IP Library Granted Patent US 9,692,325
Granted Patent B2
US 9,692,325 · App. 13/818,339 · Granted Jun 27, 2017

High conductivity electrostatic chuck

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Quick Facts
Patent No.
US 9,692,325
App. No.
13/818,339
Granted
Jun 27, 2017
Kind
B2
Abstract

In accordance with an embodiment of the invention, there is provided an electrostatic chuck comprising a conductive path covering at least a portion of a workpiece-contacting surface of a gas seal ring of the electrostatic chuck, the conductive path comprising at least a portion of an electrical path to ground; and a main field area of a workpiece-contacting surface of the electrostatic chuck comprising a surface resistivity in the range of from about 10 8 to about 10 12 ohms per square.

Claims (32)

1. An electrostatic chuck, comprising:

a conductive path covering at least a portion of a workpiece-contacting surface of a gas seal ring of the electrostatic chuck, the conductive path comprising a coating covering at least a portion of an outside edge of the gas seal ring and at least a portion of an outside edge of the electrostatic chuck and comprising at least a portion of an electrical path to ground, the conductive path comprising a surface resistivity in the range of from about 10 5 ohms per square to about 10 7 ohms per square; and

a main field area of a workpiece-contacting surface of the electrostatic chuck comprising a surface resistivity in the range of from about 10 8 to about 10 12 ohms per square, the main field area comprising at least one embossment extending above surrounding portions of the main field area; and

a conductive coating on a workpiece-contacting surface of the at least one embossment.

2. An electrostatic chuck according to claim 1 , wherein the conductive path comprises diamond-like carbon.

3. An electrostatic chuck according to claim 2 , wherein the conductive path comprises doped diamond-like carbon.

4. An electrostatic chuck according to claim 3 , wherein the conductive path comprises hydrogenated carbon doped with nitrogen.

5. An electrostatic chuck according to claim 1 , wherein the conductive path comprises a coating of a thickness less than about 1 micron.

6. An electrostatic chuck according to claim 1 , wherein the conductive path wraps underneath an insulator layer of the electrostatic chuck.

7. An electrostatic chuck according to claim 1 , wherein the main field area comprises silicon carbide.

8. An electrostatic chuck according to claim 7 , wherein the main field area comprises a surface resistivity in the range of from about 10 9 to about 10 11 ohms per square.

9. An electrostatic chuck according to claim 1 , wherein the electrostatic chuck comprises a conductive grounding layer, at least a portion of which is underneath an insulator layer of the electrostatic chuck, the conductive grounding layer electrically contacting the conductive path.

10. An electrostatic chuck according to claim 9 , wherein at least a portion of an outside edge of the conductive grounding layer is covered by the conductive path.

11. An electrostatic chuck according to claim 9 , wherein the conductive grounding layer electrically contacts a grounding pin of the electrostatic chuck.

12. An electrostatic chuck according to claim 9 , further comprising an electrically conductive epoxy layer underlying at least a portion of the conductive grounding layer.

13. An electrostatic chuck according to claim 1 , wherein the conductive path of the electrostatic chuck and the conductive coating on the workpiece-contacting surface of the at least one embossment each comprise a diamond like carbon coating.

14. An electrostatic chuck according to claim 1 , wherein a base of the electrostatic chuck comprises a chamfered area on one or more edges of the base.

15. An electrostatic chuck according to claim 14 , wherein the conductive path electrically contacts the base through a conductive epoxy in the chamfered area.

16. An electrostatic chuck according to claim 15 , wherein the conductive path comprises a coating covering at least a portion of an outside edge of the electrostatic chuck, the conductive path wrapping underneath an insulator layer of the electrostatic chuck.

17. An electrostatic chuck according to claim 1 , further comprising at least one conductive pattern on the workpiece-contacting surface of the electrostatic chuck, the at least one conductive pattern electrically contacting the conductive path.

18. An electrostatic chuck according to claim 17 , wherein the at least one conductive pattern comprises a metal coated with a conductive coating.

19. An electrostatic chuck according to claim 17 , wherein the at least one conductive pattern comprises at least one of: a spoke extending towards the center of the electrostatic chuck; a ring around a gas hole of the electrostatic chuck; and a trace between two embossments on the workpiece-contacting surface of the electrostatic chuck.

20. An electrostatic chuck according to claim 1 , wherein the main field area of the electrostatic chuck comprises a polymer.

21. An electrostatic chuck according to claim 20 , wherein the main field area comprises at least one embossment extending above surrounding portions of the main field area, the at least one embossment comprising a polymer.

22. An electrostatic chuck according to claim 20 , wherein the main field area comprises a surface resistivity in the range of from about 10 8 to about 10 10 ohms per square.

23. An electrostatic chuck according to claim 20 , wherein the conductive path comprises a conductive coating, the conductive coating also covering at least a portion of the main field area.

24. An electrostatic chuck, comprising:

a conductive path electrically connected to at least a portion of a workpiece-contacting surface of the electrostatic chuck, the conductive path comprising a coating covering at least a portion of an outside edge of the electrostatic chuck and comprising at least a portion of an electrical path to ground; and

a main field area of a workpiece-contacting surface of the electrostatic chuck comprising a surface resistivity in the range of from about 10 8 to about 10 10 ohms per square, the main field area comprising a blanket layer and at least one embossment extending above surrounding portions of the main field area, the blanket layer and the at least one embossment each comprising a polymer comprising carbon nanotubes;

the conductive path further comprising a portion extending from under the blanket layer to the coating covering the at least a portion of the outside edge of the electrostatic chuck; and

a conductive coating on a workpiece-contacting surface of the at least one embossment.

25. An electrostatic chuck according to claim 24 , wherein the polymer comprises at least one of: carbon nanotube filled polyether imide; carbon nanotube filled polyether ether ketone; and carbon nanotube filled polyimide.

Assignments (5)
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
ASSIGNMENT OF PATENT SECURITY INTEREST RECORDED AT REEL/FRAME 048811/0679 Recorded Nov 5, 2019
From: GOLDMAN SACHS BANK USA
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 050965/0035 →
SECURITY INTEREST Recorded Nov 13, 2018
From: ENTEGRIS, INC.; SAES PURE GAS, INC.
To: GOLDMAN SACHS BANK USA
Reel/Frame 048811/0679 →
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ATMI PACKAGING, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 047477/0032 →
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: ENTEGRIS, INC.; POCO GRAPHITE, INC.; ATMI, INC.; ATMI PACKAGING, INC.; ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 047477/0151 →