IP Library Granted Patent US 8,836,091
Granted Patent B1
US 8,836,091 · App. 13/794,841 · Granted Sep 16, 2014

Lead frame for semiconductor package with enhanced stress relief

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,836,091
App. No.
13/794,841
Granted
Sep 16, 2014
Kind
B1
Abstract

A semiconductor package includes a lead frame, a semiconductor die, bond wires providing an electrical connection between the die and the lead frame, and a mold compound that encapsulates the lead frame, the die and the bond wires. The lead frame includes spaced apart first and second frame members each having an inner peripheral edge and an opposing outer peripheral edge, spaced apart lead pads disposed between the inner peripheral edges of the first and second frame members, and conductive leads disposed proximate to the outer peripheral edge of each of the first and second frame members. The die is mounted on the lead pads.

Claims (36)

1. A semiconductor package, comprising:

a lead frame including:

a first frame member and a second frame member spaced apart from the first frame member, each frame member having an inner peripheral edge and an opposing outer peripheral edge, a plurality of spaced apart lead pads disposed between the inner peripheral edges of the first and second frame members, wherein a first set of the plurality of spaced apart lead pads are arranged in a first row along the inner peripheral edge of the first frame member and a second set of the plurality of spaced apart lead pads are arranged in a second row along the inner peripheral edge of the second frame member, wherein the first and second rows are spaced from each other, and at least one conductive lead disposed proximate the outer peripheral edge of at least one of the first and second frame members;

a first semiconductor die mounted on at least one of the plurality of lead pads;

at least one wire providing an electrical connection between the first semiconductor die and the lead frame; and

a mold compound encapsulating the lead frame, the first semiconductor die and the at least one wire.

2. The semiconductor package of claim 1 , wherein a plurality of spaced apart conductive leads is disposed proximate the outer peripheral edges of at least one of the first and second frame members.

3. The semiconductor package of claim 2 , wherein a position of each of the plurality of spaced apart lead pads is offset from a position of each of the plurality of spaced apart conductive leads.

4. The semiconductor package of claim 1 , wherein the first set of the plurality of spaced apart lead pads are formed integrally with the first frame member and the second set of the plurality of spaced apart lead pads are formed integrally with the second frame member.

5. The semiconductor package of claim 2 , wherein the plurality of spaced apart lead pads are electrically isolated from the plurality of spaced apart conductive leads.

6. The semiconductor package of claim 1 , further comprising a second semiconductor die mounted on the first semiconductor die.

7. The semiconductor package of claim 1 , wherein at least a portion of the lead frame is half etched to facilitate mold locking.

8. The semiconductor package of claim 1 , wherein the first semiconductor die is mounted on the plurality of spaced apart lead pads and only a portion of a bottom surface of the first semiconductor die is in contact with the plurality of spaced apart lead pads.

9. The semiconductor package of claim 8 , wherein only portions of the bottom surface proximate to opposing lateral edges of the first semiconductor die are in contact with the plurality of spaced apart lead pads.

10. A lead frame for a semiconductor package, comprising:

a first frame member and a second frame member spaced apart from the first frame member, each frame member having an inner peripheral edge and an opposing outer peripheral edge, a mounting area for a semiconductor die being defined between the inner peripheral edges of the first and second frame members;

a plurality of spaced apart lead pads disposed between the inner peripheral edges of the first and second frame members in the mounting area, wherein a first set of the plurality of spaced apart leads pads are arranged in a first row along the inner peripheral edge of the first frame member and a second set of the plurality of spaced apart lead pads are arranged in a second row along the inner peripheral edge of the second frame member, wherein the first and second rows are spaced from each other; and

a plurality of spaced apart conductive leads disposed proximate the outer peripheral edge of at least one of the first and second frame members.

11. The lead frame of claim 10 , wherein a position of each of the plurality of spaced apart lead pads is offset from a position of each of the plurality of spaced apart conductive leads.

12. The lead frame of claim 10 , wherein the first set of the plurality of spaced apart conductive leads are arranged in a third row along the outer peripheral edge of the first frame member and the second set of the plurality of spaced apart conductive leads are arranged in a fourth row along the outer peripheral edge of the second frame member.

13. The lead frame of claim 10 , wherein each of the plurality of spaced apart lead pads is configured to receive a semiconductor die thereon.

14. The lead frame of claim 10 , wherein the first set of the plurality of spaced apart lead pads are formed integrally with the first frame member and the second set of the plurality of spaced apart lead pads are formed integrally with the second frame member.

15. The lead frame of claim 10 , wherein at least a portion of the lead frame is half etched to facilitate mold locking.

16. The lead frame of claim 15 , wherein at least one of the plurality of spaced apart lead pads and at least one of the plurality of conductive leads are half etched to facilitate mold locking.

17. A semiconductor package, comprising:

a lead frame including:

a first frame member and a second frame member spaced apart from the first frame member, each frame member having an inner peripheral edge and an opposing outer peripheral edge,

a first set of spaced apart lead pads integrally formed with the first frame member and being arranged in a first row adjacent the inner peripheral edge of the first frame member,

a second set of spaced apart lead pads integrally formed with the second frame member and being arranged in a second row adjacent the inner peripheral edge of the second frame member, and

a plurality of spaced apart conductive leads disposed along the outer peripheral edges of each of the first and second frame members;

a first semiconductor die having a top surface and a bottom surface, the first semiconductor die being mounted on the plurality of spaced apart lead pads such that a portion of the bottom surface is in contact with the plurality of spaced apart lead pads;

a second semiconductor die mounted on the top surface of the first semiconductor die;

a first set of bond wires each having a first end bonded to the first semiconductor die and a second end bonded to the second semiconductor die, the first set of bond wires providing an electrical connection between the first semiconductor die and the second semiconductor die;

a second set of bond wires each having a first end bonded to one of the plurality of spaced apart conductive leads and a second end bonded to the second semiconductor die, the second set of bond wires providing an electrical connection between the conductive leads and the second semiconductor die; and

a mold compound encapsulating the lead frame, the first and second semiconductor dies, and the first and second sets of bond wires.

18. The semiconductor package of claim 17 , wherein another portion of the bottom surface of the first semiconductor die does not contact the plurality of spaced apart lead pads.

Assignments (17)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0744 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0725 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0704 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →