window block exhibits a uniform chemical composition across its thickness; wherein the broad spectrum, endpoint detection window block exhibits a spectrum loss ≦40%; and, wherein the polishing surface is adapted for polishing a substrate selected from a magnetic substrate, an optical substrate and a semiconductor substrate.

Claims (19)

1. A chemical mechanical polishing pad comprising:

a polishing layer having a polishing surface; and,

a broad spectrum, endpoint detection window block having a thickness, T W , along an axis perpendicular to a plane of the polishing surface;

wherein the broad spectrum, endpoint detection window block consists of a cyclic olefin addition polymer; wherein the broad spectrum, endpoint detection window block exhibits a uniform chemical composition across its thickness, T W ; wherein the broad spectrum, endpoint detection window block exhibits a spectrum loss ≦40%; and, wherein the polishing surface is adapted for polishing a substrate selected from a magnetic substrate, an optical substrate and a semiconductor substrate.

2. The chemical mechanical polishing pad of claim 1 , wherein the broad spectrum, endpoint detection window block has an average thickness, T W-avg , along an axis perpendicular to the plane of the polishing surface of 5 to 75 mils.

3. The chemical mechanical polishing pad of claim 2 , wherein the cyclic olefin addition polymer is selected from a cyclic olefin addition polymer and a cyclic olefin addition copolymer.

4. The chemical mechanical polishing pad of claim 3 , wherein the cyclic olefin addition polymer is produced from a polymerization of at least one alicyclic monomer; wherein the at least one alicyclic monomer is selected from the group consisting of alicyclic monomers having an endocyclic double bond and alicyclic monomers having an exocyclic double bond.

5. The chemical mechanical polishing pad of claim 4 , wherein the alicyclic monomers having an endocyclic double bond are selected from the group consisting of norbornene; tricyclodecene; dicyclopentadiene; tetracyclododecene; hexacycloheptadecene; tricycloundecene; pentacyclohexadecene; ethylidene norbornene; vinyl norbornene; norbornadiene; alkylnorbornenes; cyclopentene; cyclopropene; cyclobutene; cyclohexene; cyclopentadiene; cyclohexadiene; cyclooctatriene; and, indene; and, wherein the alicyclic monomers having an exocyclic double bond are selected from the group consisting of vinyl cyclohexene, vinyl cyclohexane, vinyl cyclopentane and vinyl cyclopentene.

6. The chemical mechanical polishing pad of claim 3 , wherein the cyclic olefin addition copolymer is produced from a copolymerization of at least one alicyclic monomer and at least one acyclic olefin monomer.

7. The chemical mechanical polishing pad of claim 6 , wherein the at least one alicyclic monomer is selected from the group consisting of an alicyclic monomer having an endocyclic double bond and an alicyclic monomer having an exocyclic double bond;

wherein the alicyclic monomers having an endocyclic double bond are selected from the group consisting of norbornene; tricyclodecene; dicyclopentadiene; tetracyclododecene; hexacycloheptadecene; tricycloundecene; pentacyclohexadecene; ethylidene norbornene; vinyl norbornene; norbornadiene; alkylnorbornenes; cyclopentene; cyclopropene; cyclobutene; cyclohexene; cyclopentadiene; cyclohexadiene; cyclooctatriene; and, indene;

wherein the alicyclic monomers having an exocyclic double bond are selected from the group consisting of vinyl cyclohexene, vinyl cyclohexane, vinyl cyclopentane and vinyl cyclopentene; and,

wherein the at least one acyclic olefin monomer is selected from the group consisting of ethylene; propylene; 1-butene; isobutene; 2-butene; 1-pentene; 1-hexene; 1-heptene; 1-octene; 1-nonene; 1-decene; 2-methyl-1-propene; 3-methyl-1-pentene; 4-methyl-1-pentene; 2-butene; butadiene; isoprene; 1,3-pentadiene; 1,4-pentadiene; 1,3-hexadiene; 1,4-hexadiene; 1,5-hexadiene; 1,5-heptadiene; 1,6-heptadiene; 1,6-octadiene; 1,7-octadiene; and, 1,9-decadiene.

8. The chemical mechanical polishing pad of claim 2 , wherein the cyclic olefin addition polymer is represented by a formula selected from the group consisting of

wherein y is 20 to 20,000; and, wherein R 1 and R 2 are each independently selected from the group consisting of a H, a hydroxyl group, a C 1-10 alkyl group, a C 1-10 hydroxyalkyl group, a C 1-10 alkoxyl group, a C 1-10 alkoxyalkyl group, a C 1-10 carboxyalkyl group, a C 1-10 alkoxycarbonyl and a C 1-10 alkylcarbonyl;

wherein the ratio of a:b is 0.5:99.5 to 30:70; wherein R 3 is selected from the group selected from a H and a C 1-10 alkyl group; and, wherein R 4 and R 5 are each independently selected from the group consisting of a H, a hydroxyl group, a C 1-10 alkyl group, a C 1-10 hydroxyalkyl group, a C 1-10 alkoxyl group, a C 1-10 alkoxyalkyl group, a C 1-10 carboxyalkyl group, a C 1-10 alkoxycarbonyl and a C 1-10 alkylcarbonyl;

wherein the ratio of c:d in the cyclic olefin addition copolymer is 0.5:99.5 to 50:50; wherein R 6 is selected from the group selected from H and a C 1-10 alkyl group; and, wherein R 7 and R 8 are each independently selected from the group consisting of a H, a hydroxyl group, a C 1-10 alkyl group, a C 1-10 hydroxyalkyl group, a C 1-10 alkoxyl group, a C 1-10 alkoxyalkyl group, a C 1-10 carboxyalkyl group, a C 1-10 alkoxycarbonyl and a C 1-10 alkylcarbonyl; and,

wherein h is 20 to 20,000; and, wherein R 9 and R 10 are each independently selected from the group consisting of a H, a hydroxyl group, a C 1-10 alkyl group, a C 1-10 hydroxyalkyl group, a C 1-10 alkoxyl group, a C 1-10 alkoxyalkyl group, a C 1-10 carboxyalkyl group, a C 1-10 alkoxycarbonyl and a C 1-10 alkylcarbonyl.

9. The chemical mechanical polishing pad of claim 2 , wherein the broad spectrum, endpoint detection window block is a plug in place window.

Assignments (6)
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 073515/0243 →
SECURITY INTEREST Recorded Nov 3, 2025
From: QNITY ELECTRONICS, INC.
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 073517/0298 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2024
From: DOW GLOBAL TECHNOLOGIES LLC
To: THE DOW CHEMICAL COMPANY
Reel/Frame 068971/0226 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2024
From: THE DOW CHEMICAL COMPANY
To: DDP SPECIALTY ELECTRONIC MATERIALS US, INC
Reel/Frame 068971/0362 →
CHANGE OF LEGAL ENTITY Recorded Sep 17, 2024
From: DDP SPECIALTY ELECTRONIC MATERIALS US, INC
To: DDP SPECIALTY ELECTRONIC MATERIALS US, LLC
Reel/Frame 068972/0210 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 12, 2015
From: REPPER, ANGUS; JAMES, DAVID B.; LEUGERS, MARY A.
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.; DOW GLOBAL TECHNOLOGIES LLC
Reel/Frame 036771/0254 →